전력전자 시스템의 신뢰성 취약 소자와 신뢰성 평가 방법

  • 최의민 (서울과학기술대학교 전자IT미디어공학과)
  • Published : 2018.06.20

Abstract

Keywords

References

  1. L. M. Moore and H. N. Post, "Five years of operating experience at a large, utilityscale photovoltaic generating plant," Progress Photovoltaic: Research and Application, Vol. 16, No. 3, pp. 249-259, 2008. https://doi.org/10.1002/pip.800
  2. H. Wang, M. Liserre, and F. Blaabjerg, “Toward reliable power electronics: challenges, design tools, and opportunities,” IEEE Industrial Electronics Magazine, Vol. 7, No. 2, pp. 17-26, Jun. 2013. https://doi.org/10.1109/MIE.2013.2252958
  3. H. Wang, M. Liserre, F. Blaabjerg, P. de Place Rimmen, J. B. Jacobsen, T. Kvisgaard, and J. Landkildehus, “Transitioning to physicsof- failure as a reliability driver in power electronics,” IEEE Journal of Emerging and Selected Topics in Power Electronics, Vol. 2, No. 1, pp. 97-114, Mar. 2014. https://doi.org/10.1109/JESTPE.2013.2290282
  4. S. Yang, A. Bryant, P. Mawby, D. Xiang, L. Ran, and P. Tavner, “An industry-based survey of reliability in power electronic converters,” IEEE Transactions on Industry Applications, Vol. 47, No. 3, pp. 1441-1451, May/Jun. 2011. https://doi.org/10.1109/TIA.2011.2124436
  5. M. Ciappa, “Selected failure mechanism of modern power modules,” Microelectronics Reliability, Vol. 42, No. 4-5, pp. 653-667, Apr.-May 2002. https://doi.org/10.1016/S0026-2714(02)00042-2
  6. U. M. Choi, F. Blaabjerg, and S. Jorgensen, "Power cycling test methods for reliability assessment of power device modules in respect to temperature stress," IEEE Transactions on Power Electronics, Vol. 33, No. 3, pp. 2531- 2551, Mar. 2018. https://doi.org/10.1109/TPEL.2017.2690500
  7. U. M. Choi, S. Jorgensen, and F. Blaabjerg, "Advanced accelerated power cycling test for reliability investigation of power device modules," IEEE Transactions on Power Electronics, Vol. 31, No. 12, pp. 8371-8386, Dec. 2016. https://doi.org/10.1109/TPEL.2016.2521899
  8. U. M. Choi, F. Blaabjerg, S. Jorgensen, S. Munk-Nielsen, and B. Rannestad, "Reliability improvement of power converters by means of condition monitoring of IGBT modules," IEEE Transactions on Power Electronics, Vol. 32, No. 10, pp. 7990-7997, Oct. 2017. https://doi.org/10.1109/TPEL.2016.2633578
  9. U. M. Choi and F. Blaabjerg, “Separation of wear-out failure modes of IGBT modules in grid-connected inverter systems,” IEEE Transactions on Power Electronics, Vol. 33, No. 7, pp. 6217-6223, Jul. 2018. https://doi.org/10.1109/TPEL.2017.2750328