Journal of the Korean Society of Radiology (한국방사선학회논문지)

The Korean Society of Radiology (한국방사선학회)
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Inspection of electronic components using dual X-ray energy

이중 엑스선 에너지를 이용한 전자부품 검사

  • Received : 2015.07.09
  • Accepted : 2014.08.25
  • Published : 2015.06.30
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Abstract

X-ray can be applied to obtain a projection image of an object. It is not easy to obtain an high quality image for the object composed of low and high density materials. For the object with large difference in density, it is possible to realize high contrast image using images of low and high tube voltages and image processing. The plastic and metalic parts of the electronic components can be imaged by the dual energy technique which use low and high tube voltages and by processing pixel-by-pixel using visual C++. The contrast-enhanced image can be used to detect and observe defects within the electronic components.

엑스선을 이용하면 다양한 종류의 시료에 대한 투영 영상을 얻을 수 있다. 시료가 저밀도 및 고밀도의 복합 물질로 구성되어 있는 경우는 단일 관전압 엑스선을 이용해서 두 물질을 모두 대조도가 높도록 영상화하기 어렵다. 저관전압과 고관전압을 이용하여 영상을 획득하고 영상처리하면 밀도의 차이가 큰 물질을 영상화하기에 용이하다. 크기가 작은 전자부품을 저관전압과 고관전압에서 영상을 획득하여 visual C++을 이용하여 픽셀-픽셀 영상 합성을 통하여 전자부품의 합성수지부분과 금속부분을 동시에 영상화하여 전자부품의 검사 및 관찰의 가능성을 검증하였다.

Keywords

References

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