References
- Ahn, H. S., 2007, Estimation of Nanomechanical Properties of Nanosurfaces using Phase Contrast Imaging in Atomic Force Microscopy, Transactions of the KSMTE, 16:5 115-121.
- Lee, J. M., Han Y. H., Kwak D. R., Park, I. K., 2014, Analaysis of Contact Resonance Frequency Characteristics for Cantilever of Ultrasonic-AFM using Finite Element Method, Journal of the KSMTE, 23:5 478-484.
- Ahn, H. S., Jang, D. Y., 2009, Analysis of Nano-contact between Nano-asperities using Atomic Force Microscopy, Journal of the KSMTE, 18:4 369-374.
- King, R. B., 1987, Elastic Analysis of Some Punch Problems for a Layered Medium, Int. J. of Solids and Structures, 23:12 1657-1664. https://doi.org/10.1016/0020-7683(87)90116-8
- Chen, X., Vlassak, J. J., 2001, Numerical Study on the Measurement of Thin Film Mechanical Properties by Means of Nanoindentation, J. of Mat. Res., 16:10 2974-2982. https://doi.org/10.1557/JMR.2001.0408
- Tayebi, N., Polycarpou, A. A., Conry, T. F., 2001, Effects of Substrate on Determination of Hardness of Thin Films by Nanoscratch and Nanoindentation Techniques, J. of Mat. Res., 19:6 1791-1802.
- Ashrafi, B., Das, K., Faive, L. R., Hubert, P., Vengallatore, S., 2012, Measuring the elastic properties of freestanding thick films using a nanoindenter-based bending Test, Experimental Mechanics, 52(4), 371-378. https://doi.org/10.1007/s11340-011-9494-z
- Kourtis, L. C., Carter, D. R., Beaupre, G. S., 2014, Improving the Estimate of the Effective Elastic Modulus Derived from Three-point Bending Tests of Long Bones, Annals of Biomedical Engineering, 42:8 1773-1780. https://doi.org/10.1007/s10439-014-1027-3
- Alfano, M., Pagnotta, L., 2006, Measurement of the Dynamic Elastic Properties of a Thin Coating, Rev. of Sci. Instrum., 77:5 056107. https://doi.org/10.1063/1.2198747
- Schneider, D., Schwaz, T., Schultrich, B., 1992, Determination of Elastic Modulus and Thickness of Surface Layers by Ultrasonic Surface Waves, Thin Solid Films, 219:1-2 92-102. https://doi.org/10.1016/0040-6090(92)90728-T
- Tsuchiya, T., Ito, K., Miyoshi, S., Enoki, M., Yamaguchi, S., 2014, In-situ Monitoring of Oxide Ion Induced Breakdown in Amorphous Tantalum Oxide Thin Film using Acoustic Emission Measurement, Mater. Trans., 55:10 1553-1556. https://doi.org/10.2320/matertrans.M2014198
- Chudoba, T., Schwarzer, N., Richter, F., 2000, Determination of Elastic Properties of Thin Films by Indentation Measurements with a Spherical Indenter, Surf. Coat. Technol., 127:1 9-17. https://doi.org/10.1016/S0257-8972(00)00552-1
- Liu, S., Wang, Q. J., 2007, Determination of Young's Modulus and Poisson's Ratio for Coatings, Surf. Coat. Technol., 201:14 6470-6477. https://doi.org/10.1016/j.surfcoat.2006.12.021
- Liu, S., Peyronnel, A., Wang, Q. J., Keer, L. M., 2005, An Extension of the Herz Theory for 2D Coated Components, Tribol. Lett., 18:4 505-511. https://doi.org/10.1007/s11249-005-3611-z
- Park, T. S., Kwak, D. R., Park, I. K., Kim, C. S., Jhang, K. Y., 2011, Evaluation of Elastic Properties and Analysis of Contact Resonance Frequency of Cantilever for Ultrasonic AFM, J. of KSNT, 31:2 174-180.
- Cunfu, H., Gaimei, Z., Bin, W., Zaiqi, W., 2010, Subsurface Defect of the SiOx Film Imaged by Atomic Force Acoustic Microscopy, Optics and Laser in Engineering, 48:11 1108-1112. https://doi.org/10.1016/j.optlaseng.2009.12.014
- Banerjee, S., Gayathri, N., Dash, S., Tyagi, A. K., Raj, B., 2005, A Comparative Study of Contact Resonance Imaging using Atomic Force Microscopy, Appl. Phys. Lett., 86:21 211913. https://doi.org/10.1063/1.1927698
- Rabe, U., Janser, K., Arnold, W., 1996, Vibrations of Free and Surfacecoupled aTomic Force Microscope Cantilevers: Theory and Experiment, Rev. of Sci. Instrum., 67:9 3281-3293. https://doi.org/10.1063/1.1147409
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