• Title/Summary/Keyword: $Ti_3$$SiC_2$

검색결과 886건 처리시간 0.021초

SoI-Gel법에 의한 $Pb(Zr_{0.52}Ti_{0.48})O_3$박막의 제조 및 강유전 특성 (Preparation and ferroelectric properties of the $Pb(Zr_{0.52}Ti_{0.48})O_3$ thin film by Sol-Gel method)

  • 정장호;박인길;류기원;배선기;이영희
    • E2M - 전기 전자와 첨단 소재
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    • 제8권5호
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    • pp.606-610
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    • 1995
  • In this study, Pb(Z $r_{0.52}$ $Ti_{0.48}$) $O_{3}$ ceramic thin films were fabricated from an alkoxide-based by Sol-Gel method. Pb(Z $r_{0.52}$ $Ti_{0.48}$) $O_{3}$ stock solution was made and spin-coated on the Pt/ $SiO_{2}$/Si substrate at 4000[rpm] for 30[sec.]. Coated specimens were chied at 400[.deg. C] for 10[min]. The coating process was repeated 6 times and then heat-treated at 500-800[.deg. C] and 1 hour. The final thickness of the thin films were about 4800[.angs.]. The ferroelectric perovskite phases precipitated under the sintering of 700[.deg. C] for 1 hour. Pb(Z $r_{0.52}$ $Ti_{0.48}$) $O_{3}$ thin films sintered at 700[.deg. C] for 1 hour showed good dielectric and ferroelectric properties.

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$(Sr_{1-x}Ca_x)TiO_3$세라믹 박막의 미세구조 및 특성 (Microstructure and Properties of $(Sr_{1-x}Ca_x)TiO_3$Ceramic Thin film)

  • 김진사;이준웅
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제50권10호
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    • pp.504-508
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    • 2001
  • The$(Sr_{1-x}Ca_x)TiO_3$(SCT) thin films are deposited on Pt-coated electrode $(Pt-TiN /SiO_2Si)$ using RF sputtering method at various deposition temperature. The crystallinity of thin films was increased with increased of deposition temperature n the temperature range of 200~500 $[^{\circ}C]$. The capacitance changes almost linearly in temperature ranges of -80~+90$[^{\circ}C]$. All SCT thin films used in the study the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200[kHz]. V-I characteristics of SCT thin films show the increasing leakage current with the increases of deposition temperature.

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MOD법을 이용 제조한 $Bi_{3.25}Nd_{0.75}Ti_{3}O_{12}$ 박막의 열처리 온도에 따른 전기적 특성 (Electrical Characteristics of $Bi_{3.25}Nd_{0.75}Ti_{3}O_{12}$ Thin Films Prepared by MOD Process Depending on Annealing Temperatures)

  • 김기범;장건익
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2002년도 추계학술대회 논문집 Vol.15
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    • pp.346-349
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    • 2002
  • Ferroelectric $Bi_{4-x}Nd_{x}Ti_{3}O_{12}(BNdT)$ thin films with the composition(x=0.75) were prepared on $Pt/Ti/SiO_{2}/Si(100)$ substrate by metal-organic deposition. The films were annealed by various temperatures from 550 to $650^{\circ}C$ and then the electrical and structural characteristics of BNdT films were investigated for the application of FRAM. Electrical properties such as dielectirc constant, 2Pr and capacitance were quite dependent on the thermal heat treatment. The measured 2Pr value on the BNdT capacitor annealed at $650^{\circ}C$ was $56{\mu}C/cm^{2}$ at an applied voltage of 5V. In fatigue characteristics value remained costant up to $8{\times}10^{10}$ read/write switching cycles at a frequency of 1Mhz regardless of annealing temperatures.

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TiO2 Buffer Layer의 후열처리 온도 증가에 따른 PLZT 박막의 유전특성에 대한 연구 (The Dielectric Properties of PLZT Thin Films as Post Annealing Temperatures of TiO2 Buffer Layer)

  • 윤지언;이인석;김상지;손영국
    • 한국진공학회지
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    • 제17권6호
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    • pp.560-565
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    • 2008
  • 본 연구에서는 PLZT 박막이 $(Pb_{0.92}La_{0.08})(Zr_{0.65}Ti_{0.35})O_3$ 조성의 타겟을 이용한 R.F. 마그네트론 스퍼터링공정에 의해 실리콘 웨이퍼 위에 증착되었다. PLZT 박막의 강유전특성을 향상시키기 위해 buffer layer인 $TiO_2$ 층이 사용되었으며, buffer layer의 후열처리온도 변화에 따른 PLZT 박막의 결정성과 유전특성이 연구되었다. buffer layer이 삽입되지 않은 PLZT 박막의 잔류분극값은 $19.13{\mu}C/cm^2$ 이었으며, 반면 $TiO_2$ buffer layer을 삽인한 후 후열처리 온도를 $600^{\circ}C$로 증가시킨 PLZT 박막의 잔류분극값은 $146.62{\mu}C/cm^2$까지 크게 증가하였다. 하부전극 백금(Pt)과 PLZT 박막층 사이에 삽입된 $TiO_2$ buffer layer의 특성과 PLZT 박막의 유전특성에 미치는 영향을 살펴보기 위해 글로우 방전 분광법 (glow discharge spectroscopy, GDS)이 PLZT 박막(PLZT/($TiO_2$)/Pt/Ti/$SiO_2$/Si wafer)에 대해 수행 되었다.

LI$_2$O-Al$_2$O$_3$-SiO$_2$계 유리의 catalytic crystallization에 미치는 열처리 효과 (The effect of heat treatment on catalytic crystallization in Li$_2$O-Al$_2$O$_3$-SiO$_2$ glass system)

  • 박원규;이채현
    • 한국결정성장학회지
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    • 제6권2호
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    • pp.275-285
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    • 1996
  • The effect of heat-treatment on catalytic crystallization in $LI_2O-Al_2O_3-SiO_2$ glass system over its glass transition temperature was investigated. Glass composition $4Li_2O{cdot}22AL_2O_3{cdot}66SiO_2{cdot}2TiO_2{cdot}2.5ZrO_2{cdot}1.5P_2O_5{cdot}1.0Na_2O{cdot}1.0As_2O_3$ (wt%) was selected and heat-treated at different heating conditions to obtain transparent glass-ceramic. Nucleation and crystallization behaviour of this composition were estimated by differential thermal analysis (DTA) and X-ray diffractometer (XRD) and its thermal expansion coefficients were measured by Dilatometer. As a result, glass transition temperature was $730^{\circ}C$ and two maximum nucleation temperatures were estimated at $730^{\circ}C$ and 82$0^{\circ}C$ using JMA(Johson-Mehl-Avrami) equation by DTA. $ZrTiO_4$ $\beta$-Quartz solid solution and $\beta$-Spodumene crystals were identified by XRD. The optimum crystallization temperature was 92$0^{\circ}C$ and three step heating schedule was expected to be useful to obtain transparent glass-ceramic.

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Optical Properties and Structure of BaO-TiO2-SiO2 Glass Ceramics

  • Kim, Tae-Ho;Kim, Young-Suck;Jeong, Young-Joon;Na, Young-Hoon;Lim, Hwan-Hong;Cha, Myoung-Sick;Ryu, Bong-Ki
    • 한국세라믹학회지
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    • 제45권12호
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    • pp.821-826
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    • 2008
  • Nanocrystallized glasses with the composition of $(50-x)BaO-xTiO_2-50SiO_2$ (x=10, 15, 16.7 and 20) have been prepared by heat-treatment at $T_x$ (crystallization onset temperature) for 3 h, and their optical properties, photoluminescence (PL), XRD and Raman spectra have been examined. The absorption edges of the glasses were red-shifted and the absorption coefficient increased with an increase of $TiO_2$. The glass subjected to the heat-treatment showed a dense formation of ${Ba_2}{TiSi_2}{O_8}$ crystals. The XRD and Raman results show that the nanocrystallized glasses formed fresnoite phase up to $TiO_2$ concentrations of 15 mol%. Further-more, blue luminescence with a peak at the wavelength of around 470nm was observed in the nanocrystallized glass, demon strating the optical multifunctional nanocrystallized material such as non-linear optics and photo-luminescence. It is thought that the blue luminescence from the ${Ba_2}{TiSi_2}{O_8}$ nanocrystallized glass originated from the presence of $Ti^{4+}$ incorporated into the fresnoite-type structure.

방독마스크용 코발트 촉매의 저온 일산화탄소 산화반응에서 지지체의 영향 (The Influence of Support on Gas Mask Cobalt Catalysts for Low Temperature CO Oxidation)

  • 김덕기;김복희;신채호;신창섭
    • 한국안전학회지
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    • 제21권2호
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    • pp.35-45
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    • 2006
  • Cobalt catalysts for gas mask loaded on various supports such as $Al_{2}O_{3},\;TiO_{2}$, AC(activated carbon) and $SiO_{2}$ were used to examine influences of calcination temperatures and reaction temperatures for CO oxidation. $Co(NO_{3})_2{\cdot}6H_{2}O$ was used as cobalt precursor and the catalysts were prepared by incipient wetness impregnation. The catalysts were characterized using XRD, TGA/DTA, TEM, $N_{2}$ sorption, and XPS. For the catalytic activity, support was in the order of ${\gamma}-Al_{2}O_{3}>TiO_{2}>SiO_{2}>AC\;and\;Al_{2}O_{3}$. The catalytic activity at lower temperature than $80^{\circ}C$ showed that with the increase of reaction temperature, cobalt catalysts on ${\gamma}-Al_{2}O_{3},\;TiO_{2},\;AC\$ has the negative activation energy but that of $SiO_{2}$ was positive.

열처리 조건이 Bi1-xLaxTi3O12 (x=0.75) 박막의 특성에 미치는 효과 (Effects of Annealing Conditions on the Properties of Bi1-xLaxTi3O12 Thin Films)

  • 박문흠;김상수;강민주;하태곤
    • 한국재료학회지
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    • 제14권10호
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    • pp.701-706
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    • 2004
  • Bismuth layered structure ferroelectric thin films, La-substituted $Bi_{4}Ti_{3}O_{12}$ ($Bi_{1-x}La_{x}Ti_{3}O_{12}$, x=0.75, BLT) were prepared on the $Pt(111)/Ti/SiO_2/Si(100)$ substrates by a sol-gel spin coating process. The thin films were annealed in various conditions, i.e., oxygen, nitrogen and vacuum atmospheres for various annealing time. We investigated the annealing condition effects on the grain orientation and ferroelectric properties. The measured XRD patterns revealed that the BLT thin films showed only $Bi_{4}Ti_{3}O_{12}$-type phase with random orientation. $La^{3+}$ ion substitution for $Bi^{3+}$ ion in perovskite layers of $Bi_{4}Ti_{3}O_{12}$ decreased the degree of c-axis orientation and increased the remanent polarization ($2P_{r}$). The remanent polarization ($2P_{r}$) and the coercive field ($2E_{c}$) of the BLT thin film annealed at $650^{\circ}C$ for 5 min in oxygen atmosphere were $87{\mu}C/cm^2$ and 182 kV/cm, respectively, at an applied electric field of 240 kV/cm. For all of the BLT thin films annealed in various conditions, the fatigue resistance was shown. The improvement of ferroelectric properties with La substitution in $Bi_{4}Ti_{3}O_{12}$ could be attributed to the changes in space charge densities and grain orientation in the thin film.

초음파 처리된 sol로 제조된 PZT 박막의 미세구조 및 전기적 특성 (Microstructure and electrical properties of PZT thin films by sonicated sol in an ultrasonic bath)

  • 김종국;박병옥
    • 한국결정성장학회지
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    • 제9권1호
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    • pp.101-106
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    • 1999
  • Pb$(Zr_{0.5},Ti_{0.5})O_3$ 박막을 $Pt/Ti/SiO_2/Si$ 기판 위에 spin-coating법으로 제조하였다. 제조된 sol을 초음파 bath 내에서 초음파 처리하여 균일화를 촉진시킨 다음, 박막을 제조하여 초음파 처리되지 않은 sol로 제조된 박막과의 비교를 통해 초음파의 영향을 고찰하였다. 초음파 처리된 sol로 제조된 박막의 경우, $550^{\circ}C$에서 perovskite 단일상을 얻을 수 있었고, "rosette" 구조가 사라졌음을 관찰할 수 있엇따. 초음파 처리되지 않은 sol로 제조된 박막의 유전상수(10kHz), 잔류분극(Pr) 및 항전계(Ec) 값은 335, 12.3$\mu$C/$\textrm{cm}^2$, 168.4 kV/cm 였고, 초음파 처리된 sol로 제조된 박막은 각각 443, 172$\mu$C/$\textrm{cm}^2$, 153,5kVcm 로 전기적 특성이 개선되어 졌음을 알 수 있었다.

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ECR PECVD법에 의한 페로브스카이트상(Pb, La)$\textrm{TiO}_3$ 박막 증착 연구 (A Study on the Fabrication of Perovskite (Pb, La)$\textrm{TiO}_3$ Thin Films by ECR PECVD)

  • 정성웅;박혜련;이원종
    • 한국재료학회지
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    • 제7권1호
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    • pp.33-39
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    • 1997
  • ECR PECVD법에 의해 $Pt/Ti/SiO_{2}/Si$ 다층 기판 위에 $480^{\circ}C$에서 순수한 페로브스카이트상의 PLT박막을 증착하였다. PLT 박막 증착전 ECR산소 플라즈마내에서의 $Pb(DPM)_{2}$ pre-flowing처리는 $Pb(DPM)_{2}$의 공급을 안정화시켜주며 박막증착초기에 Pb성분이 풍부한 분위기를 조성해 줌으로써 페로브스카이트 핵생성을 용이하게 하여 PLT박막 특성을 향상시켰다. Ti-source 유입량을 변화시킬 때 PLT박막의 증착특성, 조성, 결정상 그리고 전기적 특성을 관찰하였다. PLT박막은(100)으로 우선 배향되었으며 화학양론비가 잘 맞는 경우 높은 페로브스카이트 X-선 회절강도와 높은 유전율을 나타내었다.

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