The Journal of Korean Institute of Communications and Information Sciences (한국통신학회논문지)

The Korean Institute of Commucations and Information Sciences (한국통신학회)
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Lifetime Prediction of RF SAW Duplexer Using Accelerated Life Testing

가속수명시험을 이용한 RF SAW 듀플렉서의 수명예측

  • Kim, Young-Goo (Electronics and Telecommunications Research Institute) ;
  • Kim, Tae-Hong (Electronics and Telecommunications Research Institute) ;
  • Kang, Sang-Gee (Kunsan National University Department of Information and Telecommunication Engineering)
  • Received : 2014.08.25
  • Accepted : 2014.09.17
  • Published : 2014.10.31
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Abstract

In this paper, we designed the accelerated life testing(ALT) and presented the lifetime prediction method of the RF SAW duplexer. We determined RF input power as an accelerated stress when designing an accelerating life testing and defined the lifetime of the duplexer as the period during which the insertion loss increased by 0.5[dB]. Lifetime prediction results of duplexer was estimated for 82,900hours at an ambient temperature of $85^{\circ}C$ and RF input power of 30[dBm].

본 논문에서는 RF SAW 듀플렉서에 대하여 가속수명시험을 설계하고 수명예측방법에 대하여 제시하였다. 가속수명시험설계 시 가속스트레스는 RF 입력전력으로 정하고 삽입손실이 0.5[dB] 증가하는 기간을 듀플렉서의 수명으로 정의하였다. 듀플렉서의 수명예측결과는 $85^{\circ}C$ 주위온도와 30[dBm] RF입력전력에서 약 82,900시간으로 추정되었다.

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References

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