References
- P. O. Anikeeva, J. E. Halpert, M. G. Bawendi, and V. Bulovic, Nano Lett., 9, 2532 (2009). [DOI: https://doi.org/10.1021/nl9002969]
- X. Yang, D. Zhao, K. S. Leck, S. T. Tan, Y. X. Tang, J. Zhao, H. V. Demir, and X. W. Sun, Adv. Mater., 24, 4180 (2012). [DOI: https://doi.org/10.1002/adma.201104990]
- W. K. Bae, J. Kwak, J. Lim, D. Lee, M. K. Nam, K. Char, C. Lee, and S. Lee, Nano Lett., 10, 2368 (2010). [DOI: https://doi.org/10.1021/nl100168s]
- L. Qian, Y. Zheng, J. Xue, and P. H. Holloway, Nat. Photonics, 5, 543 (2011). [DOI: https://doi.org/10.1038/nphoton.2011.171]
- Z. Zhong, J. Zou, C. Jiang, L. Lan, C. Song, Z. He, L. Mu, L. Wang, J. Wang, J. Peng, and Y. Cao, Org. Electron., 58, 245 (2018). [DOI: https://doi.org/10.1016/j.orgel.2018.04.014]
- J. S. Steckel, P. Snee, S. Coe-Sullivan, J. P. Zimmer, J. E. Halpert, P. Anikeeva, L. A. Kim, V. Bulovic, and M. G. Bawendi, Angew. Chem., 45, 5796 (2006). [DOI: https://doi.org/10.1002/anie.200600317]
- V. Wood and V. Bulovic, Nano Rev., 1, 5202 (2010). [DOI:https://doi.org/10.3402/nano.v1i0.5202]
- Y. Shirasaki, G. J. Supran, M. G. Bawendi, and V. Bulovic, Nat. Photonics, 7, 13 (2012). [DOI: https://doi.org/10.1038/nphoton.2012.328]
- V. Wood, M. J. Panzer, J. E. Halpert, J. M. Caruge, M. G. Bawendi, and V. Bulovic, ACS Nano, 3, 3581 (2009). [DOI:https://doi.org/10.1021/nn901074r]
- J. M. Caruge, J. E. Halpert, V. Bulovic, and M. G. Bawendi, Nano Lett., 6, 2991 (2006). [DOI: https://doi.org/10.1021/nl0623208]
- R. Vasan, H. Salman, and O. Manasreh, IEEE Electron Device Lett., 39, 536 (2018). [DOI: https://doi.org/10.1109/LED.2018.2808679]
- Y. Yang, Y. Zheng, W. Cao, A. Titov, J. Hyvonen, J. R. Manders, J. Xue, P. H. Holloway, and L. Qian, Nat. Photonics, 9, 259 (2015). [DOI: https://doi.org/10.1038/nphoton.2015.36]
- C. Jiang, H. Liu, B. Liu, Z. Zhong, J. Zou, J. Wang, L. Wang, J. Peng, and Y. Cao, Org. Electron., 31, 82 (2016). [DOI:https://doi.org/10.1016/j.orgel.2016.01.009]
- H. Zhang, H. Li, X. Sun, and S. Chen, ACS Appl. Mater. Interfaces, 8, 5493 (2016). [DOI: https://doi.org/10.1021/acsami.5b12737]
- X. Zhang, H. Dai, J. Zhao, S. Wang, and X. Sun, Thin Solid Films, 603, 187 (2016). [DOI: https://doi.org/10.1016/j.tsf.2016.02.017]
- J. M. Caruge, J. E. Halpert, V. Wood, V. Bulovic, and M. G. Bawendi, Nat. Photonics, 2, 247 (2008). [DOI: https://doi.org/10.1038/nphoton.2008.34]
- A. Castan, H. M. Kim, and J. Jiang, ACS Appl. Mater. Interfaces, 6, 2508 (2014). [DOI: https://doi.org/10.1021/am404876p]
- J. H. Yu, S. B. Heo, M. Kim, Y. Yi, and S. J. Kang, Thin Solid Films, 687, 137444 (2019). [DOI: https://doi.org/10.1016/j.tsf.2019.137444]
- X. L Zhang, H. T. Dai, J. L. Zhao, C. Li, S. G. Wang, and X. W. Sun, Thin Solid Films, 567, 72 (2014). [DOI: https://doi.org/10.1016/j.tsf.2014.07.030]
- A. Balati, A. Bazilio, A. Shahriar, K. Nash, and H. J. Shipley, Mater. Sci. Semicond. Process., 99, 68 (2019). [DOI:https://doi.org/10.1016/j.mssp.2019.04.017]
- G. R. Yi, H. S. Kim, K. W. Jeong, and C. K. Kim, Mol. Cryst. Liq. Cryst., 651, 99 (2017). [DOI: https://doi.org/10.1080/09273948.2017.1338904]
- G. Klarner, J. I. Lee, V. Y. Lee, E. Chan, J. P. Chen, A. Nelson, D. Markiewicz, R. Siemens, J. C. Scott, and R. D. Miller, Chem. Mater., 11, 1800 (1999). [DOI: https://doi.org/10.1021/cm990027l]
- K. W. Jeong, H. S. Kim, G. R. Yi, and C. K. Kim, Mol. Cryst. Liq. Cryst., 663, 61 (2018). [DOI: https://doi.org/10.1080/15421406.2018.1468099]
- M. C. Schlamp, X. Peng, and A. P. Alivisatos, J. Appl. Phys., 82, 5837 (1997). [DOI: https://doi.org/10.1063/1.366452]