References
- A. Kumar, "Computer-vision-based fabric defect detection: A survey," IEEE Transactions on Industrial Electronics, vol. 55, no. 1, pp. 348-363, Jan. 2008. https://doi.org/10.1109/TIE.1930.896476
- C. S. Cho, B. M. Chung, and M. J. Park, "Development of real-time vision-based fabric inspection system," IEEE Transactions on Industrial Electronics, vol. 52, no. 4, pp. 1073-1079, Aug. 2005. https://doi.org/10.1109/TIE.2005.851648
- J. H. Oh, B. J. Yun, S. Y. Kim, and K. H. Park, "A development of the TFT-LCD image defect inspection method based on human visual system," IEICE Transactions on Fundamentals, vol. E91-A, no. 6, pp. 1400-1407, Jun. 2008. https://doi.org/10.1093/ietfec/e91-a.6.1400
- L. M. Sanchez-Brea, P. Siegmann, M. A. Rebollo, and E. Bernabeu, "Optical technique for the automatic detection and measurement of surface defects on thin metallic wires," Applied Optics, vol. 39, no. 4, pp. 539-545, Feb. 2000. https://doi.org/10.1364/AO.39.000539
- Z. Wen and Y. Tao, "Brightness-invariant image segmentation for on-line fruit defect detection," Optical Engineering, vol. 37, no. 11, pp. 2948-2952, Nov. 1998. https://doi.org/10.1117/1.601882
- J. P. Yun, Y. J. Jeon, D. C. Choi, and S. W. Kim, "Real-time defect detection of steel wire rods using wavelet filters optimized by univariate dynamic encoding algorithm for searches (uDEAS)," Journal of the Optical Society of America A, vol. 29, no. 5, pp. 797-807, May 2012. https://doi.org/10.1364/JOSAA.29.000797
- D. C. Choi, Y. J. Jeon, and S. W. Kim, "Faulty scarfing slab detection using machine vision," Advanced Materials Research, vol. 462, pp. 185-190, Feb. 2012. https://doi.org/10.4028/www.scientific.net/AMR.462.185
- Y. J. Jeon, D. C. Choi, J. P. Yun, and S. W. Kim, "Detection of periodic defects using dual-light switching lighting method on the surface of thick plates," ISIJ International, vol. 55, no. 9, pp. 1942-1949, Sep. 2015. https://doi.org/10.2355/isijinternational.ISIJINT-2015-053
- Y. J. Jang and J. S. Lee, "Development of a 3D shape reconstruction system for defects on a hot steel surface," Journal of Institute of Control Robotics and Systems, vol. 21, no. 5, pp. 459-464, 2015. https://doi.org/10.5302/J.ICROS.2015.14.0147
- J. P. Yun, C. H. Park, H. M. Bae, S. H. Choi, and J. H. Yun, "Micro defect detection of cold rolled steel using dual retro-schlieren technology," Proc. of 2014 29th ICROS Annual Conference (in Korean), Daegu, Korea, pp. 370-371, May 2014. pp. 370-371, 2014.