References
- L. M. Moore and H. N. Post, "Five years of operating experience at a large, utilityscale photovoltaic generating plant," Progress Photovoltaic: Research and Application, Vol. 16, No. 3, pp. 249-259, 2008. https://doi.org/10.1002/pip.800
- H. Wang, M. Liserre, and F. Blaabjerg, “Toward reliable power electronics: challenges, design tools, and opportunities,” IEEE Industrial Electronics Magazine, Vol. 7, No. 2, pp. 17-26, Jun. 2013. https://doi.org/10.1109/MIE.2013.2252958
- H. Wang, M. Liserre, F. Blaabjerg, P. de Place Rimmen, J. B. Jacobsen, T. Kvisgaard, and J. Landkildehus, “Transitioning to physicsof- failure as a reliability driver in power electronics,” IEEE Journal of Emerging and Selected Topics in Power Electronics, Vol. 2, No. 1, pp. 97-114, Mar. 2014. https://doi.org/10.1109/JESTPE.2013.2290282
- S. Yang, A. Bryant, P. Mawby, D. Xiang, L. Ran, and P. Tavner, “An industry-based survey of reliability in power electronic converters,” IEEE Transactions on Industry Applications, Vol. 47, No. 3, pp. 1441-1451, May/Jun. 2011. https://doi.org/10.1109/TIA.2011.2124436
- M. Ciappa, “Selected failure mechanism of modern power modules,” Microelectronics Reliability, Vol. 42, No. 4-5, pp. 653-667, Apr.-May 2002. https://doi.org/10.1016/S0026-2714(02)00042-2
- U. M. Choi, F. Blaabjerg, and S. Jorgensen, "Power cycling test methods for reliability assessment of power device modules in respect to temperature stress," IEEE Transactions on Power Electronics, Vol. 33, No. 3, pp. 2531- 2551, Mar. 2018. https://doi.org/10.1109/TPEL.2017.2690500
- U. M. Choi, S. Jorgensen, and F. Blaabjerg, "Advanced accelerated power cycling test for reliability investigation of power device modules," IEEE Transactions on Power Electronics, Vol. 31, No. 12, pp. 8371-8386, Dec. 2016. https://doi.org/10.1109/TPEL.2016.2521899
- U. M. Choi, F. Blaabjerg, S. Jorgensen, S. Munk-Nielsen, and B. Rannestad, "Reliability improvement of power converters by means of condition monitoring of IGBT modules," IEEE Transactions on Power Electronics, Vol. 32, No. 10, pp. 7990-7997, Oct. 2017. https://doi.org/10.1109/TPEL.2016.2633578
- U. M. Choi and F. Blaabjerg, “Separation of wear-out failure modes of IGBT modules in grid-connected inverter systems,” IEEE Transactions on Power Electronics, Vol. 33, No. 7, pp. 6217-6223, Jul. 2018. https://doi.org/10.1109/TPEL.2017.2750328