• 제목/요약/키워드: $PtO_x$

검색결과 463건 처리시간 0.021초

CMP 방법으로 제조한 BSCCO 2212 튜브의 임계전류특성에 미치는 열처리 온도의 영향 (Effects of Heat-treatment Temperature on the Critical Current of BSCCO 2212 Tube Prepared by CMP Method)

  • 최정숙;오성룡;전병혁;김형섭;김혜림;현옥배;김찬중
    • Progress in Superconductivity
    • /
    • 제8권1호
    • /
    • pp.98-103
    • /
    • 2006
  • [$Bi_2Sr_2Ca_1Cu_2O_x$](BSCCO 2212) tubes were fabricated by centrifugal melting process(CMP). BSCCO 2212 powder was melted in a Pt crucible and solidified in a rotating steel mold. The BSCCO 2212 tube samples separated from steel mold were heat-treated at $800^{\circ}C\;and\;810^{\circ}C$ in oxygen flow. The critical current($I_c$) of the samples was measured by transport measurement at 77K, and the microstructure was investigated by scanning electron microscope. The $J_c$ at 77K of the tubes heated treated at $800^{\circ}C\;and\;810^{\circ}C$ were 197 and 240 $A/cm^2$, respectively. It was observed that the plate like grains in BSCCO 2212 tube was more developed in the sample heat treated at $810^{\circ}C\;and\;800^{\circ}C$ heated tube. It is found that the critical current($I_c$) of the BSCCO 2212 sample was dependent on the heating schedule regarding the growth of the BSCCO 2212 grains.

  • PDF

The electronic structure of the ion-beam-mixed Pt-Cu alloys by XPS and XANES

  • Lim, K.Y.;Lee, Y.S.;Chung, Y.D.;Lee, K.M.;Jeon, Y.;Whang, C.N.
    • 한국진공학회:학술대회논문집
    • /
    • 한국진공학회 1998년도 제14회 학술발표회 논문개요집
    • /
    • pp.133-133
    • /
    • 1998
  • In the thin film alloy formation of the transition metals ion-beam-mixing technique forms a metastable structure which cannot be found in the arc-melted metal alloys. Sppecifically it is well known that the studies about the electronic structure of ion-beam-mixed alloys pprovide the useful information in understanding the metastable structures in the metal alloy. We studied the electronic change in the ion-beam-mixed ppt-Ct alloys by XppS and XANES. These analysis tools pprovide us information about the charge transfer in the valence band of intermetallic bonding. The multi-layered films were depposited on the SiO2 substrate by the sequential electron beam evapporation at a ppressure of less than 5$\times$10-7 Torr. These compprise of 4 ppairs of ppt and Cu layers where thicknesses of each layer were varied in order to change the alloy compposition. Ion-beam-mixing pprocess was carried out with 80 keV Ae+ ions with a dose of $1.5\times$ 1016 Ar+/cm2 at room tempperature. The core and valence level energy shift in these system were investigated by x-ray pphotoelectron sppectroscoppy(XppS) pphotoelectrons were excited by monochromatized Al K a(1486.6 eV) The ppass energy of the hemisppherical analyzer was 23.5 eV. Core-level binding energies were calibrated with the Fermi level edge. ppt L3-edge and Cu K-edge XANES sppectra were measured with the flourescence mode detector at the 3C1 beam line of the ppLS (ppohang light source). By using the change of White line(WL) area of the each metal sites and the core level shift we can obtain the information about the electrons pparticippating in the intermetallic bonding of the ion-beam-mixed alloys.

  • PDF

Ellipsometric study of Mn-doped $Bi_4Ti_3O_{12}$ thin films

  • Yoon, Jae-Jin;Ghong, Tae-Ho;Jung, Yong-Woo;Kim, Young-Dong;Seong, Tae-Geun;Kang, Lee-Seung;Nahm, Sahn
    • 한국진공학회:학술대회논문집
    • /
    • 한국진공학회 2010년도 제39회 하계학술대회 초록집
    • /
    • pp.173-173
    • /
    • 2010
  • $Bi_4Ti_3O_{12}$ ($B_4T_3$) is a unique ferroelectric material that has a relatively high dielectric constant, high Curie temperature, high breakdown strength, and large spontaneous polarization. As a result this material has been widely studied for many applications, including nonvolatile ferroelectric random memories, microelectronic mechanical systems, and nonlinear-optical devices. Several reports have appeared on the use of Mn dopants to improve the electrical properties of $B_4T_3$ thin films. Mn ions have frequently been used for this purpose in thin films and multilayer capacitors in situations where intrinsic oxygen vacancies are the major defects. However, no systematic study of the optical properties of $B_4T_3$ films has appeared to date. Here, we report optical data for these films, determined by spectroscopic ellipsometry (SE). We also report the effects of thermal annealing and Mn doping on the optical properties. The SE data were analyzed using a multilayer model that is consistent with the original sample structure, specifically surface roughness/$B_4T_3$ film/Pt/Ti/$SiO_2$/c-Si). The data are well described by the Tauc-Lorentz dispersion function, which can therefore be used to model the optical properties of these materials. Parameters for reconstructing the dielectric functions of these films are also reported. The SE data show that thermal annealing crystallizes $B_4T_3$ films, as confirmed by the appearance of $B_4T_3$ peaks in X-ray diffraction patterns. The bandgap of $B_4T_3$ red-shifts with increasing Mn concentration. We interpret this as evidence of the existence deep levels generated by the Mn transition-metal d states. These results will be useful in a number of contexts, including more detailed studies of the optical properties of these materials for engineering high-speed devices.

  • PDF