References
- H. Liu and R. Sun, Appl. Phys. Lett., 92, 063304-1 (2008). [DOI: http://dx.doi.org/10.1063/1.2844854]
- J. Zhang, W. Que, P. Zhong, and G. Zhu, J. Nanosci. Nanotechnol., 10, 7473 (2010). [DOI: http://dx.doi.org/10.1166/jnn.2010.2875]
- J. Kim, N. H. Kim, H. Kim, D. Jung, and H. Chae, J. Nanosci. Nanotechnol., 11, 6490 (2011). [DOI: http://dx.doi.org/10.1166/jnn.2011.4507]
- M.A.M. Carthy, B. Liu, E. P. Donoghue, I. Kravchenko, D. Y. Kim, F. So, and A. G. Rinzlner, Science, 332, 570 (2011). [DOI: http://dx.doi.org/10.1126/science.1203052]
- M. H. Ahn, E. S. Cho, and S. J. Kwon, Vacuum, 101, 221 (2014). [DOI: http://dx.doi.org/10.1016/j.vacuum.2013.08.018]
- K. H. Choi, J. Y. Kim, Y. S. Lee, and H. J. Kim, Thin Solid Films, 341, 258 (1999). [DOI: http://dx.doi.org/10.1016/S0040-6090(98)01556-9]
- J. A. Jeong and H. K. Kim, Sol. Energy Mater. Sol Cells, 93, 1081 (2009). [DOI: http://dx.doi.org/10.1016/j.solmat.2009.06.014]
- C. Guillen and J. Herrero, Optics Communications, 282, 574 (2009). [DOI: http://dx.doi.org/10.1016/j.optcom.2008.10.075]
- N. Meshram, C. Loka, K. R. Park, and K. S. Lee, Mater. Lett., 145, 120 (2015). [DOI: http://dx.doi.org/10.1016/j.matlet.2015.01.101]
- H. J. Kim, K. W. Seo, Y. H. Kim, J. Choi, and H. K. Kim, Appl. Surf. Sci., 328, 215 (2015). [DOI: http://dx.doi.org/10.1016/j.apsusc.2014.12.017]
- S. Beyer, V. Tornari, and D. Gornickj, Proc. SPIE, 5063, 202 (Munich, Germany, 2003). [DOI: http://dx.doi.org/10.1117/12.540498]
- G. T. Oh, S. J. Kwon, J. H. Han, and E. S. Cho, J. Nanosci. Nanotechnol., 15, 2413 (2015). [DOI: http://dx.doi.org/10.1166/jnn.2015.10249]
- P. Liu, W. Wang, X. Mei, B. Liu, and W. Zhao, Opt. Laser Eng., 69, 35 (2105).
- S. F. Tseng, W. T. Hsiao. K. C. Huang, and D. Chiang, Appl. Surf. Sci., 257, 8813 (2011). [DOI: http://dx.doi.org/10.1016/j.apsusc.2011.04.055]
- J. X. Wang, S. J. Kwon, J. H. Han, and E. S. Cho, J. Nanosci. Nanotech., 13, 7751 (2013). [DOI: http://dx.doi.org/10.1166/jnn.2013.7817]