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Analytical and numerical simulation on charging behavior of no-insulation REBCO pancake coil

  • Quach, Huu Luong (Department of Electrical Engineering, Jeju National University) ;
  • Kim, Ji Hyung (Department of Electrical Engineering, Jeju National University) ;
  • Chae, Yoon Seok (Department of Electrical Engineering, Jeju National University) ;
  • Moon, Jae Hyung (Department of Electrical Engineering, Jeju National University) ;
  • Ko, Jung Hyup (Department of Electrical Engineering, Jeju National University) ;
  • Kim, Hyung-Wook (Korea Electrotechnology Research Institute) ;
  • Kim, Seog-Whan (Korea Electrotechnology Research Institute) ;
  • Jo, Young-Sik (Korea Electrotechnology Research Institute) ;
  • Kim, Ho Min (Department of Electrical Engineering, Jeju National University)
  • Received : 2018.12.04
  • Accepted : 2018.12.30
  • Published : 2018.12.31

Abstract

This paper presents analytical and numerical simulation approaches on charging characteristics of no-insulation (NI) REBCO pancake coil by using the equivalent circuit model to estimate magnetic performance response in the coil. The analytical methods provide closed form or definite solution in the form of complete mathematical expressions but they are hard to solve the complex problems. Numerical methods have become popular with the development of the computing capabilities to solve the problems which are impossible or very hard to solve analytically. First of all, the equivalent circuit model are proposed to develop the simulation code for both analytical and numerical method. The charging test was performed under critical current to obtain magnetic field induced and terminal voltage through the radial as well as spiral current paths within the coil. To verify the validity of both proposed methods, the simulation results were compared and discussed with the experimental results.

Keywords

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Fig. 1. Photograph of NI REBCO pancake coil.

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Fig. 2. Equivalent circuit model of NI coil for analytical method.

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Fig. 3: Normalized Bz versus time during sudden discharge test at 77 K

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Fig. 4. Set of I(t), V(t), and Bz(t) traces for NI coil during charging test at 100 A (~ 0.8 Ic) with ramping rate of 1 A/s: (a) experiment, (b) analytical simulation, and (c) numerical simulation.

TABLE I PARAMETERS OF REBCO CC TAPE AND NI TEST COIL

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