한국컴퓨터정보학회논문지 (Journal of the Korea Society of Computer and Information)

  • 제23권8호
  • /
  • Pages.1-7
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  • 2018
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  • 1598-849X(pISSN)
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  • 2383-9945(eISSN)
한국컴퓨터정보학회 (Korean Society of Computer Information)
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Circuit card inspection method through digital circuit design based AITS

  • 투고 : 2018.04.13
  • 심사 : 2018.08.10
  • 발행 : 2018.08.31
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초록

Previous test equipment was bulky, took a long time to check, and was somewhat less economical. Since most of the checks were about analog signals, we preferred to check them using reference equipments. In this paper, a digital circuit design based on AITS is used to implement signals that can not utilize commercial measurement resources, and also designed and manufactured equipment that can inspect SRU. These test equipments were tested and evaluated by development, operation, and field evaluation, and they were installed to the Korean Field Force. This contributed to the improvement of operability by shortening the inspection time from 83.2 minutes to 7.8 minutes on average In addition, it did not utilize the reference equipment, so it could play a big role in lowering the mass production cost.

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참고문헌

  1. W. K. Kim, "Design and Implementation of the multi-function switching system for Automatic Test Equipment(ATE)," Journal of the Graduate School of Industry Kumoh National Institute of Technology, Dec. 2012.
  2. Y. H. Yoon, K. U. Ku, J. J. Keum, U. H. Hwang, and S. Woo, "The Study on Improvement of ATE Reliability in Production Phase," The Institute of Electronics Engineers of Korea - System and Control, Vol. 47, No. 6, pp. 19-26, 2010.
  3. K. J. Choi, "The Study on The Production Testing Equipment for the Improvement of System Test Reliability in FCS," Journal of the Institute of Electronics and Information Engineers, Vol. 53, No. 11, pp. 139-147, 2016. https://doi.org/10.5573/IEIE.2016.53.11.139
  4. D. J. Kim, "Real-Time System Parallel Testing Techniques for Weapon System Error Verification," Journal of the Institute of Electronics and Information Engineers, Vol. 53, No. 11, pp. 139-147, 2016.
  5. D. I. Kim, K. J. Choi, "Design and Fabrication of Test Equipment for mass production of Automatic Test Equipment(ATE)," Journal of The Korea Society of Computer and Information, Vol. 22, No. 8, pp. 1-7 2017. https://doi.org/10.9708/jksci.2017.22.01.001
  6. Hyeok-Jin Gwon, "Implementation of PXIe platform based portable Automatic Test Equipment to improve reliability", Journal of The Korea Society of Computer and Information, Vol. 22, No. 7, pp. 9-16 2017. https://doi.org/10.9708/jksci.2017.22.01.009
  7. WIKIPEDIA, https://www.wikipedia.org
  8. Volnei A.Pderoni, "Circuit Design with VHDL" Korea-Press, pp.20-21, 1999.