Acknowledgement
This work has supported by the National Research Foundation of Korea(NRF) grant funded by the Korea government(MSIT) (No. NRF-2022R1C1C1010071).
References
- D. S. Jeong, K. M. Kim, S. Kim, B. J. Choi, and C. S. Hwang, Adv. Electron. Mater., 2, 1600090 (2016). [DOI: https://doi.org/10.1002/AELM.201600090]
- S. Ambrogio, P. Narayanan, H. Tsai, R. M. Shelby, I. Boybat, C. di Nolfo, S. Sidler, M. Giordano, M. Bodini, N.C.P. Farinha, B. Killeen, C. Cheng, Y. Jaoudi, and G. W. Burr, Nature, 558, 60 (2018). [DOI: https://doi.org/10.1038/s41586-018-0180-5]
- S. Oh, Y. Shi, J. Valle, P. Salev, Y. Lu, Z. Huang, Y. Kalcheim, I. Schuller, D. Kuzum, Nature Nanotechnology, 16, 680 (2021) [DOI: http://doi.org/10.1038/s41565-021-00874-8]
- Z. Wang, S. Joshi, S. Savel'ev, W. Song, R. Midya, Y. Li, M. Rao, P. Yan, S. Asapu, Y. Zhuo, H. Jiang, P. Lin, C. Li, J. H. Yoon, N. K. Upadhyay, J. Zhang, M. Hu, J. P. Strachan, M. Barnell, Q. Wu, H. Wu, R. S. Williams, Q. Xia, and J. J. Yang, Nat. Electron., 1, 137 (2018). [DOI: https://doi.org/10.1038/s41928-018-0023-2]
- P. Yao, H. Wu, B. Gao, S. B. Eryilmaz, X. Huang, W. Zhang, Q. Zhang, N. Deng, L. Shi, H.S.P. Wong, and H. Qian, Nat. Commun., 8, 15199 (2017). [DOI: https://doi.org/10.1038/ncomms15199]
- M. Davies, N. Srinivasa, T. H. Lin, G. Chinya, Y. Cao, S. H. Choday, G. Dimou, P. Joshi, N. Imam, S. Jain, Y. Liao, C. K. Lin, A. Lines, R. Liu, D. Mathaikutty, S. McCoy, A. Paul, J. Tse, G. Venkataramanan, Y. H. Weng, A. Wild, Y. Yang, and H. Wang, IEEE Micro, 38, 82 (2018). [DOI: https://doi.org/10.1109/MM.2018.112130359]
- G. Pedretti, V. Milo, S. Ambrogio, R. Carboni, S. Bianchi, A. Calderoni, N. Ramaswamy, A. S. Spinelli, and D. Ielmini, Sci. Rep., 7, 5288 (2017). [DOI: https://doi.org/10.1038/s41598-017-05480-0]
- J. Woo, T. V. Nguyen, J. H. Kim, J. P. Im, S. Im, Y. Kim, K. S. Min, and S. E. Moon, Sci. Rep., 10, 11703 (2020). [DOI: https://doi.org/10.1038/s41598-020-68547-5]
- D. H. Lim, S. Wu, R. Zhao, J. H. Lee, H. Jeong, and L. Shi, Nat. Commun., 12, 319 (2021). [DOI: https://doi.org/10.1038/s41467-020-20519-z]
- S. H. Jo, T. Chang, I. Ebong, B. B. Bhadviya, P. Mazumder, and W. Lu, Nano Lett., 10, 1297 (2010). [DOI: https://doi.org/10.1021/nl904092h]
- D. Mehta, M. Rahman, K. Aono, and S. Chakrabartty, Nat. Commun., 13, 1670 (2022). [DOI: https://doi.org/10.1038/s41467-022-29320-6]
- W. Gerstner, W. M. Kistler, R. Naud, and L. Paninski, Neuronal Dynamics: From Single Neurons to Networks and Models of Cognition. 1st ed. Chapter 2 (Cambridge University Press, UK, 2014).
- Z. Wang, M. Rao, J. W. Han, J. Zhang, P. Lin, Y. Li, C. Li, W. Song, S. Asapu, R. Midya, Y. Zhuo, H. Jiang, J. H. Yoon, N. K. Upadhyay, S. Joshi, M. Hu, J. P. Strachan, M. Barnell, Q. Wu, H. Wu, Q. Qiu, R. S. Williams, Q. Xia, and J. J. Yang, Nat. Commun., 9, 3208 (2018). [DOI: https://doi.org/10.1038/s41467-018-05677-5]
- D. Lee, M. Kwak, K. Moon, W. Choi, J. Park, J. Yoo, J. Song, S. Lim, C. Sung, W. Banerjee, and H. Hwang, Adv. Electron. Mater., 5, 1800866 (2019). [DOI: https://doi.org/10.1002/aelm.201800866]
- T. Tuma, A. Pantazi, M. L. Gallo, A. Sebastian, and E. Eleftheriou, Nat. Nanotechnol., 11, 693 (2016). [DOI: https://doi.org/10.1038/nnano.2016.70]
- R. Yang, H. M. Huang, and X. Guo, Adv. Electron. Mater., 5, 1900287 (2019). [DOI: https://doi.org/10.1002/aelm.201900287]
- R. Wang, J. Q. Yang, J. Y. Mao, Z. P. Wang, S. Wu, M. Zhou, T. Chen, Y. Zhou, and S. T. Han, Adv. Intell. Syst., 2, 2000055 (2020). [DOI: https://doi.org/10.1002/aisy.202000055]
- H. Lee, S. W. Cho, S. J. Kim, J. Lee, K. S. Kim, I. Kim, J. K. Park, J. Y. Kwak, J. Kim, J. Park, Y. J. Jeong, G. W. Hwang, K. S. Lee, D. Ielmini, and S. Lee, Nano Lett., 22, 733 (2022). [DOI: https://doi.org/10.1021/acs.nanolett.1c04125]
- E. Herrmann, A. Rush, T. Bailey, and R Jha, IEEE Electron Device Lett., 39, 500 (2018). [DOI: https://doi.org/10.1109/LED.2018.2806188]
- S. Choi, J. W. Choi, J. C. Kim, H. Y. Jeong, J. Shin, S. Jang, S. Ham, N. D. Kim, and G. Wang, Nano Energy, 84, 105947 (2021). [DOI: https://doi.org/10.1016/J.NANOEN.2021.105947]
- J. Yoo, J. Park, J. Song, S. Lim, and H. Hwang, Appl. Phys. Lett., 111, 063109 (2017). [DOI: https://doi.org/10.1063/1.4985165]
- Q. Hua, H. Wu, B. Gao, M. Zhao, Y. Li, X. Li, X. Hou, M.F.M. Chang, P. Zhou, H. Qian, Adv. Sci., 6, 1900024 (2019). [DOI: https://doi.org/10.1002/ADVS.201900024]
- H. Jiang, D. Belkin, S. E. Savel'ev, S. Lin, Z. Wang, Y. Li, S. Joshi, R. Midya, C. Li, M. Rao, M. Barnell, Q. Wu, J. J. Yang, and Q. Xia, Nat. Commun., 8, 882 (2017). [DOI: https://doi.org/10.1038/s41467-017-00869-x]
- C. Yoo, W. Kim, J. W. Jeon, E. S. Park, M. Ha, Y. K. Lee, and C. S. Hwang, ACS Appl. Mater. Interfaces, 12, 23110 (2020). [DOI: https://doi.org/10.1021/acsami.0c03747]
- W. Kim, S. Yoo, C. Yoo, E. S. Park, J. Jeon, Y. J. Kwon, K. S. Woo, H. J. Kim, Y. K. Lee, and C. S. Hwang, Nanotechnology, 29, 365202 (2018). [DOI: https://doi.org/10.1088/1361-6528/aacda0]
- D. Dev, A. Krishnaprasad, M. S. Shawkat, Z. He, S. Das, D. Fan, H. S. Chung, Y. Jung, and T. Roy, IEEE Electron Device Lett., 41, 936 (2020). [DOI: https://doi.org/10.1109/LED.2020.2988247]
- C. C. Chiang, V. Ostwal, P. Wu, C. S. Pang, F. Zhang, Z. Chen, and J. Appenzeller, Appl. Phys. Rev., 8, 021306 (2021). [DOI: https://doi.org/10.1063/5.0038013]
- Y. Shi, X. Liang, B. Yuan, V. Chen, H. Li, F. Hui, Z. Yu, F. Yuan, E. Pop, H.S.P. Wong, and M. Lanza, Nat. Electron., 1, 458 (2018). [DOI: https://doi.org/10.1038/s41928-018-0118-9]
- W. Yi, K. K. Tsang, S. K. Lam, X. Bai, J. A. Crowell, and E. A. Flores, Nat. Commun., 9, 4661 (2018). [DOI: https://doi.org/10.1038/s41467-018-07052-w]
- M. D. Pickett, G. Medeiros-Ribeiro, and R. S. Williams, Nat. Mater., 12, 114 (2013). [DOI: https://doi.org/10.1038/nmat3510]
- M. L. Gallo and A. Sebastian, J. Phys. D: Appl. Phys., 53, 213002 (2020). [DOI: https://doi.org/10.1088/1361-6463/ab7794]
- T. Kaplan and D. Adler, Thermal, Appl. Phys. Lett., 19, 418 (2003). [DOI: https://doi.org/10.1063/1.1653754]
- N. F. Mott, The Philosophical Magazine: A Journal of Theoretical Experimental and Applied Physics, 24, 911 (2006). [DOI: https://doi. org/10.1080/14786437108217058]
- D. Adler, M. S. Shur, M. Silver, and S. R. Ovshinsky, J. Appl. Phys., 51, 3289 (2008). [DOI: https://doi.org/10.1063/1.328036]
- A. Cappelli, E. Piccinini, F. Xiong, A. Behnam, R. Brunetti, M. Rudan, E. Pop, and C. Jacoboni, Appl. Phys. Lett., 103, 083503 (2013). [DOI: https://doi.org/10.1063/1.4819097]
- D. Ielmini, Phys. Rev. B, 78, 035308 (2008). [DOI: https://doi.org/10.1103/PHYSREVB.78.035308]
- H. M. Huang, R. Yang, Z. H. Tan, H. K. He, W. Zhou, J. Xiong, and X. Guo, Adv. Mater., 31, 1803849 (2019). [DOI: https://doi.org/10.1002/adma.201803849]
- W. Xu, H. Cho, Y. H. Kim, Y. T. Kim, C. Wolf, C. G. Park, and T. W. Lee, Adv. Mater., 28, 5916 (2016). [DOI: https://doi.org/10.1002/adma.201506363]