참고문헌
- T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. One, Y. Maekawa, K. Kawabe and M. Kohno, SID 38, 84 (2007). https://doi.org/10.1889/1.2785232
- A. Nathan, G. R. Chaji and S. J. Ashtiani, J. Dis. Technol. 1, 267 (2005). https://doi.org/10.1109/JDT.2005.858913
- C. L. Lin, IEEE Electron Dev. Lett. 28, 129 (2007). https://doi.org/10.1109/LED.2006.889523
- J. H. Lee, W. J. Nam, B. K. Kim, H. S, Choi, Y. M. Ha and M. M. Han, IEEE Electron Dev. Lett. 27, 830 (2006). https://doi.org/10.1109/LED.2006.883056
- J. J. Lih, C. F. Sung, C. H. Li, T. H. Hsiao and H. H. Lee, SID 12, 367 (2004).
- S. K. Hong, B. K. Kim and Y. M. Ha, SID 38, 1366 (2007). https://doi.org/10.1889/1.2785567
- S. H. Jung, H. K. Lee, C. Y. Kim, S. Y. Yoon, C. D. Kim and I. B. Kang, SID 39, 101 (2008). https://doi.org/10.1889/1.3069305
- M. K. Hatalis and D. W. Greeve, J. Appl. Phys. 63, 2260 (1988). https://doi.org/10.1063/1.341065
- M. W. Ma, T. Y, Chiang, T. S. Chao and T. F. Lei, Semicond. Sci. Technol. 24, 072001 (2009). https://doi.org/10.1088/0268-1242/24/7/072001
- S-W. Lee and S-K. Joo, IEEE Electron Dev. Lett. 17, 4, (1996). https://doi.org/10.1109/55.475559
- M. A. Crowder, P. G. Carey, P. M. Smith, R. S. Sposili, H. S. Cho and J. S. Im, IEEE Electron Dev. Lett. 19, 8 (1998).
- A. T. Voutsas, A. M. Marmorstein and R. Solanki, J. Electrochem. Soc. 146, 3500 (1999). https://doi.org/10.1149/1.1392504
- M. Yazakis, S. Takenaka and H. Ohshima, Jpn. J. Appl. Phys. 31, 206 (1992). https://doi.org/10.1143/JJAP.31.206
- K. C. Moon, J-H. Lee and M-K. Han, IEEE Trans. Electrons Dev. 52, 512 (2005). https://doi.org/10.1109/TED.2005.844740
- C. Chen, K. Abe, H. Kumoni and J. Kanicki, IEEE Trans. Electrons Dev. 56, 1177 (2009). https://doi.org/10.1109/TED.2009.2019157
- R. Martel, Ph. Avouris and I-W. Lyo, Science 272, 385 (1996). https://doi.org/10.1126/science.272.5260.385
- A. Feltz, U. Memmert and R. J. Behm, Chem. Phys. Lett. 192, 271 (1992). https://doi.org/10.1016/0009-2614(92)85464-L
- B. Mereu, C. Rossel, E. P. Gusev and M. Yang, J. Appl. Phys. 100, 014504 (2006). https://doi.org/10.1063/1.2210627
- L. Chang, M. Ieong and M. Yang, IEEE Trans. Electron Dev. 51, 1621 (2004). https://doi.org/10.1109/TED.2004.834912