• 제목/요약/키워드: $SiO_2$Microstructure

검색결과 521건 처리시간 0.029초

Fe, Cr, Mn, Si, Ni의 첨가에 의한 고력황동의 미세조직과 마모특성 (Microstructure and Wear Properties of High Strength Yellow Brass by Addition of Fe, Cr, Mn, Si and Ni)

  • 박재용;강춘식;신윤호;배정찬
    • 한국주조공학회지
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    • 제17권3호
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    • pp.258-266
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    • 1997
  • The purpose of this study is to improve hardness and wear resistance of high strength yellow brass by adding Fe, Cr, Mn, Si and Ni. Results showed that NiO, $FeCr_2O_4$ and intermetallic compound $Mn_5Si_3$ were produced when Ni, Fe-Cr and Mn-Si were added to the yellow brass. The hardness and wear tests showed the best results with the presence of the product precipitates and intermetallic compound. The calculation of relative wear resistance by volume fraction of each phases showed that the relative wear resistance of $Mn_5Si_3$ had the highest value, that of ${\beta}$ phase had the lowest. Observation of the worn surface showed that the main wear mechanism were found to be the abrasive wear, and also showed that the wear is caused by mechanical failure at the early stage.

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60 nm 와 20 nm 두께의 수소화된 비정질 실리콘에 따른 저온 니켈실리사이드의 물성 변화 (Property of Nickel Silicide with 60 nm and 20 nm Hydrogenated Amorphous Silicon Prepared by Low Temperature Process)

  • 김종률;박종성;최용윤;송오성
    • 한국진공학회지
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    • 제17권6호
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    • pp.528-537
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    • 2008
  • ICP-CVD를 사용하여 수소화된 비정질 실리콘(a-Si:H)을 60 nm 또는 20 nm 두께로 성막 시키고, 그 위에 전자총증착장치(e-beam evaporator)를 이용하여 30 nm Ni 증착 후, 최종적으로 30 nm Ni/(60 또는 20 nm a-Si:H)/200 nm $SiO_2$/single-Si 구조의 시편을 만들고 $200{\sim}500^{\circ}C$ 사이에서 $50^{\circ}C$간격으로 40초간 진공열처리를 실시하여 실리사이드화 처리하였다. 완성된 니켈실리사이드의 처리온도에 따른 면저항값, 상구조, 미세구조, 표면조도 변화를 각각 사점면저항측정기, HRXRD, FE-SEM과 TEM, SPM을 활용하여 확인하였다. 60 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 $400^{\circ}C$이후부터 저온공정이 가능한 면저항값을 보였다. 반면 20 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 $300^{\circ}C$이후부터 저온공정이 가능한 면저항값을 보였다. HRXRD 결과 60 nm 와 20 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 열처리온도에 따라서 동일한 상변화를 보였다. FE-SEM과 TEM 관찰결과, 60 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 저온에서 고저항의 미반응 실리콘이 잔류하고 60 nm 두께의 니켈실리사이드를 가지는 미세구조를 보였다. 20 nm a-Si:H 기판위에 형성되는 니켈실리사이드는 20 nm 두께의 균일한 결정질 실리사이드가 생성됨을 확인하였다. SPM 결과 모든 시편은 열처리온도가 증가하면서 RMS값이 증가하였고 특히 20 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 $300^{\circ}C$에서 0.75 nm의 가장 낮은 RMS 값을 보였다.

Al과 Al-1% Si 용융조에서 용융 도금된 탄소강의 경도, 산화 및 미세조직의 특성 (Charactrerization of microstructure, hardness and oxidation behavior of carbon steels hot dipped in Al and Al-1% Si molten baths)

  • 황연상;원성빈;;이동복
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2013년도 춘계학술대회 논문집
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    • pp.109-110
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    • 2013
  • Medium carbon steel was aluminized by hot dipping into molten Al or Al-1%Si baths. After hot-dipping in these baths, a thin Al-rich topcoat and a thick alloy layer rich in $Al_5Fe_2$ formed on the surface. A small a mount of FeAl and $Al_3Fe$ was incorporated in the alloy layer. Silicon from the Al-1%Si bath was uniformly distributed throughout the entire coating. The hot dipping increased the microhardness of the steel by about 8 times. Heating at $700-1000^{\circ}C$ however decreased the microhardness through interdiffusion between the coating and the substrate. The oxidation at $700-1000^{\circ}C$ in air formed a thin protective ${\alpha}-Al_2O_3$ layer, which provided good oxidation resistance. Silicon was oxidized to amorphous silica, exhibiting a glassy oxide surface.

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질화규소의 가스압 소결 (GPS) 시간에 따른 마모거동 (Wear Behavior of Silicon Nitride Depending on Gas Pressure Sintering Time)

  • 이수완;김성호
    • 한국재료학회지
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    • 제10권1호
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    • pp.83-89
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    • 2000
  • $Si_3N_4$에 2wt% $Al_2O_3$와 6wt% $Y_2O_3$을 첨가한 분말을 가스압 소결 방법으로 시편을 제조하였다. 이때 소결시 시간변화에 따른 공기 중에서 마모 특성을 비교하였다. 소결 시간에 따른 마모 특성의 변화는 기계적 성질, 즉, 파괴인성 등이 영향을 주는 것으로 나타났다. 소결 시간이 길어지면 큰 elongated 입자의 과잉성장에 따라 곡강도 및 파괴인성이 낮아져 이 결과 마모가 증가되었다. 이때 나타난 결과에 의하면 공기 중에서 질화규소의 마모특성에 영향을 주는 인자는 여러 가지 기계적 특성 중에서 파괴인성 및 곡강도가 미치는 영향이 크게 나타났다.

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The Study of Low Temperature Firing Glass-Ceramics Substrate in Lithium Fluorhectorite

  • Choi, J-H;Park, D-H;Kim, B-I;Kang, W-H
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 1999년도 추계 기술심포지움 논문집
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    • pp.111-115
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    • 1999
  • The $Li_2O-MgO-MgF_2-SiO_2$glasses with addition of $B_2O_3$ were investigated in order to make glass-ceramics for low temperature firing substrate. Glasses were made by melting at $1450^{\circ}C$ in the electronic furnace and crystallized at $750^{\circ}C$. After the crystallization, crystal phases and microstructure were observed. The crystal phases were polycrystalline of lithium boron fluorphlogopite and lithium fluorhectorite. The crystal shape was changed to grande type from needle type with the increase in $B_2O_3$ contents. Average particle size of the glass-ceramics aftar water swelling was $3.77{\mu}{\textrm}{m}$. The optimum sintering temperature and sintering shrinkage of the substrate were $900^{\circ}C$ and 13.4vol%, respectively.

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PECVD로 제조한 $SnO_2$ 박막의 구조적 특성 (Structural Characteristics of $SnO_2$ Thin Films prepared by PECVD)

  • 이정훈;장건익;손상희
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2005년도 추계학술대회 논문집 Vol.18
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    • pp.250-251
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    • 2005
  • Tin dioxide (SnO$_2$) thin films have been prepared on Si wafer (100) by Plasma Enhanced Chemical Vapor Deposition (PECVD). SnO$_2$ thin films were prepared from mixtures of dibutyltin diacetate as a precursor, oxygen as an oxidant at 275, 325, 375, 425$^{\circ}C$, respectively. The microstructure of deposited films was characterized by X-ray diffraction and field emission scanning electron microscopy. Structural characteristics of prepared SnO$_2$ thin films were investigated with different substrate temperature. The deposition rate was linearly increased with substrate temperature. Surface morphology and uniformity of prepared thin film was excellent at 375$^{\circ}C$ and grain size was averagely 25nm.

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Co2O3 첨가가 알루미나의 액상소결 및 기계적 물성에 미치는 영향 (Effect of Co2O3 addition on liquid phase sintering behavior and mechanical properties of commercial alumina)

  • 오복현;윤태규;공헌;김남일;이상진
    • 한국결정성장학회지
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    • 제30권4호
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    • pp.150-155
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    • 2020
  • 구조용 세라믹재료로 주로 사용되는 알루미나(Al2O3)는 우수한 기계적 특성을 위해 치밀한 미세구조를 요구하며, 소결온도를 낮추기 위해 상업적으로 액상소결(liquid phase sintering)이 적용된다. 본 연구에서는 SiO2, MgO, CaO를 액상소결 조제로 사용하는 92 % 상업용 알루미나의 액상소결 시, 착색제(coloring agent)로 주로 사용되는 산화코발트(Co2O3)의 첨가량과 다양한 소결온도가 알루미나의 미세구조 및 기계적 특성에 미치는 영향을 고찰하였다. 약 11 w t% 산화코발트 첨가에 따라 1200℃부터 고상입자 재배열에 의한 수축이 시작되었고 1300℃ 이상의 온도에서 용해 재석출 및 합체(coalescence)에 의한 알루미나의 결정립 성장이 관찰되었다. 1400℃ 이상의 열처리 온도 혹은 과량의 Co2O3 첨가는 액상의 점도를 낮추어 소결밀도를 감소시켰고, 이와 함께 경도값도 감소하였다. 산화코발트를 11 w t% 첨가하여 1350℃에서 소결할 경우, 3.86 g/㎤의 밀도와 12.32 GPa의 경도를 갖는 치밀한 소결체 제조가 가능하였다.

Sol-Gel법에 의한 Pb(Zr,Ti)$O_3$ 박막의 제조 및 유전 특성 (Preparation and Dielectric properties of the Pb(Zr,Ti)$O_3$ Thin Film by Sol-Gel Method)

  • 정장호;박인길;류기원;이성갑;이영희
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1995년도 하계학술대회 논문집 C
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    • pp.1022-1024
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    • 1995
  • In this study, $Pb(Zr_xTi_{1-x})O_3$(x=0.65, 0.52, 0.35) thin films were fabricated by Sol-Gel method. A stock solution with excess Pb 10[mol.%] of $Pb(Zr_xTi_{1-x})O_3$ was made and spin-coated on the Pt/$SiO_2$/Si substrate at 4000[rpm] for 30[sec.]. Coated specimens were dried on the hot-plate at $400[^{\circ}C]$ for 10[min.]. Sintering temperature and time were $500{\sim}800[^{\circ}C]$ and $1{\sim}60$[min.]. To investigate crystallization condition, PZT thin films were analyzed with sintering temperature, time and composition by the XRD. The microstructure of thin films were investigated by SEM. The ferroelectric perovskite phases precipitated under the sintering of $700[^{\circ}C]$ for 1 hour. In the PZT(52/48) composition, dielectric constant and dielectric loss were 2133, 2.2[%] at room temperature, respectively.

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DRAM용 PZT 박막 캐패시터의 유전특성 (Dielectric Properties of the PZT Thin Film Capacitors for DRAM Application)

  • 정장호;박인길;이성갑;이영희
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1995년도 추계학술대회 논문집 학회본부
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    • pp.335-337
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    • 1995
  • In this study, $Pb(Zr_{0.52}Ti_{0.48})O_3$ ceramic thin films were fabricated from an alkoxide-based by Sol-Gel method. $Pb(Zr_{0.52}Ti_{0.48})O_3$ stock solution was made and spin-coated on the $Pt/SiO_2/Si$ substrate at 4000[rpm] for 30[sec]. Coated specimens were dried at 400[$^{\circ}C$] for 10 [min]. The coating process was repeated 4 times and then heat-treated at 500$\sim$800[$^{\circ}C$], 1 hour. The final thickness of the thin films were about 3000[A]. The crystallinity and microstructure of the thin films were investigated for varing the sintering condition. The ferroelectric perovskite' phases precipitated under the sintering of 700[$^{\circ}C$] for 1 hours. In the $Pb(Zr_{0.52}Ti_{0.48})O_3$ thin films sintered at 700[$^{\circ}C$] for 1 hour, dielectric constant and dielectric loss were 2133, 2.2[%] at room temperature, respectively. $Pb(Zr_{0.52}Ti_{0.48})O_3$ thin film capacitors having good dielectric and electrical properties are expected for the application to the dielectric material of DRAM.

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Ferroelectric and Structural Properties of Nd-substituted $Bi_4Ti_3O_{12}$ Thin Films Fabricated by MOCVD

  • Kang, Dong-Kyun;Park, Won-Tae;Kim, Byong-Ho
    • 한국반도체및디스플레이장비학회:학술대회논문집
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    • 한국반도체및디스플레이장비학회 2006년도 추계학술대회 발표 논문집
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    • pp.166-169
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    • 2006
  • A promising capacitor, which has conformable step coverage and good uniformity of thickness and composition, is needed to manufacture high-density non-volatile FeRAM capacitors with a stacked cell structure. In this study, ferroelectric $Bi_{3.61}Nd_{0.39}Ti_3O_{12}$ (BNT) thin films were prepared on $Pt(111)/Ti/SiO_2/Si$ substrates by the liquid delivery system MOCVD method. In these experiments, $Bi(ph)_3$, $Nd(TMHD)_3$ and $Ti(O^iPr)_2(TMHD)_2$ were used as the precursors and were dissolved in n-butyl acetate. The BNT thin films were deposited at a substrate temperature and reactor pressure of approximately $600^{\circ}C$ and 4.8 Torr, respectively. The microstructure of the layered perovskite phase was observed by XRD and SEM. The remanent polarization value (2Pr) of the BNT thin film was $31.67\;{\mu}C/cm^2$ at an applied voltage of 5 V.

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