References
- S. Osswald, G. Yushin, V. Mochalin, S. O. Kucheyev and Y. Gogotsi: J. Am. Chem. Soc., 128 (2006) 11635. https://doi.org/10.1021/ja063303n
- A. Niederhofer, P. Nesladek, H. D. Mannling, K. Moto, S. Veprek and M. Jilek: Surf. Coat. Technol., 120-121 (1999) 173. https://doi.org/10.1016/S0257-8972(99)00451-X
- H. Kwon, S. Kim, B. Lee, W. Seo and M. Laparoux: Mater. Sci. Eng. A, 632 (2015) 72. https://doi.org/10.1016/j.msea.2015.02.057
- E. Duffy, D. P. Mitev, S. C. Thickett, A. T. Townsend, B. Paul and P. N. Nesterenkon: Appl. Surf. Sci., 357 (2015) 397. https://doi.org/10.1016/j.apsusc.2015.09.002
- X. Zhang, J. Yin, C. Kang, J. Li, Y. Zhu, W. Li, Q. Huang and Z. Zhu: Toxicol. Lett., 198 (2010) 237. https://doi.org/10.1016/j.toxlet.2010.07.001
- V. V. Danilenko: Phys. Solid State, 46 (2004) 595. https://doi.org/10.1134/1.1711431
- V. Pichot, B. Risse, F. Schnell, J. Mory and D. Spitzer: Sci. Rep., 3 (2013) 02159. https://doi.org/10.1038/srep02159
- A.R. Kirmani, W. Peng, R. Mahfouz, A. Amassian, Y. Losovyj, H. Idriss and K. Katsiev: Carbon, 94 (2015) 79. https://doi.org/10.1016/j.carbon.2015.06.038
- G. W. Yang, J. B. Wang and Q. X. Liu: J. Phys. Condens. Matter, 10 (1998) 7926.
- J. P. Boudou, P. A. Curmi, F. Jelezko, J. Wrachtrup, P. Aubert, M. Sennour, G. Balasubramanian, R. Reuter, A. Thorel and E. Gaffet: Nanotechnology, 20 (2009) 235602. https://doi.org/10.1088/0957-4484/20/23/235602
- M. Frenklach, W. Howard, D. Huang, J. Yuan, K. E. Spear and R. Koba: Appl. Phys. Lett., 59 (1991) 546. https://doi.org/10.1063/1.105434
- Y. Gogotsi, Klaus G. Nickel, D. Bahloul-Hourlier, T. Merle-Mejean, G. E. Khomenko and K. P. Skjerlie: J. Mater. Chem., 6 (1996) 595. https://doi.org/10.1039/JM9960600595
- S. Welz, Y. Gogotsi and M. J. McNallan: J. Appl. Phys., 93 (2003) 4207. https://doi.org/10.1063/1.1558227
- T. L. Daulton, M. A. Kirk, R. S. Lewis and L. E. Rehn: Nucl. Instrum. Meth. B, 175 (2001) 12.
- F. Banhart and P. M. Ajayan: Nature, 382 (1996) 433. https://doi.org/10.1038/382433a0
- E. M. Galimov, A. M. Kudin, V. N. Skorobogatskii, V. G. Plotnichenko, O. L. Bondarev, B. G. Zarubin, V. V. Strazdovskii, A. S. Aronin, A. V. Fisenko, I. V. Bykov and A. Yu. Barinov: Dokl. Phys., 49 (2004) 150. https://doi.org/10.1134/1.1710678
- V. N. Mochalin, I. Neitzel, B. J. M. Etzold, A. Peterson, G. Palmese and Y. Gogotsi: ACS Nano, 5 (2011) 7494. https://doi.org/10.1021/nn2024539
- H. Huang, E. Pierstorff, E. Osawa and D. Ho: Nano Lett., 11 (2007) 3305.
- V. Grichko, T. Tyler, V. I. Grishko and O. Shenderova: Nanotechnology, 19 (2008) 225201. https://doi.org/10.1088/0957-4484/19/22/225201
- T.Gaebel, C. Bradac, J. Chen, J. M. Say, L. Brown, P. Hemmer and J. R. Rabeau: Diam. Relat. Mater., 21 (2012) 28. https://doi.org/10.1016/j.diamond.2011.09.002
- S. Osswald, M. Havel, V. Mochalin, G. Yushin and Y. Gogotsi: Diam. Relat. Mater., 17 (2008) 1122. https://doi.org/10.1016/j.diamond.2008.01.102
- O. A. Williams, J. Hees, C. Dieker, W. Jager, L. Kirste and C. E. Nebel: ACS Nano, 8 (2010) 4824.
- S. Stehlik, M. Varga, M. Ledinsky, V. Jirasek, A. Artemenko, H. Kozak, L. Ondic, V. Skakalova, G. Argentero, T. Pennycook, J. C. Meyer, A. Feifar, A. Kromka and B. Rezek: J. Phys. Chem. C, 119 (2015) 27708. https://doi.org/10.1021/acs.jpcc.5b05259
- S. Stehlik, M. Varga, M. Ledinsky, D. Miliaieva, H. Kozak, V. Skakalova, C. Mangler, T. J. Pennycook, J. C. Meyer, A. Kromka and B. Rezek: Sci. Rep., 6 (2016) 38419. https://doi.org/10.1038/srep38419
- O. Shenderova, I. Petrov, J. Walsh, V. Grichko, V. Grishko, T. Tyler and G. Cunningham: Diam. Relat. Mater., 15 (2006) 1799. https://doi.org/10.1016/j.diamond.2006.08.032
- V. Pichot, M. Comet, E. Fousson, C. Baras, A. Senger, F. Le Normand and D. Spitzer: Diam. Relat. Mater., 17 (2008) 13. https://doi.org/10.1016/j.diamond.2007.09.011
- A. Wolcott, T. Schiros, M.E. Trusheim, E.H. Chen, D. Nordlund, R. E. Diaz, O. Gaathon, D. Englund and J. S. Owen: J. Phys. Chem. C, 118 (2014) 26695. https://doi.org/10.1021/jp506992c
- J. Havlik, V. Petrakova, I. Rehor, V. Petrak, M. Gulka, J. Stursa, J. Kucka, J. Ralis, T. Rendlerf, S. Y. Lee, R. Reuter, J. Wrachtrup, M. Ledvina, M. Nesladek and P. Cigler: Nanoscale, 5 (2013) 3208. https://doi.org/10.1039/c2nr32778c
- V. N. Mochalin and Y. Gogotsi: Diam. Relat. Mater., 58 (2015) 161. https://doi.org/10.1016/j.diamond.2015.07.003
- Reishauer, Downloadcenter, http://rmnt.reishauer.com/en/welcome/downloadcenter.
- Y. K. Bahk, J. Buha and J. Wang: Aerosol. Sci. Tech., 47 (2013) 776. https://doi.org/10.1080/02786826.2013.791745
- H. G. Schmid, M. Dvorak, G. Buerki, M. Leparoux, S. Siegmann and C. Schreuders: PARTEC Int. Congress for Particle Technology, 26 (2004) 16.
- C. Xu, X. Cai, J. Zhang and L. Liu: Particuology, 19 (2015) 82. https://doi.org/10.1016/j.partic.2014.04.014