Current Photovoltaic Research

Korea Photovoltaic Society (한국태양광발전학회)
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Effect of Metal Mask Screen on Metal-induced Recombination Current and Solar Cell Characteristics

금속 마스크 스크린이 금속 재결합 전류와 태양전지 특성에 미치는 영향

  • Lee, Uk Chul (Photovoltaics Laboratory, Korea Institute of Energy Research) ;
  • Jeong, Myeong Sang (Photovoltaics Laboratory, Korea Institute of Energy Research) ;
  • Lee, Joon Sung (Hanvixolar Inc.) ;
  • Song, Hee-eun (Photovoltaics Laboratory, Korea Institute of Energy Research) ;
  • Kang, Min Gu (Photovoltaics Laboratory, Korea Institute of Energy Research) ;
  • Park, Sungeun (Photovoltaics Laboratory, Korea Institute of Energy Research) ;
  • Chang, Hyo Sik (Chungnam National University Graduate School of Energy Science And Technology) ;
  • Lee, Sang Hee (Photovoltaics Laboratory, Korea Institute of Energy Research)
  • 이욱철 (한국에너지기술연구원 태양광 연구단) ;
  • 정명상 (한국에너지기술연구원 태양광 연구단) ;
  • 이준성 (한빅솔라(주)) ;
  • 송희은 (한국에너지기술연구원 태양광 연구단) ;
  • 강민구 (한국에너지기술연구원 태양광 연구단) ;
  • 박성은 (한국에너지기술연구원 태양광 연구단) ;
  • 장효식 (충남대학교 에너지과학기술대학원) ;
  • 이상희 (한국에너지기술연구원 태양광 연구단)
  • Received : 2020.12.04
  • Accepted : 2021.01.14
  • Published : 2021.03.31
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Abstract

The mesh mask screen, which is generally used for screen printing metallization of silicon solar cell, requires high squeegee pressure and low printing speed. These requirements are acting as a limiting factor in production yield in photovoltaic industries. In order to improve the productivity, a metal mask, which has high durability and high printing speed, has been researched. In this paper, the characteristics of each solar cell, in which electrodes were formed by using a metal mask and a mesh mask, were analyzed through recombination current density. In particular, the metal-induced recombination current density (Jom) representing the recombination of the emitter-metal interface was calculated using the shading method, and the resulting efficiency and open-circuit voltage were analyzed through the diode equation. As a result of analyzing the proportion of the metal-induced recombination current density to the total emitter recombination current density, it was analyzed that the reduction of the metal-induced recombination current density through the metal mask is an important factor in reducing the total recombination current density of the solar cell.

Keywords

References

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