Acknowledgement
This paper was supported by Korea Institute for Advancement of Technology (KIAT) grant funded by the Korea Government (MOTIE) (P0017011, HRD Program for Industrial Innovation).
References
- Z. Han and S. H. Son, J. Korean Inst. Electr. Electron. Mater. Eng., 36, 175 (2023). [DOI: https://doi.org/10.4313/JKEM.2023.36.2.11]
- H. R. Yu, J. Korean Inst. Electr. Electron. Mater. Eng., 31, 112 (2018). [DOI: https://doi.org/10.4313/JKEM.2018.31.2.112]
- S. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 33, 360 (2020). [DOI: https://doi.org/10.4313/JKEM.2020.33.5.360]
- Y. Wang, W. Zhou, Q. Kang, J. Chen, Y. Li, X. Feng, D. Wang, Y. Ma, and W. Huang, ACS Appl. Mater. Interfaces, 10, 27001 (2018). [DOI: https://doi.org/10.1021/acsami.8b06710]
- R. S. Kalubarme, H. S. Jadhav, and C. J. Park, Electrochim. Acta, 87, 457 (2013). [DOI: https://doi.org/10.1016/j.electacta.2012.09.081]
- Y. Wang, W. Huo, X. Yuan, and Y. Zhang, Acta Phys.-Chim. Sin., 36, 1904007 (2020). [DOI: https://doi.org/10.3866/PKU.WHXB201904007]
- X. L. Bai, Y. L. Gao, Z. Y. Gao, J. Y. Ma, X. L. Tong, H. B. Sun, and J. A. Wang, Appl. Phys. Lett., 117, 183901 (2020). [DOI:https://doi.org/10.1063/5.0018708]
- S. B. Hong, J. M. Jeong, H. G. Kang, D. Seo, Y. Cha, H. Jeon, G. Y. Lee, M. Irshad, D. H. Kim, S. Y. Hwang, J. W. Kim, and B. G. Choi, ACS Appl. Mater. Interfaces, 10, 35250 (2018). [DOI:https://doi.org/10.1021/acsami.8b12894]
- S. H. Partil, A. P. Gaikwad, B. J. Waghmode, S. D. Sathaye, and K. R. Patil, New. J. Chem., 44, 6853 (2020). [DOI: https://doi.org/10.1039/C9NJ05898B]
- C. Zhu, X. Dong, X. Mei, M. Gao, K. Wang, and D. Zhao, J. Mater. Sci., 55, 17108 (2020). [DOI: https://doi.org/10.1007/s10853-020-05212-2]
- G. Li, Y. Lu, C. Lu, M. Zhu, C. Zhai, Y. Du, and P. Yang, J. Hazard. Mater., 294, 201 (2015). [DOI: https://doi.org/10.1016/j.jhazmat.2015.03.045]
- B. Li, G. Rong, Y. Xie, L. Huang, and C. Feng, Inorg. Chem., 45, 6404 (2006). [DOI: https://doi.org/10.1021/ic0606274]
- Y. P. Li and Y. Z. Hao, Acta Phys.-Chim. Sin., 26, 3365 (2010). [DOI: https://doi.org/10.3866/PKU.WHXB20101205]
- X. L. Bai, X. Tong, Y. Gao, W. Zhu, C. Fu, J. Ma, T. Tan, C. Wang, Y. Luo, and H. Sun, Electrochim. Acta, 281, 525 (2018). [DOI: https://doi.org/10.1016/j.electacta.2018.06.003]
- J. Yan, Z. Fan, T. Wei, W. Qian, M. Zhang, and F. Wei, Carbon, 48, 3825 (2010). [DOI: https://doi.org/10.1016/j.carbon.2010.06.047]
- G. Zhu, Z. He, J. Chen, J. Zhao, X. Feng, Y. Ma, Q. Fan, L. Wang, and W. Huang, Nanoscale, 6, 1079 (2014). [DOI: https://doi.org/10.1039/c3nr04495e]
- L. S. Panchokarla, K. S. Subrahmanyam, S. K. Saha, A. Govindaraj, H. R. Krisnamurthy, U. V. Waghmare, and C.N.R. Rao, Adv. Mater., 21, 4726 (2009). [DOI: https://doi.org/10.1002/adma.200901285]
- X. Wang, X. Li, L. Zhang, Y. Yoon, P. K. Weber, H. Wang, J. Guo, and H. J. Dai, Science, 324, 768 (2009). [DOI: https://doi.org/10.1126/science.1170335]
- B. Guo, Q. Liu, E. Chen, H. Zhu, L. Fang, and J. R. Gong, Nano Lett., 10, 4975 (2010). [DOI: https://doi.org/10.1021/nl103079j]
- Z. H. Sheng, L. Shao, J. J. Chen, W. J. Bao, F. B. Wang, and X. H. Xia, ACS Nano, 5, 4350 (2011). [DOI: https://doi.org/10.1021/nn103584t]
- X. Li, H. Wang, J. T. Robinson, H. Sanchez, G. Diankov, and H. Dai, J. Am. Chem. Soc., 131, 15939 (2009). [DOI: https://doi.org/10.1021/ja907098f]
- Z. Jin, J. Yao, C. Kittrell, and J. M. Tour, ACS Nano, 5, 4112 (2011). [DOI: https://doi.org/10.1021/nn200766e]
- A.L.M. Reddy, A. Srivastava, S. R. Gowda, H. Gullapalli, M. Dubey, and P. M. Ajayan, ACS Nano, 4, 6337 (2010). [DOI:https://doi.org/10.1021/nn101926g]
- W. Qian, X. Cui, R. Hao, Y. Hou, and Z. Zhang, ACS Appl. Mater. Interfaces, 3, 2259 (2011). [DOI: https://doi.org/10.1021/am200479d]
- Z. Mou, X. Chen, Y. Du, X. Wang, P. Yang, and S. Wang, Appl. Surf. Sci., 258, 1704 (2011). [DOI: https://doi.org/10.1016/j.apsusc.2011.10.019]
- S. Wakeland, R. Martinez, J. K. Grey, and C. C. Luhrs, Carbon, 48, 3463 (2010). [DOI: https://doi.org/10.1016/j.carbon.2010.05.043]
- N. I. Kovtyukhova, P. J. Ollivier, B. R. Martin, T. E. Mallouk, S. A. Chizhik, E. V. Buzaneva, and A. D. Gorchinskiy, Chem. Mater., 11, 771 (1999). [DOI: https://doi.org/10.1021/cm981085u]
- W. S. Hummers and R. E. Offeman, J. Am. Chem. Soc., 80, 1339 (1958). [DOI: https://doi.org/10.1021/ja01539a017]
- C. Hontoria-Lucas, A. J. Lopez-Peinado, J. de D. Lopez-Gonzalez, M. L. Rojas-Cervantes, and R. M. Martin-Aranda, Carbon, 33, 1585 (1995). [DOI: https://doi.org/10.1016/0008-6223(95)00120-3]
- H. L. Guo, X. F. Wang, Q. Y. Qian, F. B. Wang, and X. H. Xia, ACS Nano, 3, 2653 (2009). [DOI: https://doi.org/10.1021/nn900227d]
- Z. H. Liu, Z. M. Wang, X. Yang, and K. Ooi, Langmuir, 18, 4926 (2002). [DOI: https://doi.org/10.1021/la011677i]