적외선 열화상 기술을 이용한 마이크로 디바이스의 모니터링

  • Published : 2015.10.20

Abstract

Keywords

References

  1. Bagavathiappan, S., Lahiri, B., Saravanan, T., Philip, J. and Jayakumar, T., 2013, Infrared Thermography for Condition Monitoring-a Review, Infrared Phys. Technol., Vol. 60, pp. 35-55. https://doi.org/10.1016/j.infrared.2013.03.006
  2. Djordjevic, S., Parlevliet, D. and Jennings, P., 2014, Detectable Faults on Recently Installed Solar Modules in Western Australia, Renewable Energy, Vol. 67, pp. 215-221. https://doi.org/10.1016/j.renene.2013.11.036
  3. Tsanakas, J. and Botsaris, P., 2011, Passive and Active Thermographic Assessment as a Tool for Condition-based Performance Monitoring of Photovoltaic Modules, Journal of Solar Energy Engineering, Vol. 133, No. 2, p. 021012. https://doi.org/10.1115/1.4003731
  4. Huda, A. N. and Taib, S., 2013, Application of Infrared Thermography for Predictive/Preventive Maintenance of Thermal Defect in Electrical Equipment, Appl. Therm. Eng., Vol. 61, No. 2, pp. 220-227. https://doi.org/10.1016/j.applthermaleng.2013.07.028
  5. Kociniewski, T., Moussodji, J., Khatir, Z., Berkani, M., Lefebvre, S. and Azzopardi, S., 2012, New Investigation Possibilities on Forward Biased Power Devices using Cross Sections, Electron Device Letters, IEEE, Vol. 33, No. 4, pp. 576-578. https://doi.org/10.1109/LED.2011.2182492
  6. Wang, C., Chou, H., Cheng, S. and Chou, P., 2013, In Depth Thermal Analysis of Packaged GaN on Si Power Devices, Power Semiconductor Devices and ICs(ISPSD), 2013 25th International Symposium, pp. 101-104.
  7. Maldague, X., 2001, Theory and Practice of Infrared Technology for Nondestructive Testing, Wiley.
  8. Xu, Z., Shi, T., Lu, X. and Liao, G., 2014, Using Active Thermography for Defects Inspection of Flip Chip, Microelectronics Reliability, Vol. 54, No. 4, pp. 808-815. https://doi.org/10.1016/j.microrel.2013.12.015
  9. Lu, X., Liao, G., Zha, Z., Xia, Q. and Shi, T., 2011, A Novel Approach for Flip Chip Solder Joint Inspection Based on Pulsed Phase Thermography, NDT E Int., Vol. 44, No. 6, pp. 484-489. https://doi.org/10.1016/j.ndteint.2011.05.003
  10. Riccio, M., Breglio, G., Irace, A., Maresca, L., Romano, G. and Spirito, P., 2015, Infrared Thermography Applied to Power Electron Devices Investigation, Facta Universitatis, Series: Electronics and Energetics, Vol. 28, No. 2, pp. 205-212.
  11. Romano, G., Riccio, M., De Falco, G., Maresca, L., Irace, A. and Breglio, G., 2014, An Ultrafast IR Thermography System for Transient Temperature Detection on Electronic Devices, Semiconductor Thermal Measurement and Management Symposium(SEMITHERM), 2014 30th Annual, pp. 80-84.
  12. Breglio, G., Irace, A., Napoli, E., Riccio, M., Spirito, P., Hamada, K., Nishijima, T. and Ueta, T., 2008, Detection of Localized UIS Failure on IGBTs with the Aid of Lock-in Thermography, Microelectronics Reliability, Vol. 48, No. 8, pp. 1432-1434. https://doi.org/10.1016/j.microrel.2008.06.042