References
- J. H. Kim, S. K. Sul, and P. N. Enjeti, IEEE Trans. Ind. Appl., 44, 4 (2008). [DOI: http://dx.doi.org/10.1109/TIA.2008.926201]
- O. Lopez, J. Alvarez, J. Doval-Gandoy, F. D. Freijedo, A. Nogueiras, A. Lago, and C. M. Penalver, IEEE Trans. Ind. Electron., 55, 4 (2008). [DOI: http://dx.doi.org/10.1109/TIE. 2008.917159]
- M. F. Kangarlu and E. Babaei, IEEE Trans. Power Electron., 28, 2 (2013). [DOI: http://dx.doi.org/10.1109/TPEL.2012.2203339]
- A. Ajami, M.R.J. Oskuee, M. T. Khosroshahi, and A. Mokhberdoran, IET Power Electron., 7, 3 (2014). [DOI: http://dx.doi.org/10.1049/iet-pel.2013.0261]
- J. Rodriguez, S. Bernet, P. K. Steimer, and I. E. Lizama, IEEE Trans. Ind. Electron., 57, 7 (2010). [DOI: http://dx.doi.org/10.1109/TIE.2009.2032430]
- A. Nabae, I. Takahashi, and H. Akagi, IEEE Trans. Ind. Appl., IA-17, 5 (1981). [DOI: http://dx.doi.org/10.1109/TIA.1981.4503992]
- B. P. McGrath and D. G. Holmes, IEEE Trans. Power Electron., 24, 6 (2009). [DOI: http://dx.doi.org/10.1109/TPEL.2009.2016567]
- M. Khazraei, H. Sepahvand, K. A. Corzine, and M. Ferdowsi, IEEE Trans. Ind. Electron., 59, 2 (2012). [DOI: http://dx.doi.org/10.1109/TIE.2011.2157290]
- Z. Du, L. M. Tolbert, B. Ozpineci, and J. N. Chiasson, IEEE Trans. Power Electron., 24, 1 (2009). [DOI: http://dx.doi.org/10.1109/TPEL.2008.2006678]
- N. Farokhnia, S. H. Fathi, N. Yousefpoor, and M. K. Bakhshizadeh, IET Power Electron., 5, 1 (2012). [DOI: http://dx.doi.org/10.1049/iet-pel.2011.0092]
- M. F. Kangarlu, E. Babaei, and M. Sabahi, IET Power Electron., 6, 6 (2013). [DOI: http://dx.doi.org/10.1049/iet-pel.2012.0563]
- I. Colak, E. Kabalci, and R. Bayindir, Energy Convers. Manage., 52, 2 (2011). [DOI: http://dx.doi.org/10.1016/j.enconman.2010.09.006]
- K. K. Gupta, A. Ranjan, P. Bhatnagar, L. K. Sahu, and S. Jain, IEEE Trans. Power Electron., 31, 135 (2016). [DOI: http://dx.doi.org/10.1109/TPEL.2015.2405012]
- S. Ramkumar, V. Kamaraj, S. Thamizharasan, and S. Jeevananthan, Int. J. Elec. Power, 36, 93 (2012). [DOI: http://dx.doi.org/10.1016/j.ijepes.2011.10.028]
- S. N. Rao, D.V.A. Kumar, and C. S. Babu, Proc. 2013 International Conference on Power, Energy and Control (ICPEC) (IEEE, Sri Rangalatchum Dindigul, India, 2013) p. 693-699. [DOI: http://dx.doi.org/10.1109/ICPEC.2013.6527745]
- E. Babaei, S. Alilu, and S. Laali, IEEE Trans. Ind. Electron., 61, 3932 (2014). [DOI: http://dx.doi.org/10.1109/TIE.2013.2286561]
- A. Mokhberdoran and A. Ajami, IEEE Trans. Power Electron., 29, 6712 (2014). [DOI: http://dx.doi.org/10.1109/TPEL.2014.2302873]
- S. Thamizharasan, J. Baskaran, and S. Ramkumar, J. Electr. Eng. Technol., 10, 1552 (2015). [DOI: http://dx.doi.org/10.5370/JEET.2015.10.4.1552]
- M. Carpita and S. Teconi, Proc. 4th European Conference on Power Electronics and Applications, Centro Congressi di Firenze (Litografia GEDA, Firenze, Italy, 1991) p. 90-94.
- Y. S. Lai and F. S. Shyu, IEE Proceedings - Electric Power Applications, 149, 449 (2002). [DOI: http://dx.doi.org/10.1049/ip-epa:20020480]
- D. C. Ludois, J. K. Reed, and G. Venkataramanan, IEEE Trans. Ind. Electron., 57, 2679 (2010). [DOI: http://dx.doi.org/10.1109/TIE.2009.2030205]
- E. Babaei, S. H. Hosseini, G. B. Gharehpetian, M. T. Haque, and M. Sabahi, Electr. Power Syst. Res., 77, 1073 (2007). [DOI: http://dx.doi.org/10.1016/j.epsr.2006.09.012]