References
- S. Lim, "Popularity of Galaxy S20 Ultra Pre-booked Gift Event 'Hot Bus Phone' Galaxy S10, S10e Inventory Clearance Promotion", The Asia Business Daily, (Feb. 23, 2020) from https://view.asiae.co.kr/article/2020022117353637348
- N. Koike, I. Takemoto, K. Sato, H. Matsumaru, M. Shikawa, and M. Kubo, "MOS Area Sensor: Part II-Low-Noise MOS Area Sensor with Antiblooming Photodiodes", IEEE Journal of Solid-State Circuits, 15(4), 747 (1980). https://doi.org/10.1109/JSSC.1980.1051464
- J. Park, Y. Koo, E. Kim, and G. Kim, "A Reliability and warpage of wafer level bonding for CIS device using polymer", J. Microelectron. Packag. Soc., 16(1), 27 (2009).
- Y. Ishihara and K. Tanigaki, "A High Photosensitivity ILCCD Image Sensor with Monolithic Resin Lens Array", Proc. International Electron Devices Meeting (IEDM), Washington, DC, 497, IEEE (1983).
- J. Bosiers, E. Manoury, W. Klaassens, H. Stoldt, R. Leenen, H. Kuijk, H. Peek, and W. Laat, "Recent Developments on Large area CCDs for professional applications", International Image Sensor Workshop (IISW), Netherlands, 17 (2015).
- T. Lule, R. Henderson, L. Simony, F. Mutze, S. Benthien, and M. Sommer, "Accurate Simulation and Modeling of Reset Noise in 3T CMOS Active Pixels", IEEE Workshop on CCD and Advanced Image Sensors, Japan, 15 (2005).
-
R. Guidash, T. H. Lee, P. K. Lee, and D. H. Sackett, "A
$0.6{\mu}m$ CMOS Pinned Photodiode Color Imager Technology", IEDM, 927 (1997). - S. Park, "CCD/CMOS Image Sensor", pp.136-140, Dooyangsa, (2009).
- Y. Kim, "Design of high sensitivity sense amplifier with selfbias circuit for CCD image sensor", J. Microelectron. Packag. Soc., 5(2), 65 (1998).
- J. H. Park, Y. K. Lee, B. S. Kim, B. M. Kim, J. S. Park, E. J. Yeom, Y. J. Jung, T. H. Kim, H. S. Yoon, Y. H. Kim, J. S. Park, C. R. Moon, and Y. I. Park, "Pixel Technology for Improving IR Quantum Efficiency of Backside Illuminated CMOS Image Sensor", Proc. International Image Sensor Workshop (IISW), USA, 1 (2019).
- R. Fontaine, "The State-of-the-Art of Smartphone Imagers", Proc. International Image Sensor Workshop (IISW), USA, R01 (2019).
-
M. Murakami, M. Masyama, S. Tanaka, M. Uchida, K. Fujiwara, M. Kojima, Y. Matsunaga, and S. Mayumi, "2.8
${\mu}m$ pixel Image Sensor v-Micovicon", Proc. IEEE Workshop on CCD and Advanced Image Sensors, Japan, 13 (2005). -
H. Tajahashi, M. Kinoshita, K. Morita, T. Shirai, T. Sato, T. Kimura, H. Yuzurihata, S. Inoue, and S. Matsumoto, "A
$3.9-{\mu}m$ Pixel Pitch VGA Format 10-b Digital Output CMOS Image Sensor with 1.5 Transistor/Pixel", IEEE Journal of Sold-state Circuits, 39(12), 2417 (2004). https://doi.org/10.1109/JSSC.2004.837087 - R. D. McGath, H. Fujita, R. Guidash, T. Kenney, and W. Xu, "Shared Pixels for CMOS Image Sensor Arrays, Proc. IEEE Workshop on CCD and Advanced Image Sensors, Japan, 9 (2005).
- Yongnam Kim and Yunkyung Kim, "High-Sensitivity Pixels with a Quad-WRGB Color Filter and Spatial Deep-Trench Isolation", Sensors, 19(21), 4653 (2019). https://doi.org/10.3390/s19214653
- M. Kobayashi, M. Johnson, H. Tsuboi, T. Ono, H. Takada, K. Togo, T. Kishi, H. Takahashi, T. Ichikawa, and S. Inoue, "A Low Noise and High Sensitivity Image sensor with Imaging and Phase Difference Detection AF in all Pixels", Proc. International Image Sensor Workshop (IISW), Netherlands, 9 (2015).
- A. Rush and P. Hubel, "X3 Sensor Characteristics", J. Soc. Photogr. Sci. Technol. Jpn., 66(1), 57 (2003).
- E. Stevens, J. Clayhold, H. Doan, R. Fabinski, J. Hynecek, and S. Kosman, "Recent Enhancements to Electron Multiplying CCD Image Sensor", Proc. International Image Sensor Workshop (IISW), Japan, 9 (2017).
- X. Zhou, M. Zhang, Y. Xu, W. Zhou, K. Wang, A. Nathan, M. Wong, H. S. Kwok, H. Ou, J. Chen, S. Deng, and N. Xu, "Vertically Integrated Optical Sensor with Photoconductive Gain > 10 and Fill Factor > 70%", IEEE Electron Device Letters, 39(3), 386 (2018). https://doi.org/10.1109/led.2018.2792003
- T. Okino, S. Yamahira, S. Yamada, Y. Hirose, A. Odagawa, Y. Kato, and T. Tanaka, "A Real-Time Ultraviolet Radiation Imaging System Using an Organic Photoconductive Image Sensor", Sensors, 18(1), 314 (2018). https://doi.org/10.3390/s18010314
- J. Vuuren, A. Armin, A. Pandey, P. Burn, and P. Meredith, "Organic Photodiodes: The Future of Full Color Detection and Image Sensing", Advanced Materials, 28(24), 4766 (2016). https://doi.org/10.1002/adma.201505405
- E. R. Fossum, "What to do with Sub-Diffraction-Limit (SDL) Pixels? - A proposal for a gigapixel digital film sensor (DFS)", IEEE Workshop on CCD and Advanced Image Sensors, Japan, 214 (2005).
- W. Deng, D. Starkey, J. Ma, and E. R. Fossum, "Modelling Measured 1/f Noise in Quanta Image Sensors", Proc. International Image Sensor Workshop (IISW), Snowbird, UT, USA, 23 (2019).
-
D. Palubiak, S. Gnecchi, C. Jackson, S. Ma, O. Skorka, and R. Ispasoiu, "Pandion: A 400
$\times$ 100 SPAD sensor for ToF LiDAR with 5 Hz median DCR and 11 ns mean dead-time", Proc. International Image Sensor Workshop (IISW), USA, R29 (2019).