Acknowledgement
Thanks to Dr. Huajun Liu, Dr. Fang Liu and Peng Xu from the Institute of Plasma Physics, Chinese Academy of Sciences for measuring the V-I characteristics of the joints, Jiamin Zhu and Sikan Chen from Shanghai Superconductor Technology Co., Ltd. for their guidance on the axial tensile stress test of the joints, Dr. Yue Zhao from the School of Electronics, Information and Electrical Engineering, Shanghai Jiao Tong University for helping us to understand the microstructure of REBCO tapes, and Prof. Hao Lu from the School of Materials Science and Engineering, Shanghai Jiao Tong University for guidance on investigating the microstructure of the copper diffusion joints. The authors acknowledge support from the National Natural Science Foundation of Shanghai (Project No. 20ZR1425800) and Shanghai Rising-Star Program (Project No. 20QC1401400).
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