• 제목/요약/키워드: $Si_{3}N_{4}

검색결과 2,130건 처리시간 0.036초

6H-SiC 기판 위에 혼합소스 HVPE 방법으로 성장된 AlN 에피층 특성 (Properties of AlN epilayer grown on 6H-SiC substrate by mixed-source HVPE method)

  • 박정현;김경화;전인준;안형수;양민;이삼녕;조채용;김석환
    • 한국결정성장학회지
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    • 제30권3호
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    • pp.96-102
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    • 2020
  • 본 논문에서는 6H-SiC (0001) 기판 위에 AlN 에피층을 혼합 소스 수소화물 기상 에피택시 방법에 의해 성장하였다. 시간당 5 nm의 성장률로 0.5 ㎛ 두께의 AlN 에피층을 얻었다. FE-SEM과 EDS 결과를 통해 6H-SiC (0001) 기판 위에 성장된 AlN 에피층 표면을 조사하였다. HR-XRD와 계산식을 통해 전위 밀도를 예측하였다. 1.4 × 109 cm-2의 나사 전위 밀도와 3.8 × 109 cm-2의 칼날 전위 밀도를 가지는 우수한 결정질의 AlN 에피층을 확인하였다. 혼합소스 HVP E 방법에 의해 성장된 6H-SiC 기판 위의 AlN 에피층은 전력소자 등에 응용이 가능할 것으로 판단된다.

황처리가 금속/InP Schootky 접촉과 $Si_3$$N_4$/InP 계면들에 미치는 영향 (Effects of sulfur treatments on metal/InP schottky contact and $Si_3$$N_4$/InP interfaces)

  • 허준;임한조;김충환;한일기;이정일;강광남
    • 전자공학회논문지A
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    • 제31A권12호
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    • pp.56-63
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    • 1994
  • The effects of sulfur treatments on the barrier heithts of Schottky contacts and the interface-state density of metal-insulator-semiconductor (MIS) capacitors on InP have been investigated. Schottky contacts were formed by the evaporation of Al, Au, and Pt on n-InP substrate before and after (NH$_{4}$)$_{2}$S$_{x}$ treatments, respectively. The barrier height of InP Schottky contacts was measured by their current-voltage (I-V) and capacitance-voltage (C_V) characteristics. We observed that the barrier heights of Schottky contacks on bare InP were 0.35~0.45 eV nearly independent of the metal work function, which is known to be due to the surface Fermi level pinning. In the case of sulfur-treated Au/InP ar Pt/InP Schottky diodes, However, the barrier heights were not only increased above 0.7 eV but also highly dependent on the metal work function. We have also investigated effects of (NH$_{4}$)$_{2}$S$_{x}$ treatments on the distribution of interface states in Si$_{3}$N$_{4}$InP MIS diodes where Si$_{3}$N$_{4}$ was provided by plasma enhanced chemical vapor deposition (PECVD). The typical value of interface-state density extracted feom 1 MHz C-V curve of sulfur-treated SiN$_{x}$/InP MIS diodes was found to be the order of 5${\times}10^{10}cm^{2}eV^{1}$. This value is much lower than that of MiS diodes made on bare InP surface. It is certain, therefore, that the (NH$_{4}$)$_{2}$S$_{x}$ treatment is a very powerful tool to enhance the barrier heights of Au/n-InP and Pt/n-InP Schottky contacts and to reduce the density of interface states in SiN$_{x}$/InP MIS diode.

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고강도 사이알론의 균열치유와 고온강도 특성 (Characteristics of Crack Healing and High Temperature Strength of High Strength Sialon)

  • 남기우;박상현;박승원;문석재
    • 대한기계학회논문집A
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    • 제33권9호
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    • pp.957-962
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    • 2009
  • Sialon was produced by hot-pressing the mixtures of $Si_3N_4$, AlN and $Y_2O_3$ powders. All fracture tests were performed on a three-point loading system with a 30 mm bending span. Fracture toughness and Vickers hardness of smooth specimen were average 7.05 $MPa{\cdot}m^{0.5}$ and Hv = 1580, respectively. Density of three kinds of specimens, smooth specimen, smooth and healed specimen, smooth with $SiO_2$ colloidal coating and healed specimen, had beyond 99 % of theoretical density. Bending strength of smooth healed specimens had high strength more than 1 GPa. Crack healed specimens recovered as strength as smooth specimen. That is, cracked specimen with $SiO_2$ colloidal coating on cracked part recovered strength by heat treatment, completely. Crack healing of $Si_3N_4$ composite ceramics had contributed glassy $SiO_2$ to strength recovery. Limiting high temperature for bending strength of heat treated smooth specimen for bending strength was about 1273 K.

TiAlSiN 코팅의 대기중 고온산화 속도와 스케일 분석 (High-temperature Oxidation Kinekics and Scales Formed on the TiAlSiN film)

  • 지권용;박상환;김민정;박순용;정승부;이동복
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2015년도 춘계학술대회 논문집
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    • pp.131-132
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    • 2015
  • $Ti_{0.26}Al_{0.16}Si_{0.01}N_{0.57}$ (at%) coatings were synthesized on stainless steel 304 by using arc ion plating systems (AIPS). Targets employed for the deposition were Ti, AlSi(67:33at%) and AlSi(82:18at%). The thickness of TiAlSiN coatings is $4{\mu}m$. The oxidation characteristics of the deposited coatings were studied by thermogravimetric analysis (TGA) in air between 800 and $900^{\circ}C$ for 75 hr. The oxide scale formed on the TiAlSiN coatings consisted of $rutile-TiO_2$ layer and ${\alpha}-Al_2O_3$. At $800^{\circ}C$, the coatings oxidized relatively slowly, and the scales were thin and adherent. When oxidized above $900^{\circ}C$, $TiO_2$ grew fast over the mixed oxide layer, and the oxide scale formed on TiAlSiN coatings was prone to spallation. Microstructural changes of the TiAlSiN coatings that occurred during high temperature oxidation were investigated by EPMA, XRD, SEM and TEM.

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공진법을 이용한 구조용 세라믹의 탄성계수 측정 (Measurement of Elastic Modulus of Structural Ceramics by Acoustic Resonance Method)

  • 안봉영;김영길;이승석
    • 한국재료학회지
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    • 제5권3호
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    • pp.268-274
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    • 1995
  • 세라믹재료의 동탄성계수 측정을 위한 공진주파수 측정장치를 구성하였다. 구조용 세라믹 재료로 이용되는 $Al_{2}$O_{3}$, SiC, $Si_{3}$N_{4}$의 온도를 120$0^{\circ}C$까지 5$0^{\circ}C$의 온도간격으로 올리면서 torsional resonant frequency와 flexural resonant frequency를 측정하고, 측정된 공진주파수로부터 각 재료의 탄성계수를 구하였다. SiC의 경우는 120$0^{\circ}C$의 온도까지 탄성계수가 선형적으로 감소하였으나, $Al_{2}$O_{3}$와 $Si_{3}$N_{4}$의 경우에는 각각 100$0^{\circ}C$와 80$0^{\circ}C$까지는 선형적으로 감소하나, 그 이상의 온도에서는 탄성게수의 감소폭이 증가하는 현상을 보였다. 이러한 현상은 다결정재료에서의 grain boundary sliding에 의한 것으로 알려져 있다. 상온에서 공진법으로 측정된 동탄성계수의 측정결과는 초음파법으로 측정한 결과와 비교하였는데, 4% 내에서 서로 일치하는 결과를 보였다.

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질화규소 재료의 고온 유전물성 평가 (High Temperature Dielectric Properties of Silicon Nitride Materials)

  • 최두현
    • 한국군사과학기술학회지
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    • 제10권3호
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    • pp.114-119
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    • 2007
  • Dielectric properties of quartz glass and $Si_3N_4$ are investigated using the waveguide method from room temperature to $800^{\circ}C$. For the case of dielectric constant, $Si_3N_4$ showed similar increase with quartz glass up to $300^{\circ}C$, but less increase from $300^{\circ}C$ to $800^{\circ}C$. For the case of loss tangent, those showed gradual increase with temperature except of some temperature points. The loss tangent of $Si_3N_4$ and quartz glass increased up to 18.2% and 12.5% respectively. Through these researches, high temperature dielectric properties of silicon nitride materials are characterized.

AlN 첨가 SiC 세라믹스의 열전변환특성 (Thermoelectric Properties of AlN-doped SiC Ceramics)

  • 배철훈
    • 대한금속재료학회지
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    • 제50권11호
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    • pp.839-845
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    • 2012
  • The effect of an AlN additive on the thermoelectric properties of SiC ceramics was studied. Porous SiC ceramics with 48-54% relative density were fabricated by sintering the pressed ${\alpha}-SiC$ powder compacts with AlN at $2100-2200^{\circ}C$ for 3 h in an Ar atmosphere. In the undoped specimens, the Seebeck coefficients were positive (p-type semiconducting) possibly due to a dominant effect of the acceptor impurities (Al, Fe) contained in the starting powder. With AlN addition, the reverse phase transformation of 6H-SiC to 4H-SiC was observed during the sintering process. The electrical conductivity of the AlN doped specimen was larger than that of the undoped specimen under the same conditions, which might be due to a reverse phase trans-formation. The Seebeck coefficient of the AlN doped specimen was also larger than that of the undoped specimen. The density of specimen and the amount of addition had significant effects on the thermoelectric properties.

Electronic state calculation of ceramics by $DV-X\;{\alpha}$ cluster method

  • Adachi, Hirohiko
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 1994년도 추계 학술발표 강연 및 논문 개요집
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    • pp.1-1
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    • 1994
  • ;The electronic state calculations for various types of ceramic materials have beell performed by the use of $DV-X\;{\alpha}$ cluster method. The molecular orbital levels and wave functions for model clusters have been computed to study the electronic properties ami chemical bonding of the ceramics. For ${\beta}-sialon(Si_{6-z}Al_zO_zN_{8-z})$ which is a high temperature structural material based on ${\beta}-Si_3N_4$, we have made model cluster calculations to estimate the strength of chemical bonding between atoms by the Mulliken population analysis. It is found that the covalent bonding between Si and N atoms is very strong in pure ${\beta}-Si_3N_4$, but the covalency around solute atom is considerably weakened when Si atom is substituted by AI. This tendency is enhanced by an additional substitution of oxygen atom for N. The result calculated can well explain the experimental data of changes in mechanical properties such as the reductions of Young's modulus and Vickers hardness with increment of z-value in ${\beta}-sialon$. Various model clusters for transition metal oxides which show many interesting physical and chemical properties have also been calculated. High-valent perovskite-type iron oxides EMFe0_3E(M=Ca and Sr) possess very interesting magnetic and chemical properties. In these oxides, iron exists as $Fe^{4+}$ state, but the experimental measurement of Mossba~er effect suggests that disproportionation $2Fe^{4+}=Fe^{3+}+Fe^{5+}$ takes place for $CaFe0_3$ at low temperatures. The model cluster calculations for these compounds indicated the existence of considerably strong covalent bonding of Fe-O. The calculations of hyperfine interaction at iron neucleus show very good agreement with the experimental Mossbauer measurements. The result calculated also implies that the disproportionation reaction is strongly possible by assuming the quenching of breathing phonon mode at low temperatures.tures.

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3C-SiC 광기전 특성 기반 광학식 수소센서의 제작과 그 특성 (Fabrication of an Optical Hydrogen Sensor Based on 3C-SiC Photovoltaic Effect and Its Characteristics)

  • 김강산;정귀상
    • 센서학회지
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    • 제21권4호
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    • pp.283-286
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    • 2012
  • This paper presents the optical hydrogen sensor based on transparent 3C-SiC membrane and photovoltaic effect. Gasochromic materials of Pd and Pd/$WO_3$ were deposited by sputter on 3C-SiC membrane for gas sensing area. Gasochromic materials change to transparency by exposure to hydrogen. The variations of light intensity by hydrogen generate the photovoltaic of P-N junction between N-type 3C-SiC and P-type Si. Single layer of Pd shows higher photovoltaic compared with Pd/$WO_3$. However, phase transition from ${\alpha}$ to ${\beta}$ is shown at 6 %. Pd/$WO_3$ structure show the more linear response to hydrogen range of 2 % ~10 %. Also, almost 2 times fast response and recovery characteristics are shown at Pd/$WO_3$. These fast performances are come from the fact that Pd promoted the chemical reaction between hydrogen and $WO_3$.

$Si_3N_4$ 기판 위에 PECVD 법으로 형성한 Tungsten Nitride 박막의 특성 (Characteristic of PECVD-$WN_x$ Thin Films Deposited on $Si_3N_4$ Substrate)

  • 배성찬;박병남;손승현;이종현;최시영
    • 전자공학회논문지D
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    • 제36D권7호
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    • pp.17-25
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    • 1999
  • PECVD 법을 이용하여 Tungsten Nitride($WN_x$) 박막을 $WSi_3N_4$ 기판위에 형성하였다. $WN_x$ 박막은 기관온도, 가스의 유량, rf power 등의 공정변수를 변화시키면서 형성되었고, 서로 다른 질소원으로 $NH_3$$N_2$를 각각 사용하여 박막의 특성을 조사하였다. $WN_x$ 막 내의 질소함량은 $NH_3$$N_2$의 유량에 따라 0~45% 정도로 변화하였으며, $NH_3$를 사용하였을 때, 최고 160nm/min의 높은 성장률을 나타내었다. $WSi_3N_4$ 기판 위에서는 TiN이나 Si 위에서보다 높은 성장률을 나타내었다. $WN_x$ 박막의 순도를 AES로 측정해 본 결과 $NH_3$를 사용했을 때 고순도의 박막을 얻을 수 있었다. XRD 분석으로 순수한 다결정의 W가 비정질의 $WN_x$로 변화되는 것을 알 수 있었으며, 이것은 $WN_x$가 식각 공정시 미세 패턴 형성이 W보다 유리할 것이라는 것을 보여준다. TiN, NiCr, Al 등의 다양한 기판 위에 형성해 본 결과 Al 위에서 최대 $1.6 {\mu}m$의 두꺼운 막이 형성되었다.

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