Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

Characteristics of PMN-PZ-PT Thick Film Ceramic by Low-Temperature Sintering Aids

저온 소결 조제에 따른 PMN-PZ-PT 후막 세라믹 특성

  • Jung, Myungwon (Optic & Display Materials Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Jeon, Dae-Woo (Optic & Display Materials Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Kim, Jin-Ho (Optic & Display Materials Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Lee, Youngjin (Optic & Display Materials Center, Korea Institute of Ceramic Engineering & Technology)
  • 정명원 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 전대우 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 김진호 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 이영진 (한국세라믹기술원 광.디스플레이소재센터)
  • Received : 2016.06.27
  • Accepted : 2016.07.20
  • Published : 2016.08.01
Download PDF
⟨ Previous Next ⟩

Abstract

Convectional PZT based piezoelectric ceramics have to sinter at high temperature about $1,200^{\circ}C$ for their suitable electrical properties. However, some issues: low temperature sintering piezoelectric ceramic composition and reliable internal electrode, have recently attracted a great deal of interest as a highly efficient multi-layered piezoelectric ceramics. In order to optimize low temperature sintering conditions of thick-film PMN-PZ-PT ceramic, it was investigated sintering and piezoelectric properties according to the change of $LiBiO_2$ contents. Thus, the superior piezoelectric properties were found at the pallet type PMN-PZ-PT optimized with low sintering processing at $925^{\circ}C$ including 7 wt% $LiBiO_2$ sintering aid. Consequentially, we successfully manufactured thick-film PMN-PZ-PT ceramics, which had superior piezoelectric and dielectric properties, with 5 wt% of $LiBiO_2$ sintering aid at temperature of $900^{\circ}C$.

Keywords

References

  1. J. Hu, Y. Fuda, M. Katsuno, and T. Yoshida, Jpn. J. Appl. Phys., 38, 3208 (1999). [DOI: http://dx.doi.org/10.1143/JJAP.38.3208]
  2. F. S. Essam, W. M. Robert, and J. H. Lawrence, J. Sound Vib., 292, 854 (2006). https://doi.org/10.1016/j.jsv.2005.09.002
  3. S. D. Park, H. G. Kang, Y. H. Park, and J. D. Mun, J. Microelectronic & Packaging Soc., 6, 25 (1999).
  4. H. T. Sawhill, Ceram. Tram., 26, 307 (1987).
  5. W. H. Jung, J. H. Sohn, Y. Inaguma and M. Itoh, J. Kor. Ceram. Soc., 2, 111 (1996).
  6. C. Y. Chen and H. L. Lin, Ceramic. Inst., 30, 2075 (2004). [DOI: http://dx.doi.org/10.1016/j.ceramint.2003.11.010]
  7. D. Dong, K. Murakami, S. Kaneko, and M. Xiong, J. Ceramic Society. Jpn., 101, 1090 (1993). [DOI: http://dx.doi.org/10.2109/jcersj.101.1090
  8. J. S. Lee. M. S. Choi, H. S. Han, Y. M. Kong, S. J. Kim, I. W. Kim, M. S. Kim, and S. J. Jeong, Sens. Actuuators A. Phys., 154, 97 (2009). https://doi.org/10.1016/j.sna.2009.06.003
  9. K. Murakami, D. Mabuchi, T. Kurita, Y. Niwa, and S. Kaneko, Jpn. J. Appl. Phys., 35, 5188 (1996). [DOI: http://dx.doi.org/10.1143/JJAP.35.5188]
  10. G. Feng, H. Rongzi, L. Jiaji, L. Zhen, and T. C. Sheng, Ceramic. Inst., 35, 1863 (2009). [DOI: http://dx.doi.org/10.1016/j.ceramint.2008.10.029]
  11. T. Hayashi, T. Hasegawa, and Y. Akiyama, Jpn. J. Appl. Phys., 43, 6683 (2004). [DOI: http://dx.doi.org/10.1143/JJAP.43.6683]
  12. G. Jeremy, C. J. Fabien, C. P. Jean, and L. Mickael, Sens. Actuuators A. Phys., 211, 1 (2014). https://doi.org/10.1016/j.sna.2014.02.034
  13. J. K. Hong, J. S. Lee, H. I. Chee, M. S. Yoon, and S. H. Jeong, J. Korean Inst. Electr. Electron. Mater. Eng., 14, 455 (2001).
  14. S. Priya and D. J. Inman, Energy Harvesting Technologies (Springer, New York, 2009). [DOI: http://dx.doi.org/10.1007/978-0-387-76464-1]
  15. E. R. Leite, A. M. Scotch, A. Khan, T. Li, H. M. Chan, M. P. Harmer, S. F. Liu, and S. E. park, J. Am. Chem. Soc., 85, 3018 (2002).
  16. V. R. Cooper, I. Grinberg, N. R. Martin, and A. M. Rappe, Fundamental Physics of Ferroelectrics (eds. R. E. Cohen) American Institute of Phvsics, 26 (2002).
  17. J. A. Perez, M. R. Soares, P. Q. Mantas, and A.M.R. Senos, J. Eur Ceram. Soc., 25, 2207 (2005). [DOI: http://dx.doi.org/10.1016/j.jeurceramsoc.2005.03.031]
  18. J. F. Tressler, S. Alkoy, and R. E. Newnham, Journal of Electroceramics, 2:4, 257-272 (1998). [DOI: http://dx.doi.org/10.1023/A:1009926623551]
  19. C. I. Cheon and J. S. Park, Journal of Materials Science Letters, 16, 2043 (1997). [DOI: http://dx.doi.org/10.1023/A:1018560717278]