DOI QR코드

DOI QR Code

Transient Current Limiting Characteristics of Flux-Lock Type SFCL Using Double Quench

이중퀜치를 이용한 자속구속형 초전도한류기의 과도전류제한 특성

  • Choi, Sang-Jae (School of Electrical Engineering, Soongsil University) ;
  • Lim, Sung-Hun (School of Electrical Engineering, Soongsil University)
  • 최상재 (숭실대학교 전기공학부) ;
  • 임성훈 (숭실대학교 전기공학부)
  • Received : 2016.11.21
  • Accepted : 2016.11.23
  • Published : 2017.02.01

Abstract

In this paper, the flux-lock type superconducting fault current limiter (SFCL) using double quench was suggested and its transient current limiting characteristics were analyzed. The suggested flux-lock type SFCL using double quench consists of two magnetically coupled windings and two $high-T_{c}$ superconducting (HTSC) elements connected in series with each winding. To analyze the transient current limiting characteristics of the flux-lock type SFCL using double quench, the short-circuit tests according to the fault angles, which affect the transient component of the fault current right after the fault occurs, were executed. From the comparative analysis for the short-circuit tests at both $0^{\circ}$ and $90^{\circ}$ fault angles, the useful transient current limiting operations of the suggested flux-lock type SFCL through the double or the single quench occurrence were confirmed.

Keywords

References

  1. E. Thuries, V. D. Pham, Y. Laumond, U. Verhaege, A, Fevrier, M. Collet, and M. Bekhaled, IEEE Trans. On Power Del., 6, 2 (1991). [DOI: https://doi.org/10.1109/61.131138]
  2. H. Kado and M. Ichikawa, IEEE Trans. Appl. Supercond., 7, 2 (1997). [DOI: https://doi.org/10.1109/77.614672]
  3. B. Gromoll, G. Ries, W. Schmidt, H. P. Kramer, and H. W. Neumuller, IEEE Trans. Appl. Supercond., 7, 2 (1997). [DOI: https://doi.org/10.1109/77.614631]
  4. H. Yamaguchi, T. Kataoka, K. Yaguchi, S. Fujita, K. Yoshikawa, and K. Kaiho, IEEE Trans. Appl. Supercond., 14, 2 (2004). [DOI: https://doi.org/10.1109/TASC.2004.840820]
  5. S. H. Lim, S. C. Ko, and T. H. Han, Physica C, 484, 253 (2013). [DOI: https://doi.org/10.1016/j.physc.2012.03.011]
  6. S. H. Lim, Physica C, 471, 1354 (2011). [DOI: https://doi.org/10.1016/j.physc.2011.05.193]
  7. S. H. Lim, I. K. You, and J. C. Kim, IEEE Trans. Appl. Supercond., 21, 3 (2011). [DOI: https://doi.org/10.1109/TASC.2011.2169134]
  8. S. C. Ko, T. H. Han, and S. H. Lim, JKPS, 65, 2 (2014).