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Optical Phase Properties of Small Numbers of Nanoslits and an Application for Higher-efficiency Fresnel Zone Plates

  • Kim, Hyuntai (Department of Electronic & Electrical Convergence Engineering, Hongik University) ;
  • Lee, Seung-Yeol (School of Electronics Engineering, Kyungpook National University)
  • Received : 2019.04.10
  • Accepted : 2019.06.14
  • Published : 2019.08.25

Abstract

We have studied the behavior of light in the intermediate regime between a single nanoslit and an infinite nanoslit array. We first calculated the optical characteristics of a small number of nanoslits using finite element numerical analysis. The phase variance of the proposed nanoslit model shows a gradual phase shift between a single nanoslit and ideal nanoslit array, which stabilizes before the total array length becomes ${\sim}0.5{\lambda}$. Next, we designed a transmission-enhanced Fresnel zone plate by applying the phase characteristics from the small-number nanoslit model. The virtual-point-source method suggests that the proposed Fresnel zone plate with phase-invariant nanoslits achieves 2.34x higher transmission efficiency than a conventional Fresnel zone plate. Our report describes the intermediate behaviors of a nanoslit array, which could also benefit subwavelength metallic structure research of metasurfaces.

Keywords

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FIG. 1. (a) Schematic of a single nanoslit, the intermediate zone, and an infinite nanoslit array. (b) Parameter descriptions and simulation conditions of the nanoslit array.

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FIG. 2. Optical phase shift vs. number of slits when (a) varying duty cycle and (b) varying thickness. The phase-invariant conditions are marked by thick black lines.

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FIG. 3. Phase shift vs. number of slits for various slit widths at duty cycles of (a) 0.7 and (b) 0.3. Phase shift vs. period and total array length at duty cycles of (c) 0.7 and (d) 0.3. The phase-invariant conditions are marked by a thick black line in Fig. 3(b) and a dashed red line in Fig. 3(d).

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FIG. 4. Plate design mechanism of the TE-MFZP based on virtual point source.

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FIG. 5. Field intensity of (a) the conventional MFZP and (b) the TE-MFZP. Cross-sections of the field intensity (c) perpendicular and (d) parallel to the propagation axis for an x-polarized input beam.

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