결정질 실리콘 태양광 모듈의 Potential Induced Degradation 진단 분석

  • 오원욱 (전자부품연구원 융복합전자소재연구센터) ;
  • 박노창 (전자부품연구원 융복합전자소재연구센터) ;
  • 천성일 (전자부품연구원 융복합전자소재연구센터)
  • Published : 2018.08.31

Abstract

The potential induced degradation (PID) phenomenon of crystalline silicon photovoltaic (PV) modules has been often found in outdoor PV systems until recently since firstly reported in 2010. Many studies have been conducted about the mechanism and the preventive methods, but systematic diagnosis of the PID has not been applied on-site. This paper focuses on analysis of 5 categories and 10 PID diagnosis methods using the monitoring data, light current-voltage, dark current-voltage, infrared and electroluminescence. We expect to contribute to improvement of power generation through PID diagnosis and troubleshooting in PV plants.

Keywords

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