Journal of the Korea Society of Computer and Information (한국컴퓨터정보학회논문지)

Korean Society of Computer Information (한국컴퓨터정보학회)
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An Aging Measurement Scheme for Flash Memory Using LDPC Decoding Information

  • Kang, Taegeun (Dept. of Computer Engineering, Hanbat National University) ;
  • Yi, Hyunbean (Dept. of Computer Engineering, Hanbat National University)
  • Received : 2019.11.11
  • Accepted : 2020.01.14
  • Published : 2020.01.31
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Abstract

Wear-leveling techniques and Error Correction Codes (ECCs) are essential for the improvement of the reliability and durability of flash memories. Low-Density Parity-Check (LDPC) codes have higher error correction capabilities than conventional ECCs and have been applied to various flash memory-based storage devices. Conventional wear-leveling schemes using only the number of Program/Erase (P/E) cycles are not enough to reflect the actual aging differences of flash memory components. This paper introduces an actual aging measurement scheme for flash memory wear-leveling using LDPC decoding information. Our analysis, using error-rates obtained from an flash memory module, shows that LDPC decoding information can represent the aging degree of each block. We also show the effectiveness of the wear-leveling based on the proposed scheme through wear-leveling simulation experiments.

웨어-레벨링과 오류정정코드는 플래시 메모리의 신뢰성과 내구성을 위한 필수적인 기술이다. 플래시 메모리를 구성하는 요소들은 사용횟수에 따른 노화도가 서로 다를 수 있다. 따라서 기존의 쓰기/지우기 횟수를 바탕으로 하는 웨어-레벨링 기술은 요소들의 실제 노화도 차이를 반영하기에 충분하지 않다. 본 논문에서는 높은 오류정정율이 증명된 Low-Dencity Parity-Check (LDPC) 코드를 적용하고 복호 과정에서 나오는 정보를 이용하여 플래시 메모리의 실제 노화도를 측정하는 방법을 소개한다. 실험에서는 실제 플래시 메모리를 대상으로 측정한 오류율 데이터를 기반으로 LDPC 코드 복호 정보가 플래시 메모리 각 블록의 노화도를 나타낼 수 있음을 보인다. 또한, 웨어-레벨링 시뮬레이션을 통하여 제안하는 노화도 측정 방법 기반의 웨어-레벨링의 효과를 입증한다.

Keywords

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