전기전자학회논문지 (Journal of IKEEE)

  • 제19권3호
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  • Pages.440-446
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  • 2015
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  • 1226-7244(pISSN)
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  • 2288-243X(eISSN)
한국전기전자학회 (Institute of Korean Electrical and Electronics Engineers)
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안테나에 커플링되는 협대역 고출력 전자기파에 대한 저잡음 증폭기의 민감성 분석

The Susceptibility of LNA(Low Noise Amplifier) Due To Front-Door Coupling Under Narrow-Band High Power Electromagnetic Wave

  • 투고 : 2015.08.28
  • 심사 : 2015.09.16
  • 발행 : 2015.09.30
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초록

본 연구는 안테나에 커플링되는 협대역 고출력 전자기파에 대한 저 잡음 증폭기(LNA)의 민감성 특성을 알아보았다. LNA 소자의 오동작/파괴는 MFR/DFR((Malfunction Failure Rate/Destruction Failure Rate)을 이용하여 소자의 민감성을 확인하였다. 그리고 LNA 소자의 내부 칩 상태는 Decapsulation 분석을 이용하여 손상부위를 관찰하였다. 협대역 고출력 전자기파 장치는 2.45 GHz 마그네트론을 사용하였고, LNA의 민간성 레벨은 협대역 고출력 전자기파의 전계강도에 따라 오동작/파괴율을 평가하였다. 그 결과, LNA 소자의 오동작은 셀프리셋(Self Reset)과 파워리셋(Power Reset)의 형태로 나타내었고, 이때 오동작 임계 전계강도는 각각 524 V/m, 1150 V/m로 측정되었다. 그리고 LNA의 소자의 파괴 임계 전계강도는 1530 V/m이다. 협대역 고출력 전자기파에 의한 LNA 소자의 내부 칩 파괴는 본드와이어, 온칩와이어 그리고 컴포넌트 세가지 형태로 관찰되었다. 이 결과로, 협대역 고출력 전자기파에 의한 반도체 전자회로의 내성평가 자료로 활용할 수 있을 것으로 판단된다.

This study has examined susceptibility of LNA(Low Noise Amplifier) due to Front-Door Coupling under Narrow-Band high power electromagnetic wave. M/DFR(Malfunction/Destruction Failure Rate) was measured to investigate the diagnostic of IC test. In addition, decapsulation analysis was used to understand the inside of the chip state in LNA devices. The experiments is employed as an open-ended waveguide to study the destruction effects of LNA using a 2.45 GHz Magnetron as a high power electromagnetic wave. The susceptibility level of LNA was assessed by electric field strength, and its failure modes were observed. The malfunction of LNA device has showed as the type of self-reset and power-reset. The electric field strength of malfunction threshold is 524 V/m and 1150 V/m respectively. Also, he electric field of destruction threshold is 1530 V/m. Three types of damaged LNA were observed by decapsulation analysis: component, onchipwire, and bondwire destruction. Based on these results, the susceptibility of the LNA can be applied to a database to help elucidate the effects of microwaves on electronic equipment.

키워드

참고문헌

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피인용 문헌

  1. Damage Modeling of a Low-Noise Amplifier in an RF Front-End Induced by a High Power Electromagnetic Pulse vol.45, pp.5, 2017, https://doi.org/10.1109/TPS.2017.2684196
  2. 360° 전방위 화각을 가진 Dash Camera의 EMI 대응을 위한 Board 개발 vol.21, pp.3, 2015, https://doi.org/10.7471/ikeee.2017.21.3.248