References
- Kodera T, Arishima H, Yamada S, Arai H, Akazawa A, Higashino Y, et al. Orbitozygomatic craniotomy with modified zabramski's technique: a technical note and anatomic and clinical findings. World Neurosurg 2017;97:49-57.
- Kim SR, Lee JW, Han YS, Kim HK. Transfacial surgical approaches to secure wide exposure of the skull base. Arch Craniofac Surg 2015;16:17-23.
- Feiz-Erfan I, Han PP, Spetzler RF, Porter RW, Klopfenstein JD, Ferreira MA, et al. Exposure of midline cranial base without a facial incision through a combined craniofacial-transfacial procedure. Neurosurgery 2005;56:28-35.
- Strianese D, Piscopo R, Elefante A, Napoli M, Comune C, Baronissi I, et al. Unilateral proptosis in thyroid eye disease with subsequent contralateral involvement: retrospective follow-up study. BMC Ophthalmol 2013;13:21.
- Heredero Jung S, Dean Ferrer A, Solivera Vela J, Alamillos Granados F. Spheno-orbital meningioma resection and reconstruction: the role of piezosurgery and premolded titanium mesh. Craniomaxillofac Trauma Reconstr 2011;4:193-200.
- Raveh J, Laedrach K, Speiser M, Chen J, Vuillemin T, Seiler R, et al. The subcranial approach for fronto-orbital and anteroposterior skullbase tumors. Arch Otolaryngol Head Neck Surg 1993;119:385-93.
- Kellman RM, Goyal P, Rodziewicz GS. The transglabellar subcranial approach for nasal dermoids with intracranial extension. Laryngoscope 2004;114:1368-72.
- Wagenmann M, Schipper J. The transnasal approach to the skull base. From sinus surgery to skull base surgery. GMS Curr Top Otorhinolaryngol Head Neck Surg 2011;10:Doc08.
- Cho HR, Roh TS, Shim KW, Kim YO, Lew DH, Yun IS. Skull reconstruction with custom made three-dimensional titanium implant. Arch Craniofac Surg 2015;16:11-6.
- Schuknecht B, Carls F, Valavanis A, Sailer HF. CT assessment of orbital volume in late post-traumatic enophthalmos. Neuroradiology 1996;38:470-5.
- Winder J, Cooke RS, Gray J, Fannin T, Fegan T. Medical rapid prototyping and 3D CT in the manufacture of custom made cranial titanium plates. J Med Eng Technol 1999;23:26-8.