References
- J.W. Lee, H.B. Kim, K.H. Choi, A Study on the Organic-Inorganic Multilayer Barrier Thin Films Using R2R Low-Temperature Atmospheric-Pressure Atomic Layer Deposition System, J. Korea Inst. Mat. Eng., 13 (2018) 51-58.
- D. Bo. Semple, Katie L. Nardi, N. Draeger, Dennis M. Hau., Area-Selective Atomic Layer Deposition Assisted by Self-Assembled Monolayers: A Comparison of Cu, Co, W, and Ru, Chem. Mat., 31, 5 (2019) 1635-1645. https://doi.org/10.1021/acs.chemmater.8b04926
- Rizwan Khan. B. Shone, Byeong, G. Ko, J.K. Lee, H.S. Lee, J.Y. Park, Area-Selective Atomic Layer Deposition Using Si Precursors as Inhibitors, Chem. Mat., 30, 21 (2018) 7603-7610. https://doi.org/10.1021/acs.chemmater.8b02774
-
J.B. Ko, H.I. Yeom, S.H. Park, Plasma-Enhanced Atomic Layer Deposition Processed
$SiO_2$ Gate Insulating Layer for High Mobility Top-Gate Structured Oxide Thin-Film Transistors, IEEE, 37 (2016) 39-42. - Y.S. Lee, J.H. Han, J.S. Park, Joz. Park, Low temperature SiOx thin film deposited by plasma enhanced atomic layer deposition for thin film encapsulation applications, American. Vac. Soc., 35 (2017) 1116.
-
R. Sawyer, H.W. Nesbitt, R.A. Secco, High resolution X-ray Photoelectron Spectroscopy (XPS) study of
$K_2O-SiO_2$ glasses: Evidence for three types of O and at least two types of Si, J. Non-Cry. Sol, 358 (2012) 290-302. https://doi.org/10.1016/j.jnoncrysol.2011.09.027 -
David S. Jensen, Supriya S. Kanyal, Nitesh Madaan, Silicon (100)/
$SiO_2$ by XPS. Surface Sci. Spec. 20, 36 (2013) 26-31. -
D.T. Or, J. Collins, M. Chang, Directional
$SiO_2$ etch using plasma pre-treatment and hightemperature etchant deposition, Appl. Mat. Inc., 14/466 (2016) 808-815. -
J.H. Kim, E.Y. Oh, B.C. Ahn, D.G. Kim, Performance improvement of amorphous silicon thin-film transistors with
$SiO_2$ gate insulator by$N_2$ plasma treatment. Appl. Phys. Lett., 64 (1994) 775-780. https://doi.org/10.1063/1.111009 -
T.K. Nam, H.H. Lee, T.J. Choi, S.G. Seo, C.M. Yoon, Low-temperature, high-growth-rate ALD of
$SiO_2$ using aminodisilane precursor, Appl. Sur. Sci., 485, 15 (2019) 381-390. https://doi.org/10.1016/j.apsusc.2019.03.227 - F Koehler, D H Triyoso, I Hussain, S Mutas, H Bernhardt, Atomic Layer Deposition of SiN for spacer applications in high-end logic devices, Mat. Sci. and Eng., 41 (2012) 53-56.
-
T. Tanimura, C. Hsiao, K. Akiyama, Y. Hirota, J. Sato, T. Kaitsuka, Effect of Plasma Process for
$SiO_2$ Film on Sidewall, IEEE, 28, 3 (2015) 278-282. -
HY Yu, XC He, LQ Liu, JS Gu, XW Wei, Surface modification of polypropylene microporous membrane to improve its antifouling characteristics in an SMBR:
$N_2$ plasma treatment, Water research, 41, 20 (2007) 4703-4709. https://doi.org/10.1016/j.watres.2007.06.039 - Yao JK, Chen SM, Sun XW, Kwok HS, He plasma treatment of transparent conductive ZnO thin films, Appl. Sur. Sci., 355 (2015) 702-705. https://doi.org/10.1016/j.apsusc.2015.07.165
- M. A. Lieberman, A. J. Lichtenberg, Principles of Discharges and Materials Processing, Wiley, New York, 1994, 307.
- W. Sinya, D.K. Domomi, Method of forming silicon nitride thin film, KR, 10-2019-0129024.
- Longjuan, Z. Yinfang, Y. Jinling, L. Yan, Z. Wei, X. Jing, L. Yunfei, Y, Fuhua, Dependence of wet etch rate on deposition, annealing conditions and etchants for PECVD silicon nitride film, J. Semiconductors, 30, 9 (2009) 217-301.
- Ro. Huszank, La. Csedreki, Zso. fia Kerte, Zso. fia., Determination of the density of silicon-nitride thin films by ion-beam analytical techniques (RBS, PIXE, STIM), J Radioanal Nucl Chem., 21 (2015) 118-123.
-
T. Tatsumi, S. Fukuda, S. Kadomura, Etch Rate Acceleration of
$SiO_2$ during Wet Treatment after Gate Etching. Jap. J. Appl. Phys, 32, 12 (1993) 335-339. https://doi.org/10.1143/JJAP.32.L335 -
Tien-Chun Yang and Krishna C. Saraswat, Effect of Physical Stress on the Degradation of Thin
$SiO_2$ Films Under Electrical Stress. IEEE, 47, 4 (2000) 428.