한국전기전자재료학회논문지 (Journal of the Korean Institute of Electrical and Electronic Material Engineers)

  • 제32권3호
  • /
  • Pages.234-240
  • /
  • 2019
  • /
  • 1226-7945(pISSN)
  • /
  • 2288-3258(eISSN)
한국전기전자재료학회 (The Korean Institute of Electrical and Electronic Material Engineers)
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릴레이 접점의 자기적 아크 저감 분석

Analysis of Magnetic Arc Reduction of Relay Contacts

  • Choi, Sun-Ho (Department of Electricity and Energy, Gumi University) ;
  • Huh, Chang-Su (Department of Electrical Engineering, Inha University)
  • 투고 : 2019.01.31
  • 심사 : 2019.02.12
  • 발행 : 2019.05.01
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초록

In this work, the magnetic arc reduction phenomena encountered in AC relay contacts were analyzed. To this end, arc duration, instantaneous voltage, and current changes due to changes in the magnetic field were observed. The arc generated at the contact point was affected by the magnitude of the applied magnetic field; the voltage and current waveforms rapidly intersected, resulting in a decrease in arc duration and arc energy. Furthermore, the orientation of the N pole of the magnetic field was found to play a role in the effectiveness of potential arc prevention.

키워드

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Fig. 1. Magnetic arc reduction method.

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Fig. 2. Example of contact make and break arc waveform.

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Fig. 3. Flux density of single and double set-up.

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Fig. 4. Relay contact and magnet dimension.

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Fig. 5. Relay contact and magnet set-up.

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Fig. 6. Arc waveform measurement of contact.

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Fig. 7. Waveform of break condition at AC 220/5 A (a) without

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Fig. 9. Arc duration according to magnet distance.

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Fig. 10. Arc energy of break condition during magnet (a) 110 V/5 A, (b) 110 V/10 A, (c) 220 V/5 A, and (d) 220 V/10 A.

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Fig. 11. Arc energy according to magnet distance.

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Fig. 8. Arc duration time of break condition during magnet (a) 110 V/5 A, (b) 110 V/10 A, (c) 220 V/5 A, and (d) 220 V/10 A.

Table 1. Test conditions.

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Table 2. Arc duration according to test content.

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Table 3. Arc energy according to test contents.

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참고문헌

  1. Y. Kayano and H. Inoue, Proc. 27th International Conference on Electrical Contacts (Akita University, Akita, 2014) p. 635.
  2. S. H. Choi, K. S. Kim, J. M. Ryu, and C. S. Huh, J. Korean Inst. Electr. Electron. Mater. Eng., 28, 115 (2015). [DOI: https://doi.org/10.4313/JKEM.2015.28.2.115]
  3. A. Vassa, E. Carvou, S. Rivoirard, L. Doublet, C. Bourda, D. Jeannot, P. Ramoni, N. Ben Jemaa, and D. Givord, Proc. 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (IEEE, Charleston, 2010) p. 1.
  4. J. Sekikawa and T. Kubono, Proc. 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts (IEEE, Orlando, 2008) p. 21.
  5. J. Sekikawa, N. Ban, and T. Kubono, Proc. 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (IEEE, Charleston, 2010) p. 1.
  6. K. Yoshida, K. Sawa, K. Suzuki, M. Watanabe, and H. Daijima, Proc. 2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) (IEEE, Minneapolis, 2011) p. 1.