Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

Study on Transient Current Limiting Operational Characteristics of Transformer Type SFCL with Two Peak Current Limiting Function

두 번의 피크전류제한 기능을 갖는 변압기형 초전도한류기의 과도전류제한 동작 특성 연구

  • Han, Tae-Hee (Department of Aero Materials Engineering, Jungwon University) ;
  • Lim, Sung-Hun (School of Electrical Engineering, Soongsil University)
  • 한태희 (중원대학교 항공재료공학과) ;
  • 임성훈 (숭실대학교 전기공학부)
  • Received : 2016.04.01
  • Accepted : 2016.07.05
  • Published : 2016.08.01
Download PDF
⟨ Previous Next ⟩

Abstract

In this paper, we analyzed the operational characteristics of the fault current limiting according to the amplitude of the fault current for the transformer type superconducting fault current limiter (SFCL). If the fault current happens, the superconducting element connected to the secondary coil is occurred quench and the fault current is limited. When the larger fault current occurs, the superconducting element connected to the third coil is occurred additional quench and the peak fault current is limited. We found that the fault current can be more effectively controlled through the analysis of the fault current limiting and the short-circuit tests.

Keywords

References

  1. E. Thuries, V. D. Pham, Y. Laumond, U. Verhaege, A, Fevrier, M. Collet, and M. Bekhaled, IEEE Trans. On Power Del., 6, 2 (1991). [DOI: http://dx.doirg/10.1109/61.131138]
  2. B. Gromoll, G. Ries, W. Schmidt, H. P. Kramer, and H. W. Neumuller, IEEE Trans. on Appl. Supercond., 7, 2 (1997). [DOI: http://dx.doirg/10.1109/77.614631]
  3. M. Noe and B. R. Oswald, IEEE Trans. on Appl. Supercond., 9, 2 (1999). [DOI: http://dx.doirg/10.1109/77.783552]
  4. H. Kado and M. Ichikawa, IEEE Trans. on Appl. Supercond., 7, 2 (1997). [DOI: http://dx.doirg/10.1109/77.614672]
  5. G. Didier, J. Leveque, and A. Rezzoug, IEEE Trans. on Power Systems, 28, 2 (2013). [DOI: http://dx.doirg/10.1109/TPWRS.2012.2224386]
  6. J. H. Lee and S. K. Joo, IEEE Trans. on Appl. Supercond., 23, 3 (2013). [DOI: http://dx.doirg/10.1109/TASC.2013.2266401]
  7. S. C. Ko, S. H. Lim, and T. H. Han, Physica C, 484, 263 (2013). [DOI: http://dx.doi.org/10.1016/j.physc.2012.03.041]
  8. S. H. Lim, Physica C, 470, 1631 (2010). [DOI: http://dx.doi.org/10.1016/j.physc.2010.05.177]
  9. S. H. Lim, H. S. Choi, D. C. Chung, S. C. Ko, and B. S. Han, IEEE Trans. on Appl. Supercond., 15, 2 (2005). [DOI: http://dx.doirg/10.1109/TASC.2005.851659]
  10. S. H. Lim, H. S. Choi, and B. S. Han, Physica C, 416, 34 (2004). https://doi.org/10.1016/j.physc.2004.08.019
  11. H. S. Choi, O. B. Hyun, H. R. Kim, and K. B. Park, IEEE Trans. on Appl. Supercond., 14, 3 (2002).
  12. H. S. Choi, Y. S. Cho, and S. H. Lim, IEEE Trans. on Appl. Supercond., 16, 2 (2006). [DOI: http://dx.doirg/10.1109/TASC.2006.869914]
  13. Y. S. Cho, N. Y. Lee, H. S. Choi, D. C. Chung, and S. H. Lim, Physica C, 463, 1204 (2007). [DOI: http://dx.doirg/10.1016/j.physc.2007.03.459]