DOI QR코드

DOI QR Code

Low-Voltage Operating N-type Organic Field-Effect Transistors by Charge Injection Engineering of Polymer Semiconductors and Bi-Layered Gate Dielectrics

N형 고분자 반도체의 전하주입 특성 향상을 통한 저전압 유기전계효과트랜지스터 특성 연구

  • Moon, Ji-Hoon (Department of Graphic Arts Information Engineering, Pukyong National University) ;
  • Baeg, Kang-Jun (Department of Graphic Arts Information Engineering, Pukyong National University)
  • 문지훈 (부경대학교 공과대학 인쇄정보공학과) ;
  • 백강준 (부경대학교 공과대학 인쇄정보공학과)
  • Received : 2017.08.04
  • Accepted : 2017.08.28
  • Published : 2017.10.01

Abstract

Herein, we report the fabrication of low-voltage N-type organic field-effect transistors by using high capacitance fluorinated polymer gate dielectrics such as P(VDF-TrFE), P(VDF-TrFE-CTFE), and P(VDF-TrFE-CFE). Electron-withdrawing functional groups in PVDF-based polymers typically cause the depletion of negative charge carriers and a high contact resistance in N-channel organic semiconductors. Therefore, we incorporated intermediate layers of a low-k polymerto prevent the formation of a direct interface between PVDF-based gate insulators and the semiconducting active layer. Consequently, electron depletion is inhibited, and the high charge resistance between the semiconductor and source/drain electrodes is remarkably improved by the in corporation of solution-processed charge injection layers.

Keywords

References

  1. A. Facchetti, Chem. Mater., 23, 733 (2011). [DOI: http://doi.org/10.1021/cm102419z]
  2. Y. Guo, G. Yu, and Y. Liu, Adv. Mater., 22, 4427 (2010). [DOI: http://doi.org/10.1002/adma.201000740]
  3. G. Gelinck, P. Heremans, K. Nomoto, and T. D. Anthooulos, Adv. Mater., 22, 3778 (2010). [DOI: http://doi.org/10.1002/adma.200903559]
  4. T. Sakanoue and H. Sirringhaus, Nat. Mater., 9, 736 (2010). [DOI: http://doi.org/10.1038/nmat2825]
  5. T. Sekitani, U. Zschieschang, H. Klauk, and T. Someya, Nat. Mater., 9, 1015 (2010). [DOI: http://doi.org/10.1038/nmat2896]
  6. H. Klauk, Chem. Soc. Rev., 39, 2643 (2010). [DOI: http://doi.org/10.1039/b909902f]
  7. A. C. Arias, J. D. MacKenzie, I. McCulloch, J. Rivnay, and A. Salleo, Chem. Rev., 110, 3 (2010). [DOI: http://doi.org/10.1021/cr900150b]
  8. D. Natali and M. Caironi, Adv. Mater., 24, 1357 (2012). [DOI: http://doi.org/10.1002/adma.201104206]
  9. K. J. Baeg, M. Caironi, and Y. Y. Noh, Adv. Mater., 25, 4210 (2013). [DOI: http://doi.org/10.1002/adma.201205361]
  10. K. J. Baeg, D. Khim, S. W. Jung, M. Kang, I. K. You, D. Y. Kim, A. Facchetti, and Y. Y. Noh, Adv. Mater., 24, 5433 (2012). [DOI: http://doi.org/10.1002/adma.201201464]
  11. K. J. Baeg, J. Kim, D. Khim, M. Caironi, D. Y. Kim, I. K. You, J. R. Quinn, A. Facchetti, and Y. Y. Noh, ACS Appl. Mater. Interfaces, 3, 3205 (2011). [DOI: https://dx.doi.org/10.1021/am200705j]
  12. J. Li, D. Liu, Q. Miao, and F. Yan, J. Mater. Chem., 22, 15998 (2012). [DOI: http://doi.org/10.1039/C2JM32177G]
  13. J. H. Kim and J. W. Park, J. Mater. Chem. C, 5, 3097 (2017). [DOI: http://doi.org/10.1039/c7tc00488e]