Acknowledgement
The corresponding author was financially supported by Hanbat National University Financial Accounting Research Fund in 2021, and the research was also supported by the Semiconductor Materials and Equipment Center at Hanbat National University.
References
- M. Girtan and B. Negulescu, Opt. Mater. X, 13, 100122 (2022).
- F. Marangi, M. Lombardo, A. Villa and F. Scotognella, Opt. Mater. X, 11, 10083 (2021).
- G. Brunin, F. Ricci, V.-A. Ha, G.-M. Rignanese and G. Hautier, npj Comput. Mater., 5, 63 (2019).
- G. K. Dalapati, H. Sharma, A. Guchhait, N. Chakrabarty, P. Bamola, Q. Liu, G. Saianand, A. M. S. Krishna, S. Mukhopadhyay, A. Dey, T. K. S. Wong, S. Zhuk, S. Ghosh, S. Chakrabortty, C. Mahata, S. Biring, A. Kumar, C. S. Ribeiro, S. Ramakrishna, A. K. Chakraborty, S. Krishnamurthy, P. Sonar and M. Sharma, J. Mater. Chem. A, 9, 16621 (2021).
- R. A. Maniyara, V. K. Mkhitaryan, T. L. Chen, D. S. Ghosh and V. Pruneri, Nat. Commun., 7, 13771 (2016).
- R. A. Maniyara, C. Graham, B. Paulillo, Y. Bi, Y. Chen, G. Herranz, D. E Baker, P. Mazumder, G. Konstantatos and V. Pruneri, APL Mater., 9, 21121 (2021).
- S. Jang, J. S. Jang, E. Jo, V. C. Karade, J. Kim, J. H. Moon and J. H. Kim, Korean. J. Mater. Res., 31, 150 (2021). https://doi.org/10.3740/MRSK.2021.31.3.150
- H. S. Lee, J. Y. Cho, S.-M. Youn, C. Jeong and J. Heo, Korean J. Mater. Res., 30, 566 (2020). https://doi.org/10.3740/MRSK.2020.30.10.566
- M. Mizuhashi, in Handbook of Transparent Conductors. Springer, edited by D. S. Ginley, H. Hosono and D. C. Paine (Springer, October, 2011) p.524.
- M. S. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 26, 194 (2013).
- T. P. Nguyen, P. Le Rendu, N. N. Dinh, M. Fourmigue and C. Meziere, Synth. Met., 138, 229 (2003).
- S. Macher, M. Rumpel, M. Schott, U. Posset, G. A. Giffin and P. Lobmann, ACS Appl. Mater. Interfaces, 12, 36695 (2020).
- S. Yun, J. Lee, J. Yang and S. Lim, Phys. B., 405, 413 (2010).
- S.-J. Young, C.-C. Yang and L.-T. Lai, J. Electrochem. Soc., 164, B3013 (2017).
- M. Suja, S. B. Bashar, M. M. Morshed and J. Liu, ACS Appl. Mater. Interfaces, 7, 8894 (2015).
- S. Brahama, Y.-W. Yeh, J.-L. Huanag and C.-P. Liu, Appl. Surf. Sci., 564, 150351 (2021).
- Z. Ma, F. Ren, X. Ming, Y. Long and A. A. Volinsky, Materials, 12, 196 (2019).
- Q. Hou, J. Buckeridge, A. Walsh, Z. Xie, Y. Lu, T. W. Keal, J. Guan, S. M. Woodley, C. R. A. Catlow and A. A. Sokol, Front. Chem., 9, 780935 (2021).
- J. L. Lyons, A. Alkauskas, A. Janotti and C. G. Van de Walle, Appl. Phys. Lett., 111, 42101 (2017).
- G. Haacke, J. Appl. Phys., 47, 4086 (1976).
- C. Ji, D. Liu, C. Zhang and L. Guo, Nat. Commun., 11, 3367 (2020).
- H. Zhou, J. Xie, M. Mai, J. Wang, X. Shen, S. Wang, L. Zhang, K. Kisslinger, H. Q. Wang, J. Zhang, Y. Li, J. Deng, S. Ke and X. Zeng, ACS Appl. Mater. Interfaces, 10, 16160 (2018). https://doi.org/10.1021/acsami.8b00685
- S. Sutthana, N. Hongsith and S. Choopun, Curr. Appl. Phys., 10, 813 (2010).
- S. Yu, Y. Liu, H. Zheng, L. Li and Y. Sun, Opt. Lett., 42, 3020 (2017).
- M. Kumar, S. M. Baek and J. Kim, Mater. Lett., 137, 132 (2014).
- B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, 3rd ed. (Pearson Education Limited, Harlow, UK, 2014) p.174.
- K. Cho, S. J. Kim and S. Y. Choi, J. Korean Inst. Electr. Electron. Mater. Eng., 25, 543 (2012).
- B. N. Park, S. Y. Choi and H. J. Kang, J. Korean Inst. Electron. Eng. SD, 40, 1 (2003).
- A. Segmuller and M. Murakami, in Analytical Techniques for Thin Films, edited by K. N. Tu & R. Rosenberg (Academic, Boston, U.S.A., 1988) p.143.