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플래시 스토리지에서 랜덤 선택 방법을 활용한 마모도 평준화 기법

Wear Leveling Technique using Random Selection Method in Flash Storage

  • 박정규 (창신대학교 컴퓨터전공) ;
  • 박은영 (신한대학교 리나시타교양대학)
  • Jung Kyu Park (Department of Computer Engineering, Changshin University) ;
  • Eun Young Park (Rinascita College of Liberal Arts and Sciences, Shinhan University)
  • 투고 : 2024.04.29
  • 심사 : 2024.05.27
  • 발행 : 2024.06.30

초록

최근에는 클라우드 서버, 데이터센터 등에서 플래시 기반의 저장장치가 활발히 활용되면서 신뢰성이 더욱 중요해지고 있다. 플래시 메모리 칩은 읽기/쓰기에 제한이 있어 한곳에 쓰기가 집중되면 칩을 더 이상 사용할 수 없게 된다. 이와 같은 문제를 해결하고 신뢰성을 향상시키기 위해서는 플래시 메모리 칩의 마모를 균등화하는 것이 필요하다. 그러나 대용량이 되어가는 플래시 메모리의 마모 균등화를 위해서는 작업 부하가 비례적으로 증가한다. 특히, 플래시 메모리 칩의 전체 블록의 삭제 횟수가 최대/최소인 블록 블럭을 검색할 때 저장장치의 용량에 따라 비용이 증가한다. 본 논문에서는 앞의 문제를 해결하기 위해서 블럭의 무작위 선택 방법을 적용하였다. 무작위로 선택하는 블록을 k 라고 할 때 실제 실험 결과를 통해 k 값이 4 이상 전체 블록을 검색하는 것과 비슷한 결과를 보여주는 것을 확인하였다.

Recently, reliability has become more important as flash-based storage devices are actively used in cloud servers and data centers. Flash memory chips have limitations in reading/writing, so if writing is concentrated in one location, the chip can no longer be used. To solve this problem and improve reliability, it is necessary to equalize the wear of flash memory chips. However, in order to equalize the wear of flash memory with increasing capacity, the workload increases proportionally. In particular, when searching for a block with the maximum/minimum number of deletions for all blocks of a flash memory chip, the cost increases depending on the capacity of the storage device. In this paper, a random selection method of blocks was applied to solve the previous problem. When k is the randomly selected block, actual experimental results confirmed that searching all blocks with an k value of 4 or more yields similar results.

키워드

과제정보

This work was supported by Changshin University Research Fund of 2024-011

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