• 대한기계학회논문집A
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• 제24권4호
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• pp.955-962
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• 2000

Scanning Probe Microscope (SPM) such as Scanning Tunneling Microscope (STM) and Atomic Force Microscope (AFM) was shown to be the powerful tool for nano-scale characterization of a fracture surface . AFM was used to study cross sectional profiles and dimensions of fatigue striations in 2017-T351 aluminum alloy. Their widths (SW) and heights (SH) were measured from the cross sectional profiles of three-dimension AFM images. The following results that will be helpful to understand the fatigue crack growth mechanism were obtained. (1) Coincidence of the crack growth rate with the striation width was found down to the growth rate of 10-5 mm/cycle. (2) The relation of SH=0.085(SW)1.2 was obtained. (3) The ratio of the striation height to its width SH/SW did not depend on the stress intensity factor range K and the stress ratio R. (4) Not only the SW but also the SH changed linearly with the crack tip opening displacement (CTOD) when plotted in log-log scale. From these results, the applicability of the AFM to nano-fractography is discussed.

• 대한수의학회지
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• 제47권4호
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• pp.389-393
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• 2007

In this study, the levels of aflatoxin $M_1$ ($AFM_1$) in milk were determined by HPLC with derivatization method. Milk samples were purified using $C_{18}$ disposable cartridge followed by derivatization with trifluoroacetic acid and analysed using HPLC with fluorescence detection. The recoveries of AFM1 from milk samples added $AFM_1$ at a level of 0.025~0.1 ng/ml were 94.7~98.0% with detection limit of 0.009 ng/ml. The amounts of $AFM_1$ were determined below 0.05 ng/ml for all tested samples of commercial milk collected in 1999 and 2000.

• Transactions on Electrical and Electronic Materials
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• 제14권3호
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• pp.160-163
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• 2013

We investigated the effect of light intensity and wavelength of a solar cell device by using photoconductive atomic force microscopy (PC-AFM). The $POCl_3$ diffusion doping process was used to produce a p-n junction solar cell device based on a Poly-Si wafer and the electrical properties of prepared solar cells were measured using a solar cell simulator system. The measured open circuit voltage ($V_{oc}$) is 0.59 V and the short circuit current ($I_{sc}$) is 48.5 mA. Also, the values of the fill factors and efficiencies of the devices are 0.7% and approximately 13.6%, respectively. In addition, PC-AFM, a recent notable method for nano-scale characterization of photovoltaic elements, was used for direct measurements of photoelectric characteristics in local instead of large areas. The effects of changes in the intensity and wavelength of light shining on the element on the photoelectric characteristics were observed. Results obtained through PC-AFM were compared with the electric/optical characteristics data obtained through a solar simulator. The voltage ($V_{PC-AFM}$) at which the current was 0 A in the I-V characteristic curves increased sharply up to 1.8 $mW/cm^2$, peaking and slowly falling as light intensity increased. Here, $V_{PC-AFM}$ at 1.8 $mW/cm^2$ was 0.29 V, which corresponds to 59% of the average $V_{oc}$ value, as measured with the solar simulator. Also, while light wavelength was increased from 300 nm to 1,100 nm, the external quantum efficiency (EQE) and results from PC-AFM showed similar trends at the macro scale, but returned different results in several sections, indicating the need for detailed analysis and improvement in the future.

• 반도체디스플레이기술학회지
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• 제17권4호
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• pp.1-5
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• 2018

Atomic force microscopy (AFM) simulation for Si (001) surface defects was conducted by using density functional theory (DFT). Three major defects on the Si (001) surface are difficult to analyze due to external noises that are always present in the images obtained by AFM. Noise-free surface defects obtained by simulation can help identify the real surface defects on AFM images. The surface defects were first optimized by using a DFT code. The AFM tip was designed by using five carbon atoms and positioned on the surface to calculate the system's energy. Forces between tip and surface were calculated from the energy data and converted into an AFM image. The simulated AFM images are noise-free and, therefore, can help evaluate the real surface defects present on the measured AFM images.

• Journal of Magnetics
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• 제16권3호
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• pp.197-200
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• 2011

Using the full potential linearized augmented plane wave (FLAPW) method, the influences of uniform and tetragonal strains on the magnetic state have been explored for chemically ordered bulk $L1_2$ $FePt_3$. The ordered state displays antiferromagnetic $Q_1$ (AFM-$Q_1$) state but it transitions into antiferromagnetic $Q_2$ (AFM-$Q_2$) state at about 10% uniform strain. The ferromagnetic (FM) state is observed at 11% uniform strain. For tetragonal strain, it is also seen that the transition from AFM-$Q_1$ to AFM-$Q_2$ depends on the strength and direction of the applied strain. The FM state does not appear in this case. Magnetocrystalline anisotropy (MCA) calculations for tetragonal distortion reveal that the spin reorientation transition occurs. In addition, we find that the direction of magnetization and the magnitude of magnetic anisotropy energy strongly depend on the c/a ratio.

• 한국식품과학회지
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• 제45권2호
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• pp.235-240
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• 2013

본 연구에서는 분유 중 아플라톡신 $M_1$을 면역친화성칼럼을 이용하여 정제하고 HPLC로 분리하였으며 형광검출기로 정량 분석하는 시험법을 확립하였다. 이 시험법을 이용하여 439건의 시료에 대한 분석을 실시하였다. 그 결과, 아플라톡신 $M_1$의 검출농도는 평균 2.6 ng/kg(불검출-14.9 ng/kg)로 나타났으며, 검출률은 64%로 조사되었다. 본 연구의 오염도자료를 이용한 분유 중 아플라톡신 $M_1$의 노출량 및 위해 수준은 연령별로 비교했을 때 신생아에게서 가장 높게 나타났으나 초과간암발생률은 1년에 백만명 중 0.02명 정도로서 위해수준은 매우 낮은 것으로 평가 되었다.

• Transactions on Electrical and Electronic Materials
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• 제13권1호
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• pp.35-38
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• 2012

In this study, we have attempted to characterize the photovoltaic effect in real-time measurement of photoinduced current in a poly-Si-based solar cell using photoconductive atomic force microscopy (PC-AFM). However, the high contact resistance that originates from the metal-semiconductor Schottky contact disturbs the current flow and makes it difficult to measure the photoinduced current. To solve this problem, a thin metallic film has been coated on the surface of the device, which successfully decreases the contact resistance. In the PC-AFM analysis, we used a metal-coated conducting cantilever tip as the top electrode of the solar cell and light from a halogen lamp was irradiated on the PC-AFM scanning region. As the light intensity becomes stronger, the current value increases up to $200{\mu}A$ at 80 W, as more electrons and hole carriers are generated because of the photovoltaic effect. The ratio of the conducting area at different conditions was calculated, and it showed a behavior similar to that generated by a photoinduced current. On analyzing the PC-AFM measurement results, we have verified the correlation between the light intensity and photoinduced current of the poly-Si-based solar cell in nanometer scale.

• 대한전자공학회논문지SP
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• 제41권5호
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• pp.23-34
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• 2004

본 논문에서는 사전학습이 필요 없는 능동 특징점 모델(non-prior training active feature model; NPT AFM) 기반에서 광류(optical flow)를 이용한 객체추적 기술을 제안한다. 제안한 알고리듬은 비정형 객체에 대한 분석[1]에 초점을 두고 있으며, 실시간에서 NPT-AFM을 사용한 강건한 추적을 가능하게 한다. NPT-AFM 알고리듬은 관심 객체의 위치를 파악하는 과정 (localization)과 이전 프레임 정보와 현재 프레임 정보를 이용하여, 객체의 위치를 예측(prediction), 보정(correction)하는 과정으로 나눌 수 있다 위치 파악 과정에서는 움직임 분할(motion segmentation)을 수행한 후 개선된 Shi-Tomasi의 특징점 추적 알고리듬[2]을 사용 하였다. 예측 및 보정 과정에서는 광류 정보를 사용하여 특징점을 추적하고[3] 만약, 특징점이 적절히 추적 되지 않거나 추적에 실패하면 특징점들의 시간(temporal), 공간(spatial)적 정보를 이용하여 예측, 보정하게 된다. 객체의 형태 (shape)대신 특징점을 사용하였으며, 객체를 추적하는 과정에서 특징점들은 능동 특징점 모델(active feature model; AFM)을 위한 학습 집합(training sets)의 요소로 갱신된다. 실험결과, 제안한 NPT-AF% 기반 추적 알고리듬은 실시간에서 비정형 객체를 추적하는데 강건함을 보석준다.

• Tribology and Lubricants
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• 제24권2호
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• pp.63-71
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• 2008

Friction and adhesion tests were conducted to investigate tribological characteristics of materials for MEMS/NEMS using atomic force microscope (AFM). AFM Si tips were chemically modified with a self-assembled monolayer (SAM) derived from trichlorosilane like octadecyltrichlorosilane (OTS) and (1H, 1H, 2H, 2H-perfluorooctyl) trichlorosilane (FOTS), and various materials, such as Si, Al, Au, Cu, Ti and PMMA films, were prepared for the tests. SAMs were coated on Si wafer by dipping method prior to AFM tip to determine a proper dipping time. The proper dipping time was determined from the measurements of contact angle, surface energy and thickness of the SAMs. AFM tips were then coated with SAMs by using the same coating condition. Friction and adhesion forces between the AFM Si tip modified with SAM and MEMS/NEMS materials were measured. These forces were compared to those when AFM tip was uncoated. According to the results, after coating OTS and FOTS, the friction and adhesion forces on all materials used in the tests decreased; however, the effect of SAM on the reduction of friction and adhesion forces could be changed according to counterpart materials. OTS was the most effective to reduce the friction and adhesion forces when counterpart material was Cu film. In case of FOTS, friction and adhesion forces decreased the most effectively on Au films.

• 접착 및 계면
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• 제19권4호
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• pp.163-166
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• 2018

이 딥펜 나노리소그라피(DPN)는 원자 힘 현미경(AFM)을 기반으로 하는 나노 및 마이크로 패턴 제조 기술이다. 다양한 잉크 물질을 AFM 탐침에 코팅하여 탐침과 기판 사이에 형성된 물 메니스커스를 통해 기판으로 전이시켜 패턴을 제조한다. 본 연구에서는, 실란 전처리된 AFM 탐침 표면에 불소 실란 잉크 용액을 코팅하고 하이드록시기로 개질된 실리콘 기판 위에 접촉시킨 후, DPN 기술을 이용하여 표면으로 잉크 물질을 전이시키는 연구를 진행하였다. HDFDTMS 잉크 물질의 dot 어레이 패턴을 안정적으로 제조하였으며, AFM 탐침과 기판 사이의 접촉시간에 따라 패턴 크기가 선형적으로 증가하는 전형적인 DPN의 확산 메커니즘을 보였다.