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Study on the MTTF of Multi Wave Lengths IR and NIR LEDs Module

다파장 IR과 NIR 모듈의 평균 수명 예측에 관한 연구

  • Kim, Dong Pyo (Department of Semiconductor System, Yejoo Institute of Technology) ;
  • Kim, Kyung Seob (Department of Semiconductor System, Yejoo Institute of Technology)
  • 김동표 (여주대학교 반도체시스템과) ;
  • 김경섭 (여주대학교 반도체시스템과)
  • Received : 2020.11.02
  • Accepted : 2020.11.09
  • Published : 2021.01.01

Abstract

Recently, infrared (IR) and near-infrared (NIR) light-emitting diodes (LEDs) were widely used for home medical applications owing to its low output power and wide exposed area for curing. For deep penetration of the light under the skin, multiple LEDs with wavelengths of 700~10,000 nm were located on a flexible printed circuit board. When multiple wavelengths of LEDs were soldered on a circuit board, the lifetime of LED module highly depends on LEDs with a short lifetime. The mean time to failure (MTTF) was able to calculate with the experimental results under high temperature and the Arrhenius model. The results of this study could help companies to approve the warranty of LED modules and its product.

Keywords

References

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