전자장-열유동 연성해석으로 알아보는 방열 해석

References

1. S. Yang, D. Xiang, A. Bryant, P. Mawby, L. Ran, and P. Tavner, "Condition monitoring for device reliability in power electronic converters: A review," IEEE Transactions on Power Electronics, Vol. 25, No. 11, pp. 2734-2752, 2010. https://doi.org/10.1109/TPEL.2010.2049377