Journal of Institute of Control, Robotics and Systems (제어로봇시스템학회논문지)

Institute of Control, Robotics and Systems (제어로봇시스템학회)
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Unified Approach to Path Planning Algorithm for SMT Inspection Machines Considering Inspection Delay Time

검사지연시간을 고려한 SMT 검사기의 통합적 경로 계획 알고리즘

  • Lee, Chul-Hee (Dept. Control and Robot Eng., Chungbuk National University) ;
  • Park, Tae-Hyoung (Dept. Control and Robot Eng., Chungbuk National University)
  • 이철희 (충북대학교 제어로봇공학과) ;
  • 박태형 (충북대학교 제어로봇공학과)
  • Received : 2014.12.26
  • Accepted : 2015.04.29
  • Published : 2015.08.01
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Abstract

This paper proposes a path planning algorithm to reduce the inspection time of AOI (Automatic Optical Inspection) machines for SMT (Surface Mount Technology) in-line system. Since the field-of-view of the camera attached at the machine is much less than the entire inspection region of board, the inspection region should be clustered to many groups. The image acquisition time depends on the number of groups, and camera moving time depends on the sequence of visiting the groups. The acquired image is processed while the camera moves to the next position, but it may be delayed if the group includes many components to be inspected. The inspection delay has influence on the overall job time of the machine. In this paper, we newly considers the inspection delay time for path planning of the inspection machine. The unified approach using genetic algorithm is applied to generates the groups and visiting sequence simultaneously. The chromosome, crossover operator, and mutation operator is proposed to develop the genetic algorithm. The experimental results are presented to verify the usefulness of the proposed method.

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References

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