References
- H. W. Ahn, J. H. Oh, S. G. Kweon and S. D. Choi, J. Korean Soc. Manuf. Process. Eng., 13, 145 (2014). https://doi.org/10.14775/ksmpe.2014.13.6.145
- S. H. Lee, H. E. Song, G. H Kang, H. K. Ahn and D. Y. Han, Korean Inst. Electr. Eng., 62, 76 (2013)(in Korean).
- K. S. Kim, G. H. Kang and G. J. Yu. J(in Korean), Kor. Sol. Energ. Soc., 28, 5 (2008).
- D. Y. Kong, D. H. Kim, S. H. Yun, Y. H. Bae, I. S. Yu, C. S. Cho and J. H. Lee (in Korean), J. Korean Vacuum Soc., 20, 233 (2011). https://doi.org/10.5757/JKVS.2011.20.3.233
- Shatter proof film process, korvan Home Page, retrieved November, 2007 from korvanchem.kr/bbs.
- K. Nakata, M. Sakai, T. Ochiai, T. Murakami, K. Takagi and A. Fujishima, Langmuir, 27, 3275 (2011). https://doi.org/10.1021/la200438p
- H. R. Lee, D. J. Kim and K. H. Lee, Surf. Coat. Technol., 142, 468 (2001). https://doi.org/10.1016/S0257-8972(01)01137-9
- D. S. Hecht, D. Thomas, L. Hu, C. Ladous, T. Lam, Y. B. Park, G. Irvin and P. Drzaic, J. Soc. Information Display, 17, 941(2009). https://doi.org/10.1889/JSID17.11.941
- N. Yamaguchi, K. Tadanaga, A. Matsuda, T. Minami and M. Tatsumisago, Surf. Coat. Technol., 201, 3653 (2006). https://doi.org/10.1016/j.surfcoat.2006.08.122
- B. G. Kum, Y. C. Park, Y. J. Chang, J. Y. Jeon and H. M. Jang, Thin Solid Films, 519, 3778 (2011). https://doi.org/10.1016/j.tsf.2010.12.163
- B. Louis, N. Krins, M. Faustini and D. Grosso, J. Phys. Chem. C, 115, 3115 (2011). https://doi.org/10.1021/jp109653p
- W. Qiu, Y. M. Kang and L. L. Goddard, Appl. Phys. Lett., 96, 141116 (2010). https://doi.org/10.1063/1.3380825
- H. A. Macleod, Thin-film Optical Filters, 2nd ed (Macmillan, NY, USA, 1986), from http//www.thinfilmcenter.co/book.php
- J. Dai, W. Gao, B. Liu, X. Cao, T. Z. Xie, H. Zhao, D. Chen, H. Ping and R. Zhang, Appl. Surf. Sci., 364, 886 (2016). https://doi.org/10.1016/j.apsusc.2015.12.222
- A. Ulvestad, H. F. Andersen, J. P. Mæhlen, O. Prytz and M. Kirkengen, Sci. Rep., 7, 13315 (2017). https://doi.org/10.1038/s41598-017-13699-0
- D. Dergez, M. Schneider, A. Bittner and U. Schmid, Thin Solid Films, 589, 227 (2015). https://doi.org/10.1016/j.tsf.2015.05.028
- J. C. Barbour, H. J. Stein, O. A. Popov, M. Yonder and C. A. Outten, J. Vac. Sci. Technol., A, 9, 480 (1991). https://doi.org/10.1116/1.577392
- I. Kobayashi, T. Ogawa and S. Hotta, Jpn. J. Appl. Phys., 31, 336 (1992). https://doi.org/10.1143/JJAP.31.336
- J. H. Kim. Thesis (in Korean), Inha University, Korea (2014).
- G. Cheng, J. Qian, Z. Tang and G. Ding, Ceram. Int., 41, 1879 (2015). https://doi.org/10.1016/j.ceramint.2014.09.013
- M. Villa, D. Caceres and C. Prieto, J. Appl. Phys., 94, 12 (2003).
- L. Diegues, D. Caballero, J. Calder, M. Moreno, E. Martnez and J. Samitier, Biosensors, 2, 114 (2012). https://doi.org/10.3390/bios2020114
- X. Sun, H. T. Liu and H. F. Cheng, RSC Advances, 7, 47833 (2017). https://doi.org/10.1039/C7RA09056K
- Y. Hirohata, N. Shimamoto, T. Hino, T. Yamashima and K. Yabe, Thin Slid Films, 253, 425 (1999).
- Z. Gan, C. Wang and Z. Chen, J. Surface, 1, 59 (2018).