Journal of radiological science and technology (대한방사선기술학회지:방사선기술과학)

Korean Society of Radiological Science (대한방사선과학회)
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A Study on Retrospective of External Radiation Exposure Dose by Optically Stimulated Luminescence of Smart Chip Card

스마트칩 카드을 이용한 광 자극 발광 특성 연구

  • Park, Sang-Won (Department of Radiology, Chuncheon Sacred Heart Hospital, Hallym University Medical Center) ;
  • Yoo, Se-Jong (Department of Radiological Technology, Daejeon Health Institute of Technology)
  • 박상원 (한림대학교 의료원 춘천성심병원 영상의학과) ;
  • 유세종 (대전보건대학교 방사선과)
  • Received : 2019.10.10
  • Accepted : 2019.10.24
  • Published : 2019.10.31
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Abstract

Radiation is used for various purposes such as cancer therapy, research of industrial and drugs. However, in case of radiation accidents such as terrorism, collapsing nuclear plant by natural disasters like Fukushima in 2011, very high radiation does expose to human and could lead to death. For this reason, many people are concerning about radiation exposures. Therefore, assessment and research of retrospective radiation dose to human by various path is an necessary task to be continuously developed. Radiation exposure for workers in radiation fields can be generally measured using a personal exposure dosimeter such as TLD, OSLD. However, general people can't be measured radiation doses when they are exposed to radiation. And even if radiation fields workers, when they do not in possession personal dosimeter, they also can't be measured exposure dose immediately. In this study, we conduct retrospective research on reconstruction of dose after exposure by using smart chip card of personal items through Optically Stimulated Luminescence (OSL). The OSL signal of smart chip card shows linear response from 0.06 Gy to 15 Gy and results of fading rate 45 %, 48% for 24 and 48 hours due to the natural emission of radiation in sample, respectively. The minimum detectable limit (MDD) was 0.38 mGy. This values are expected to use as correction values for reconstruction of exposure dose.

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References

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