The Transactions of The Korean Institute of Electrical Engineers (전기학회논문지)

The Korean Institute of Electrical Engineers (대한전기학회)
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Wavelet Transform Based Defect Detection for PCB Inspection Machines

PCB 검사기를 위한 웨이블릿 변환 기반의 결함 검출 방법

  • Received : 2017.01.05
  • Accepted : 2017.09.26
  • Published : 2017.10.01
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Abstract

This paper proposes the defect detection method for automatic inspection machines in printed circuit boards (PCBs) manufacturing system. The defects of PCB such as open, short, pin hole and scratch can be detected by comparing the standard image and the target image. The standard image is obtained from CAD file such as ODB++ format, and the target image is obtained by arranging, filtering and binarization of captured PCB image. Since the PCB size is too large and image resolution is too high, the image processing requires a lot of memory and computational time. The wavelet transform is applied to compress the standard and target images, which results in reducing the memory and computational time. To increase the inspection accuracy, we utilize the he HH-domain as well as LL-domain of the transformed images. Experimental results are finally presented to show the performance improvement of the proposed method.

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References

  1. H. Rau, and C. H. Wu, "Automatic optical inspection for detecting defects on printed circuit board inner layers," The International Journal of Advanced Manufacturing Technology, vol. 25, no. 9, pp. 940-946, May 2005. https://doi.org/10.1007/s00170-004-2299-9
  2. B. Kaur, G. Kaur, and A. Kaur, "Detection and classification of printed circuit board defects using image subtraction method," Engineering and Computational Sciences, pp. 1-5, March 2014.
  3. P. C. Chang, L. Y. Chen, and C. Y. Fan, "A case-based evolutionary model for defect classification of printed circuit board images," Journal of Intelligent Manufacturing, vol. 19, no. 2, pp. 203-214, Apr 2008. https://doi.org/10.1007/s10845-008-0074-8
  4. S. H. I. Putera, S. F. Dzafaruddin, and M. Mohamad, "MATLAB based defect detection and classification of printed circuit board," Proc. of Digital Information and Communication Technology and it's Applications, pp. 115-119, May 2012.
  5. Z. Ibrahim, S. Al-Attas, and Z. Aspar, "Model-based PCB inspection technique using wavelet transform," Proc. of the 4th Asian Control Conference, 2002.
  6. H. J. Cho, and T. H. Park, "Wavelet transform based image template matching for automatic component inspection," Int. J. of Advanced Manufacturing Technology, vol. 50, no. 9, pp. 1033-1039, Oct 2010. https://doi.org/10.1007/s00170-010-2567-9
  7. C.V. Serdean, M.K. Ibrahim, A. Moemeni, and M.M. Al-Akaidi, "Wavelet and multiwavelet watermarking," Image Processing, IET, vol. 1, no. 2, pp. 223-230, Jun 2007. https://doi.org/10.1049/iet-ipr:20060214
  8. Z. Kang, C. Yuan, and Q. Yang, "The fabric defect detection technology based on wavelet transform and neural network convergence," Conf. on Information and Automation, pp. 597-601, 2013.
  9. S. G. Kim, Y. J. Lee, J. H. Yoon, H. You, B. G. Lee, and J. J. Lee, "Defect Detection of Flat Panel Display Using Wavelet Transform," Journal of Korean Society for Industrial and Applied Mathematics, vol. 10, no. 1, pp. 47-60, Aug. 2006.
  10. C. H. Yeh, F. C. Wu, W. L. Ji, and C. Y. Huang, "A Wavelet-Based Approach in Detecting Visual Defects on Semiconductor Wafer Dies," IEEE Trans. on Semiconductor Manufacturing, vol. 23, no. 2, pp. 284-292, Mar 2010. https://doi.org/10.1109/TSM.2010.2046108
  11. X. Yang, G. Pang, and N. Yung, "Robust fabric defect detection and classification using multiple adaptive wavelets," Vision, Image and Signal Processing, IEE Proceedings, vol. 152, no. 6, pp. 715-723, Dec 2005. https://doi.org/10.1049/ip-vis:20045131
  12. A. Graps, "An introduction to wavelets," IEEE Trans. of Computational Science & Engineering, vol. 2, no. 2, pp. 50-61, Aug 1995. https://doi.org/10.1109/99.388960
  13. J. S. Cho, H. S. Kang, H. S. Kim, and S. D. Kim, Multimedia Signal Processing Fundamentals and Practice, Scitech Media, 1st Edition, pp. 156-179, 2006.
  14. C. Vonesch, T. Blu, and M. Unser, "Generalized Daubechies Wavelet Families," IEEE Trans. on Signal Processing, vol. 55, no. 9, pp. 4415-4429, Sep 2007. https://doi.org/10.1109/TSP.2007.896255
  15. S. G. Yoon, and T. H. Park, "PCB Defects Inspection using Wavelet Transform", ICROS Annual Conference 2015, Daejeon, korea, pp. 101-104, May 2015.