Journal of Korean Society for Quality Management (품질경영학회지)

Korean Society for Quality Management (한국품질경영학회)
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Planning Accelerated Degradation Tests: the Case of Gamma Degradation Process

열화가 감마과정을 따르는 경우 가속열화시험의 최적 계획

  • Lim, Heonsang (Samsung Electronics Co., Ltd.) ;
  • Lim, Dae-Eun (Department of System & Management Engineering, Kangwon National University)
  • Received : 2014.03.07
  • Accepted : 2015.06.15
  • Published : 2015.06.30
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Abstract

Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.

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References

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