• 대한전기학회:학술대회논문집
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• 대한전기학회 1989년도 하계종합학술대회 논문집
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• pp.291-294
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• 1989

The effect of isothermal aging on the crystallization of $Fe_{78}B_{13}Si_9$ metallic glass has been investigated by electrical resistivity, X-ray measurements, bending test, thermal analysis and transmission electron microscpy. Amouphous $Fe_{78}B_{13}Si_9$ alloy was annealed isothermally for 5 to 1200 min. between $300^{\circ}C$ and $540^{\circ}C$. It has been found that close relation between relative resistivity and X-ray diffraction pattern showed. The crystalline peaks of ${\alpha}$-(Fe, Si) and $Fe_2B$ are detected by X-ray experiment. The crystalline phases observed by TEH show ${\alpha}$-(Fe, Si) and $Fe_2B$ with dendritic and cylindrical morphology, respectively. It has been also found that the embrittleness of aged samples rapidly increased with the crystallization and was shown before the crystallization.

• 한국진공학회:학술대회논문집
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• 한국진공학회 1999년도 제17회 학술발표회 논문개요집
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• pp.171-171
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• 1999

We studied the charge redistribution in the Pt-M (M=Cu, Co) alloys by X-ray Absorption Near Edge Spectroscopy(XANES) and X-ray Photoelectron Spectroscopy(XPS). These analysis tools provide us information about the charge transfer in the valence band of intermetallic bonding. The samples were prepared by arc-melting method. After annealing this samples in vacuum for several hours, we cold get the ordered samples, which were confirmed with XRD analysis. the core and valence level energy shift in these system were investigated by Mg $K\alpha$(1253.6eV) x-ray source for Pt-Co alloys and monochromatized Al $K\alpha$ (1486.6eV) for Pt-Cu alloys. Pt L2, L3-edge, and Cu, Co K-edge XANES spectra were measured with the total electron-yield mode detector at the 3Cl beam line of the PLS (Pohang light source0. from the changes of White line (WL) area and the core level shifts of the each metal sites, we can obtain the information about the electrons participating in the intermetallic bonding of the Pt-Cu and Pt-Co alloys.

• 한국광물학회지
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• 제1권1호
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• pp.15-19
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• 1988

In the process of re-checking the phase relations of the Pt-Sb system the previously reported Pt4+Sb phase did not occur. Instead, Pt34Sb7 phase with an average chemical composition (wt%) Pt 89.3, Sb 11.4, total 100.7, has been newly found to exist, and the formula Pt34Sb7 has been tentatively assigned to it, It is pale brownish grey to yellowish grey under refloecting microscope and non-bireflectant, VHN100=225 (206-243). X-ray powder patterns are (d(I/Io)): 2.318(100), 2.293(100), 2.110(30), 1.440(50), 1.390(15), 1.283(5), 1.203(70) and 1.192(40)$\AA$. They are indexable on the basis of tertragonal cell with $\alpha$=3.948(3), c=16.85(1)$\AA$. A question whether the tetragonal Pt34Sb7 is the new phase or a polymorph of the cubic Pt4+Sb phase remains unclear and awaits better X-ray diffraction, electron microprobe analysis and DTA for the Pt4+Sb phase. The Pt3Sb phase reported to be of tetragonal symmetry has been confirmed to exist. It is greyish yellow in air and in oil, very weakly bireflectant, and weakly anisotropic. VHN25=216 (183-240). Its X-ray powder data have been successively indexed on a tetragonal cell with $\alpha$=3.9455(7), c=16.959(5)$\AA$.

• Archives of Pharmacal Research
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• 제7권2호
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• pp.137-139
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• 1984

The molecular structure of (+)-6-Me hoxy-.alpha.-methyl-2-naphthaleneacetic acid (Naproxen), $C_{14}H_{14}O_{ 3}$, was determined by X-Ray diffraction technique. Naproxen crystallized in $P2_1$ with two molecules on the unit cell of dimensions a = 7.855, b = 5.783, c = 13.347$\AA$ and $\beta$ = $93.9^{\circ}$

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.306.2-306.2
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• 2016

Niobium oxide thin films were synthesized by reactive rf magnetron sputtering. The target was metallic niobium with 2 inch in diameter and the substrate was n-type Si wafer. To control the surface properties of the films, Nb oxide thin films were obtained at various mixing ratios of argon and oxygen gases. Nb oxide thin films were analyzed with alpha step, scanning electron microscopy (SEM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS). The result of alpha step showed that the thickness of Nb oxide thin films were decreased with increasing the oxygen gas ratios. SEM images showed that the granular morphology was formed at 0% of oxygen gas ratio and then disappeared at 20 and 75% of oxygen gas ratio. The amorphous Nb oxide was observed by XRD at all films. The oxidation state of Nb and O were studied with high resolution Ni 2p and O 1s XPS spectra. And the change in the chemical environment of Nb oxide thin films was investigated by XPS with Ar+ sputtering.

• 한국안전학회지
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• 제13권4호
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• pp.172-179
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• 1998

The effects of $^{60}Co\;{\gamma}-Ray$ irradiation on TSC characteristics of TFE type polytetrafluoroethylene(PTFE) were investigated. The $\alpha$ peak on TSC curve of PTFE was decreased, while the $\beta$ peak was reversely increased by the increasing of $\gamma$-irradiation doses up to 80 krad(0.8 kGy). Moreover, $\alpha$ and $\beta$ peaks on TSC curve of the irradiated PTFE are changed with the increasing of the forming temperature and forming electric field. In annealing the irradiated PTFE specimens at room temperature in air, it was shown a continuous recovery of TSC characteristics with time, which is assumed the traped charge carriers are liberated from the shallow traps and undergoes a recombination process during room temperature decay.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.2
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• pp.1014-1017
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• 2003

열증착법을 이용하여 copper(II) phthalocyane (CuPc)의 박막을 제작하였다. 기판의 예열 온도를 달리하여 제작된 CuPc의 박막은 ${\alpha}-phase$와 ${\beta}-phase$로 구분할 수 있으며 phase에 따른 결정 구조를 관찰하기 위해 x-ray diffraction을 사용하고 peak의 위치를 관찰하였다. 또한 SEM, UV visible absorption spectra의 변화를 통해 온도에 따라 상전이가 이행해 가는 모습을 구체적으로 관측하였다. 이러한 결정 구조의 변화는 CuPc 박막의 전기전도 특성에 영향을 달리하여 유기발광 소자에 응용이 가능할 것으로 예상된다.

• 한국세라믹학회지
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• 제30권2호
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• pp.107-114
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• 1993

Zinc-Borosilicate(ZnO 65.0wt%, B2O3 21.5wt%, SiO2 9.0wt%, PbO or tiO2 4wt%) passivation glasses were studied using differential thermal analysis(DTA), scanning electron microscopy(SEM) observations, X-ray diffraction (XRD) patterns and measurement of thermal expansion coefficients. Passivation glasses containing 4wt% TiO2 and 4wt% PbO had crystallization temperature of 680~73$0^{\circ}C$ and major crystalline phases were identified by X-ray diffraction as $\alpha$-ZnO.B2O3 and $\alpha$-5ZnO.2B2O3. As increasing firing temperature, the size of crystalline phases increased by observation of SEM. The thermal expansion coefficient of crystallized glass frits was smaller than that of unfired glass.

• 한국세라믹학회지
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• 제18권2호
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• pp.105-111
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• 1981

The iron precipitates were prepared by adding sodium carbonate solution to ferrous chloride and ferric chloride solutions to pH=9 and pH=4.5, respectively. The thermal reaction of the iron precipitates was investigated by means of TGA, DTA and X-ray diffraction. In the former the crystallization of $\alpha$-$Fe_2O_3$ begins at about 35$0^{\circ}C$, while in the latter at about 30$0^{\circ}C$, during the calclnation in air. In the iron precipitate from ferrous chloride solution, the activation energy for the crystallite-growth or $\alpha$-TEX>$Fe_2O_3$ in air is about 7.6$\times$104J/mole between 800 and 100$0^{\circ}C$. As the result of X-ray diffration for the reduction product of hematite, it was found that maghemite, magnetite and wustite are formed and that hematite is transformed to magnetite through maghemite.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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• pp.173.2-173.2
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• 2014

Thin nitride thin films were synthesized by reactive radio-frequency magnetron sputtering in the ultra high vacuum (UHV) chamber. To control the characteristics of thin films, tin nitride thin films were obtained various argon and nitrogen gas mixtures, especially low nitrogen gas ratios. Tin nitride thin films were analyzed with alpha step, scanning electron microscopy (SEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and 4 point probe measurement. The result of alpha step and SEM showed that the thickness of thin nitride thin films were decreased with increasing nitrogen gas ratios. The metallic tin structure was decreased and the amorphous tin nitride structure were observed by XRD with higher nitrogen gas ratios. The oxidation state of tin and nitride were studied with high resolution Sn 3d and N 1s XP spectra.