Applied Microscopy

  • Volume 50
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  • Pages.15.1-15.6
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  • 2020
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  • 2287-5123(pISSN)
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  • 2287-4445(eISSN)
Korean Society of Microscopy (한국현미경학회)
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Replacing critical point drying with a low-cost chemical drying provides comparable surface image quality of glandular trichomes from leaves of Millingtonia hortensis L. f. in scanning electron micrograph

  • Raktim Bhattacharya (Natural Product Biotechnology Group, Agricultural and Food Engineering Department, Indian Institute of Technology Kharagpur) ;
  • Sulagna Saha (Natural Product Biotechnology Group, Agricultural and Food Engineering Department, Indian Institute of Technology Kharagpur) ;
  • Olga Kostina (Laboratory of Plant Anatomy and Morphology, Komarov Botanical Institute, Russian Academy of Sciences) ;
  • Lyudmila Muravnik (Laboratory of Plant Anatomy and Morphology, Komarov Botanical Institute, Russian Academy of Sciences) ;
  • Adinpunya Mitra (Natural Product Biotechnology Group, Agricultural and Food Engineering Department, Indian Institute of Technology Kharagpur)
  • Received : 2020.04.19
  • Accepted : 2020.07.09
  • Published : 2020.12.31
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Abstract

Sample preparation including dehydration and drying of samples is the most intricate part of scanning electron microscopy. Most current sample preparation protocols use critical-point drying with liquid carbon dioxide. Very few studies have reported samples that were dried using chemical reagents. In this study, we used hexamethyldisilazane, a chemical drying reagent, to prepare plant samples. As glandular trichomes are among the most fragile and sensitive surface structures found on plants, we used Millingtonia hortensis leaf samples as our study materials because they contain abundant glandular trichomes. The results obtained using this new method are identical to those produced via critical-point drying.

Keywords

Acknowledgement

The authors acknowledge the scanning electron microscopy laboratory at the Central Research Facility at Indian Institute of Technology Kharagpur, India, and the scanning electron microscopy facility at the Komarov Botanical Institute, Saint Petersburg, Russia, for providing technical support.

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