References
- S. Nakamura, M. Senoh and T. Mukai, Jpn. J. Appl. Phys., 30, L1708 (1991). https://doi.org/10.1143/JJAP.30.L1708
- M. A. Khan, A. Bhattarai, J. N. Kuznia and D. T. Oison, Appl. Phys. Lett., 63, 1214 (1993). https://doi.org/10.1063/1.109775
- H. Morkoc, S. Strite, G. B. Gao, M. E. Lin, B. Sverdlov and M. Burns, J. Appl. Phys., 76, 1363 (1994). https://doi.org/10.1063/1.358463
- J. S. Im, H. Kollmer, J. Off, A. Sohmer, F. Scholz and A. Hangleiter, Phys. Rev. B, 57, R9435 (1998). https://doi.org/10.1103/PhysRevB.57.R9435
- R. Langer, J. Simon, V. Ortiz, N. T. Pelekanos, A. Barski, R. Andre and M. Godlewski, Appl. Phys. Lett., 74, 3827 (1999). https://doi.org/10.1063/1.124193
- P. Lefebvre, A. Morel, M. Gallart, T. Taliercio, J. Allegre, B. Gil, H. Mathieu, B. Damilano, N. Grandjean and J. Massies, Appl. Phys. Lett., 78, 1252 (2001). https://doi.org/10.1063/1.1351517
- T. Takeuchi, C. Wetzel, S. Yamaguchi, H. Sakai, H. Amano, I. Akasaki, Y. Kaneko, S. Nakagawa, Y. Yamaoka and N. Yamada, Appl. Phys. Lett., 73, 1691 (1998). https://doi.org/10.1063/1.122247
- F. Bernardini and V. Fiorentini, Phys. Rev. B, 57, R9427 (1998). https://doi.org/10.1103/PhysRevB.57.R9427
- R. Cingolani, A. Botchkarev, H. Tang, H. Morkoc, G. Traetta, G. Coli, M. Lomascolo, A. D. Carlo, F. D. Sala and P. Lugli, Phys. Rev. B, 61, 2711 (2000). https://doi.org/10.1103/PhysRevB.61.2711
- P. Waltereit, O. Brandt, A. Trampert, H. T. Grahn, J. Menniger, M. Ramsteiner, M. Reiche and K. H. Ploog, Nature, 406, 865 (2000). https://doi.org/10.1038/35022529
- Y. J. Sun, O. Brandt, S. Cronenberg, S. Dhar, H. T. Grahn, K. H. Ploog, P. Waltereit and J. S. Speck, Phys. Rev. B, 67, 041306 (2003). https://doi.org/10.1103/PhysRevB.67.041306
- M. D. Craven, S. H. Lim, F. Wu, J. S. Speck and S. P. Denbaars, Appl. Phys. Lett., 81, 469 (2002). https://doi.org/10.1063/1.1493220
- S. Jang, D. Lee, J.-H. Kwon, S.-I. Kim, S. Y. Yim, J. Lee, J. H. Park and D. Byun, Jpn. J. Appl. Phys., 52, 115501 (2012).
- C. Roder, S. Einfeldt, S. Figge, T. Paskova, D. Hommel, P. P. Paskov, B. Monemar, U. Behn, B. A. Haskell, P. T. Fini and S. Nakamura, J. Appl. Phys., 100, 103511 (2006). https://doi.org/10.1063/1.2386940
- B. H. Kang, J. E. Lee, D.-S. Kim, S. Bae, S. Jung, J. Park, J. Jhin and D. Byun, J. Nanosci. Nanotechnol., 16, 11563 (2016). https://doi.org/10.1166/jnn.2016.13552
- C.-M. Lee, B. H. Kang, D.-S. Kim and D. Byun, Korean J. Mater. Res., 24, 645 (2014). https://doi.org/10.3740/MRSK.2014.24.12.645
- S.-I. Kim, B. Kim, S. Jang, A.-Y. Kim, J. Park and D. Byun, J. Cryst. Growth, 326, 200 (2011). https://doi.org/10.1016/j.jcrysgro.2011.01.097
- D.-S. Kim, W. S. Jeong, H. Ko, J.-S. Lee and D. Byun, Thin Solid Films, 641, 2 (2017). https://doi.org/10.1016/j.tsf.2017.06.042
- D.-S. Kim, C.-M. Lee, W. S. Jeong, S. H. Cho, J. Jhin and D. Byun, J. Nanosci. Nanotechnol., 16, 11575 (2016). https://doi.org/10.1166/jnn.2016.13554
- C. H. Chiu, H. H. Yen, C. L. Chao, Z. Y. Li, P. Yu, H. C. Kuo, T. C. Lu, S. C. Wang, K. M. Lau and S. J. Cheng, Appl. Phys. Lett., 93, 081108 (2008). https://doi.org/10.1063/1.2969062
- J. A. Smart, E. M. Chumbes, A. T. Schremer, and J. R. Shealy, Appl. Phys. Lett., 75, 3820 (1999). https://doi.org/10.1063/1.125467
- A. Strittmatter, S. Rodt, L. Reissmann, D. Bimberg, H. Schroder, E. Obermeier, T. Riemann, J. Christen and A. Krost, Appl. Phys. Lett., 78, 727 (2001). https://doi.org/10.1063/1.1347013
- T. Vodenitcharova, L. C. Zhang, I. Zarudi, Y. Yin, H. Domyo, T. Ho and M. Sato, J. Mater. Process. Tech., 194, 52 (2007). https://doi.org/10.1016/j.jmatprotec.2007.03.125
- G. Guzman, M. Herrera, R. Silva, G. C. Vasquez and D. Maestre, Semicond. Sci. Technol., 31, 055006 (2016). https://doi.org/10.1088/0268-1242/31/5/055006
- T. K. Sherwood and R. O. Maak, Ind. Eng. Chem. Fundam., 1, 111, (1962). https://doi.org/10.1021/i160002a008
- F. K. Dijen and J. Pluijmakers, J. Eur. Ceram. Soc., 5, 385 (1989). https://doi.org/10.1016/0955-2219(89)90043-5
- G. C. Lars, S. Felix, A.-P. Frank, P. Vivien, K. Jesper, B. Thomas and N. K. Jens, Angew. Chem., Int. Ed., 50, 4601 (2011). https://doi.org/10.1002/anie.201100353
- F. Cacace and A. P. Wolf, J. Am. Chem. Soc., 87, 5301 (1965). https://doi.org/10.1021/ja00951a007
- S. B. Philip, M. W. Daniel and M. Paul, J. Am. Chem. Soc., 105, 488 (1983). https://doi.org/10.1021/ja00341a031
- K. Uchida, A. Watanabe, F. Yano, M. Kouguchi, T. Tanaka and S. Minagawa, J. Appl. Phys., 79, 3487 (1996). https://doi.org/10.1063/1.361398
- V. Thakur and S. M. Shivaprasad, Appl. Surf. Sci., 327, 389 (2015). https://doi.org/10.1016/j.apsusc.2014.11.082