• Title/Summary/Keyword: $(Ca_{0.3}Li_{0.14}Sm_{0.42})TiO_3$

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Strain Analysis for Quality Factor oft he Layered Mg0.93Ca0.07TiO3-(Ca0.3Li0.14Sm0.42)TiO3 Ceramics at Microwave Frequencies

  • Cho, Joon-Yeob;Yoon, Ki-Hyun;Kim, Eung-Soo
    • Journal of the Korean Ceramic Society
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    • v.39 no.3
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    • pp.222-225
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    • 2002
  • Microwave dielectric properties of the layered and functionally graded materials (FGMs) of $Mg_{0.93}Ca_{0.07}TiO_3$ (MCT) and $(Ca_{0.3}Li_{0.14}Sm_{0.42})TiO_3$(CLST) were investigated as a function of the volume ratio of two components. Dielectric constant was decreased with an increase of the volume ratio of MCT which had a lower dielectric constant thant CLST. For the layered FGMs specimens, the difference of thermal expansion coefficients between two components induced thermal strain to dielectric layers, which was confirmed by the plot of ${\Delta}$k (X-ray diffraction peak width0 versus k (scattering vector) using the double-peak Lorentzian function, f(x). Quality factor of the specimens was affected by the thermal strain of dielectric layer, especially MCT layer. For the specimen with the volume ratio of MCT/CLST = 2, the qulaity factor of the specimen showed a minimum value due to the maximum thermal strain fo MCT layer.

Effect of Sintering Time on Microwave Dielectric Properties of Layered Mg0.93Ca0.07TiO3-(Ca0.3Li0.14Sm0.42)TiO3 Ceramics (소결시간에 따른 적층형 Mg0.93Ca0.07TiO3-(Ca0.3Li0.14Sm0.42)TiO3 세라믹스의 마이크로파 유전특성)

  • Cho, Joon-Yeob;Yoon, Ki-Hyun;Kim, Eung-Soo;Kim, Tae-Hong
    • Journal of the Korean Ceramic Society
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    • v.39 no.9
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    • pp.890-895
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    • 2002
  • Effect of the sintering time on the microwave dielectric properties of the layered Functionally Graded Materials(FGMs) of the Mg0.93Ca0.07TiO3(MCT) with (Ca0.3Li0.14Sm0.42)TiO3(CLST) ceramics was investigated. The dielectric constant of layered FGMs specimens showed a nearly constant value and did not change significantly with sintering time. The quality factor, however, was affected by the relative density and thermal stress developed in each dielectric layer. With an increase of the relative density and the decrease of the induced thermal stresses, quality factor of the layered FGMs specimens increased and the quality factor was incluenced sensitively by the change of compressive stress developed in MCT layers which had a lower thermal expansion coefficient than that of CLST. For the layered FGMs specimen sintered at 1300$^{\circ}C$ for 9h, the compressive stress developed in MCT layer showed the maximum value, which, in turn, the quality factor of the specimen was the minimum value.