Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

Thermal Analysis Characteristics of Vacuum Interrupter for Load Switcher

부하 개폐기용 진공차단기의 열 해석 특성

  • Jang, Kyunguk (Department of Electrical Engineering, Gachon University)
  • Received : 2021.02.22
  • Accepted : 2021.03.02
  • Published : 2021.05.01
Download PDF
⟨ Previous Next ⟩

Abstract

The 22.9 kV vacuum interrupter (VI) built-in load bus switcher (LBS), which is most often used as a load switch for distribution, extinguishes the arc that occurs during normal load opening and closing and fault current interruption within the VI housing to quickly switch circuits. As a protective device for contact separation, the rated current is supplied in a normal state. When a fault current flows due to a fault or an accident in the power system, the contact is disconnected in a vacuum state to block the fault current. In this study, in order to design the optimal VI, the heat dissipation characteristics of VI according to the center electrode distance 0/1/2/3 cm were analyzed by applying the finite element method, and the results were reflected to improve the structure of the VI.

Keywords

References

  1. C. L. Bak, A. Borghetti, J. Glasdam, J. Hjerrild, F. Napolitano, C. A. Nucci, and M. Paolone, Electr. Power Syst. Res., 156, 35 (2018). [DOI: https://doi.org/10.1016/j.vacuum.2015.10.024]
  2. R. Todorovic, D. Skataric, Z. Bajramovic, and K. Stankovic, Vacuum, 123, 111 (2016). [DOI: https://doi.org/10.1016/j.epsr.2017.11.010]
  3. Altsoft, COMSOL Multiphysics Guide, http://www.comsol.com (2010). [DOI: https://doi.org/10.1016/S1350-4789(10)70335-4]
  4. H. S. Kim and K. U. Jang, J. Korean Inst. Electr. Electron. Mater. Eng., 31, 521 (2018). [DOI: https://doi.org/10.4313/JKEM.2018.31.7.521]
  5. K. U. Jang, J. Korean Inst. Electr. Electron. Mater. Eng., 28, 403 (2015). [DOI: https://doi.org/10.4313/JKEM.2015.28.6.403]
  6. K. U. Jang, Inst. Korean Electr. Electron. Eng., 23, 793 (2019). [DOI: https://doi.org/10.7471/ikeee.2019.23.3.793]