참고문헌
- K. Nomura, H. Ohta, K. Ueda, T. Kamiya, M. Hirano, and H. Hosono, Science, 300, 1269 (2003). [DOI: http://dx.doi.org/10.1126/science.1083212]
- K. Nomura, H. Ohta, A. Takagi, T. Kamiya, M. Hirano, and H. Hosono, Nature, 432, 488 (2004). [DOI: http://dx.doi.org/10.1038/nature03090]
- C. G. Van de Walle, Phys. Rev. Lett., 85, 1012 (2000). [DOI: http://dx.doi.org/10.1103/PhysRevLett.85.1012]
- J. H. Na, M. Kitamura, and Y. Arakawa, Appl. Phys. Lett., 93, 063501 (2008). [DOI: http://dx.doi.org/10.1063/1.2969780]
- W. B Jackson, R. L. Hoffman, and G. S. Herman, Appl. Phys. Lett., 87, 193503 (2005). [DOI: http://dx.doi.org/10.1063/1.2120895]
- B. S. Ong, C. Li, Y. Li, Y. Wu, and R. Loutfy, J. Am. Chem. Soc., 129, 2750 (2007). [DOI: http://dx.doi.org/10.1021/ja068876e]
- Y. S. Rim, H. S. Lim, and H. J. Kim, Appl. Mater. Interfaces, 5, 3565 (2013). [DOI: http://dx.doi.org/10.1021/am302722h]
- M. Katayama, S. Ikesaka, J. Kuwano, Y. Yamamoto, H. Koinuma, and Y. Matsumoto, Appl. Phys., 89, 242103 (2006).
- C. G. Choi, S. J. Seo, and B. S. Bae, Electrochem. Solid-State Lett., 11, H7 (2008). [DOI: http://dx.doi.org/10.1149/1.2800562]
- P. C. Yao, J. L. Chiang, and M. C. Lee, Solid State Sciences, 28, 47 (2014). [DOI: http://dx.doi.org/10.1016/j.solidstatesciences.2013.12.011]
- C. Y. Koo, K.K.K. Song, T. H. Jun, D. J. Kim, Y. M. Jeong, S. H. Kim, J. W. Ha, and J. H. Moon, Electrochem. Solid-State Lett., 157, J111 (2010).
- P. H. Wöbkenberg, T. Ishwara, J. Nelson, D.D.C. Bradley, S. A. Haque, and T. D. Anthopoulos, Appl. Phys. Lett., 96, 082116 (2010). [DOI: http://dx.doi.org/10.1063/1.3330944]
- Q. Xie, Y. L. Jiang, C. Detavernier, D. Deduytsche, and R.L.V. Meirhaeghe, J. Appl. Phys., 102, 083521 (2007). [DOI: http://dx.doi.org/10.1063/1.2798384]
- J. Y. Kim, Y. J. Choi, H. H. Park, S. Golledge, and D. C. Johnson, JVST A, 28, 1111 (2010).
- C. F. Zhu, W. K. Fong, B. H. Leung, C. C. Cheng, and S. Charles, IEEE Electron Device, 48, 1225 (2001). [DOI: http://dx.doi.org/10.1109/16.925252]
- Z. Y. Lu, C. J. Nicklaw, D. M. Fleetwood, R. D. Schrimpf, and S. T. Pantelides, Phys. Rev. Lett., 89, 285505 (2002). [DOI: http://dx.doi.org/10.1103/PhysRevLett.89.285505]
- H. S. Witham and P. M. Lenahan, Appl. Phys. Lett., 51, 1007 (1987). [DOI: http://dx.doi.org/10.1063/1.98813]
- H. Klauk, G. Schmid, W. Radlik, W. Weber, L. Zhou, C. D. Sheraw, J. A. Nichols, and T. N. Jackson, Solid-State Electron., 47, 297 (2003). [DOI: http://dx.doi.org/10.1016/S0038-1101(02)00210-1]